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Author: J. P. Maier Publisher: Elsevier Publishing Company ISBN: Category : Science Languages : en Pages : 508
Book Description
Rapid and impressive advances have been made in recent years in the spectroscopy and structure of ion and ionic clusters. This new multi-author volume provides an up-to-date and in-depth coverage of the progress made, the present knowledge, and the state-of-the art of the field. The first chapter deals with the developments and application of the Coulomb explosion technique for the determination of the geometric structure of polyatomic cations. This is followed by a review of the structural information obtained by microwave techniques on cations and of their radioastronomical studies. Of the next three chapters, two deal with theoretical approaches to predict spectroscopic data on ions, and the third deals with the experimental measurements using infrared laser methods. The next chapter covers progress in the area of high resolution photodetachment studies on anions using laser-ion beam methods. The techniques and results described in the following chapter are concerned with the investigations of open-shell cations by means of their electronic transitions. The latter chapters focus on the study of ionic clusters and complexes.
Author: J. P. Maier Publisher: Elsevier Publishing Company ISBN: Category : Science Languages : en Pages : 508
Book Description
Rapid and impressive advances have been made in recent years in the spectroscopy and structure of ion and ionic clusters. This new multi-author volume provides an up-to-date and in-depth coverage of the progress made, the present knowledge, and the state-of-the art of the field. The first chapter deals with the developments and application of the Coulomb explosion technique for the determination of the geometric structure of polyatomic cations. This is followed by a review of the structural information obtained by microwave techniques on cations and of their radioastronomical studies. Of the next three chapters, two deal with theoretical approaches to predict spectroscopic data on ions, and the third deals with the experimental measurements using infrared laser methods. The next chapter covers progress in the area of high resolution photodetachment studies on anions using laser-ion beam methods. The techniques and results described in the following chapter are concerned with the investigations of open-shell cations by means of their electronic transitions. The latter chapters focus on the study of ionic clusters and complexes.
Author: Cheuk-Yiu Ng Publisher: ISBN: Category : Science Languages : en Pages : 504
Book Description
Cluster Ions Edited by Cheuk-Yiu Ng, Ames Laboratory, Iowa State University, lowa, USA Tomas Baer, University of North Carolina, NC, USA Ivan Powis, University of Nottingham, UK As a result of many recent advances in both experimental techniques and theoretical methodologies, increasingly detailed and sophisticated studies concerning the formation, structures, energetics, and reaction dynamics of state- or energy-selected molecular ions can now be performed. In order better to serve the ion chemistry and physics communities, each volume of this series will be dedicated to reviewing a specific topic emphasizing new experimental and theoretical developments in the study of ions. This first volume is devoted to the physics and chemistry of clusters. Measurement of cluster ion properties, made as a function of cluster size, are expected to shed some light on the basic understanding of the transition from gas phase to condensed matter. The interest in cluster research is also motivated by the important roles that clusters play in many practical fields, such as catalysis and microelectronics. The authors of the seven chapters making up this volume are among the most active researchers in their respective areas. This series will help stimulate new research directions and point to future opportunities in the field of ion chemistry.
Author: John L. Holmes Publisher: CRC Press ISBN: 0203492471 Category : Science Languages : en Pages : 468
Book Description
Assigning Structures to Ions in Mass Spectrometry describes the tools currently available for determining gas-phase ion structures. It surveys current experimental methods for ion production and separation as well as those designed to reveal qualitative and quantitative aspects of gas-phase ions. It also examines how and when to apply computational chemistry and theoretical calculations. Selected case studies illustrate specific challenges associated with ion structure assignment and thermochemical problems. Bringing together key results collected over the past four decades, the book contains the data for describing or identifying ions containing C alone and C with H, O, N, S, P, halogens, and small organic cations.
