Author:
Publisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 257
Book Description
Lifetime Factors in Silicon
Semiconductor Silicon 2002
Author: Howard R. Huff
Publisher: The Electrochemical Society
ISBN: 9781566773744
Category : Science
Languages : en
Pages : 650
Book Description
Publisher: The Electrochemical Society
ISBN: 9781566773744
Category : Science
Languages : en
Pages : 650
Book Description
Encyclopedia of Chemical Processing and Design
Author: John J. McKetta Jr
Publisher: CRC Press
ISBN: 9780824726010
Category : Science
Languages : en
Pages : 490
Book Description
"Written by engineers for engineers (with over 150 International Editorial Advisory Board members),this highly lauded resource provides up-to-the-minute information on the chemical processes, methods, practices, products, and standards in the chemical, and related, industries. "
Publisher: CRC Press
ISBN: 9780824726010
Category : Science
Languages : en
Pages : 490
Book Description
"Written by engineers for engineers (with over 150 International Editorial Advisory Board members),this highly lauded resource provides up-to-the-minute information on the chemical processes, methods, practices, products, and standards in the chemical, and related, industries. "
Advanced Semiconductor Processing and Characterization of Electronic and Optical Materials
Author: Devendra K. Sadana
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 164
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 164
Book Description
Semiconductor Characterization
Author: W. Murray Bullis
Publisher: American Institute of Physics
ISBN:
Category : Science
Languages : en
Pages : 760
Book Description
Market: Those in government, industry, and academia interested in state-of-the-art knowledge on semiconductor characterization for research, development, and manufacturing. Based on papers given at an International Nist Workshop in January 1995, Semiconductor Characterization covers the unique characterization requirements of both silicon IC development and manufacturing, and compound semiconductor materials, devices, and manufacturing. Additional sections discuss technology trends and future requirements for compound semiconductor applications. Also highlighted are recent developments in characterization, including in- situ, in-FAB, and off-line analysis methods. The book provides a concise, effective portrayal of industry needs and problems in the important specialty of metrology for semiconductor technology.
Publisher: American Institute of Physics
ISBN:
Category : Science
Languages : en
Pages : 760
Book Description
Market: Those in government, industry, and academia interested in state-of-the-art knowledge on semiconductor characterization for research, development, and manufacturing. Based on papers given at an International Nist Workshop in January 1995, Semiconductor Characterization covers the unique characterization requirements of both silicon IC development and manufacturing, and compound semiconductor materials, devices, and manufacturing. Additional sections discuss technology trends and future requirements for compound semiconductor applications. Also highlighted are recent developments in characterization, including in- situ, in-FAB, and off-line analysis methods. The book provides a concise, effective portrayal of industry needs and problems in the important specialty of metrology for semiconductor technology.
Semiconductor Silicon 2002
Author: Howard R. Huff
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 690
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 690
Book Description
Diffusion and Defect Data
Encyclopedia of Chemical Processing and Design
Author:
Publisher:
ISBN:
Category : Chemical engineering
Languages : en
Pages : 528
Book Description
Publisher:
ISBN:
Category : Chemical engineering
Languages : en
Pages : 528
Book Description