Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 268
Book Description
NIST Serial Holdings
Author: National Institute of Standards and Technology (U.S.)Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 268
Book Description
Particles and Waves in Electron Optics and Microscopy
Author: Publisher: Academic Press
ISBN: 0128052309
Category : Science
Languages : en
Pages : 364
Book Description
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Literature Of Analytical Chemistry
Author: Tibor BraunPublisher: CRC Press
ISBN: 1000005828
Category : Science
Languages : en
Pages : 266
Book Description
First Published in 1987, this book offers a full, comprehensive guide into the Literature on Analytical Chemistry. Carefully compiled and filled with a vast repertoire of journals, Papers, and References this book serves as a useful reference for Students of Chemistry, and other practitioners in their respective fields.
Advances in Imaging and Electron Physics
Author: Publisher: Academic Press
ISBN: 0128174706
Category : Technology & Engineering
Languages : en
Pages : 322
Book Description
Advances in Imaging and Electron Physics, Volume 211, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
Index of NLM Serial Titles
Author: National Library of Medicine (U.S.)Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1516
Book Description
A keyword listing of serial titles currently received by the National Library of Medicine.
Current Catalog
Author: National Library of Medicine (U.S.)Publisher:
ISBN:
Category : Medicine
Languages : en
Pages : 1378
Book Description
First multi-year cumulation covers six years: 1965-70.
Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects
Author: Jean- Paul MorniroliPublisher: CRC Press
ISBN: 9781420034073
Category : Science
Languages : en
Pages : 432
Book Description
A publication of the French Society of Microscopies, Large-Angle Convergent-Beam Electron Diffraction Applications to Crystal Defects is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, the author goes well beyond a simple presentation of the method. The description of convergent-beam electron diffraction and especially of LACBED is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpretation of diffraction patterns enables the reader to master all stages in the process. The book ends with a long chapter in which numerous applications concerned with the characterization of crystal defects are examined and analyzed.
Logarithmic Image Processing: Theory and Applications
Author: Publisher: Academic Press
ISBN: 0128052295
Category : Science
Languages : en
Pages : 320
Book Description
Logarithmic Image Processing: Theory and Applications, the latest volume in the series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy and features cutting-edge articles on recent developments in all areas of microscopy, digital image processing, and many related subjects in electron physics. - Merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy into a single volume - Contains the latest information on logarithmic image processing and its theory and applications - Features cutting-edge articles on recent developments in all areas of microscopy, digital image processing, and many related subjects in electron physics
Grain Boundaries and Crystalline Plasticity
Author: Louisette PriesterPublisher: John Wiley & Sons
ISBN: 1118603109
Category : Technology & Engineering
Languages : en
Pages : 240
Book Description
The main purpose of this book is to put forward the fundamental role of grain boundaries in the plasticity of crystalline materials. To understand this role requires a multi-scale approach to plasticity: starting from the atomic description of a grain boundary and its defects, moving on to the elemental interaction processes between dislocations and grain boundaries, and finally showing how the microscopic phenomena influence the macroscopic behaviors and constitutive laws. It involves bringing together physical, chemical and mechanical studies. The investigated properties are: deformation at low and high temperature, creep, fatigue and rupture.
Quantitative Surface Analysis of Materials
Author: Symposium on Progress in Quantitative Surface AnalysisPublisher: ASTM International
ISBN: 9780803105430
Category : Analytical chemistry
Languages : en
Pages : 220
Book Description