Author: Christine M. Mahoney Publisher: John Wiley & Sons ISBN: 1118589246 Category : Science Languages : en Pages : 325
Book Description
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Author: Ron Naaman Publisher: Springer Science & Business Media ISBN: 1468474243 Category : Technology & Engineering Languages : en Pages : 338
Book Description
The workshop on "The structure of small molecules and ions" was held at the Neve-Han guest house, near Jerusalem, Israel on December 13 to 18 in mem ory of the late Professor Itzhak Plesser. Professor Plesser played a central role in the research done both at the Weizmann Institute and at Argonne National Laboratories on the "Coulomb explosion" method. His friends honored his memory by organizing a meeting in which subjects related to Plesser's interests would be discussed. Just a week be fore the conference started we were struck by another tragedy -the death of our graduate student Ms. Hana Kovner, who participated in many of the Coulomb explosion experiments at the Weizmann Institute. We would like to dedicate these proceedings to her memory as well. The goal of the workshop was to bring together chemists and physicists working on different aspects of the structural problems of small molecular en tities. The time seemed appropriate for discussing experimental and theoretical concepts, since in recent years new methods have been introduced, and a large amount of information has been accumulated on systems not studied before, like unstable molecules, ions, van der Waals molecules and clusters. The program of the workshop reflects, we believe, these new developments. The meeting was characterized by intensive discussions in which the weak nesses and strengths of new and of well established concepts were revealed. We hope that it measured up to the high standards Itzhak Plesser maintained all through his scientific life.
Author: Alvin W. Czanderna Publisher: Springer Science & Business Media ISBN: 1461537088 Category : Science Languages : en Pages : 479
Book Description
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
Author: J. C. Vickerman Publisher: Oxford University Press, USA ISBN: Category : Business & Economics Languages : en Pages : 368
Book Description
This book provides an overview of the phenomenology, technology and application of secondary ion mass spectrometry as a technique for materials analysis. This approach is developing into one of the most effective methods of characterizing the composition and chemical state of the surface and sub-surface layers of solid materials. The first three chapters introduce the basic physical and chemical principles involved and the theories which have been proposed to explain the process. Subsequent chapters describe the instrumental components of the SIMS apparatus, the use of SIMS as an analytical tool, and the development of the techniques of sputtered neutral mass spectrometry and laser microprobe and plasma desorption mass spectrometry. Many practical examples are featured to illustrate the application of SIMS to real problems, possible pitfalls are pointed out, and data of use to analysts are collected in appendices. The book is a practical guide suitable for scientists in all fields who wish to use this valuable analytical technique.
Author: Pierre Ausloos Publisher: Springer Science & Business Media ISBN: 9400937873 Category : Science Languages : en Pages : 491
Book Description
This volume presents the proceedings of a 1986 Advanced Study Institute entitled "Structure/Reactivity and Thermochemistry of Ions", held at Les Arcs, France, June 30 to July 11, 1986. The format of a NATO Institute is ideally suited to in-depth communications between scien tists of diverse backgrounds. Particularly in the field of ion physics and chemistry, where on-going research involves physicists, physical chemists, and organic chemists - who use a variety of experimental and theoretical techniques - it is found that in the relaxed but stimula ting atmosphere of a NATO ASI, each professional group provides unique insights, leading to a better definition and solution of problems relating to the properties of gas phase ions. This book presents chapters based on the lectures presented at the Les Arcs ASI. The participants took the initiative to organize a number of specialized workshops - informal discussion groups which considered questions or problem areas of particular interest. The accounts of these sessions, which are also included in this book, make stimulating reading, and include considerable useful information. This Advanced Study Institute is the fourth in a series of NATO-spon sored institutes devoted to the chemistry and physics of ions in the gas phase. The first, in 1974, in Biarritz, France, focussed on "Interactions between Ions and Molecules".
Author: J. P. Maier
Author: J. P. Maier
Author: Cheuk-Yiu Ng
Author: John L. Holmes
Author: Christine M. Mahoney
Author: Ron Naaman
Author: Alvin W. Czanderna
Author: J. C. Vickerman
Author: J. H. Futrell
Author: Theo W. Hansch
Author: Pierre Ausloos