Author:
Publisher:
ISBN: 9780738129457
Category : Boundary scan testing
Languages : en
Pages : 200
Book Description
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.
IEEE Standard Test Access Port and Boundary-scan Architecture
Author:
Publisher:
ISBN: 9780738129457
Category : Boundary scan testing
Languages : en
Pages : 200
Book Description
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.
Publisher:
ISBN: 9780738129457
Category : Boundary scan testing
Languages : en
Pages : 200
Book Description
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.
IEEE Std 1149.1-2001
Author:
Publisher:
ISBN: 9780738129440
Category : Boundary scan testing
Languages : en
Pages : 200
Book Description
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.
Publisher:
ISBN: 9780738129440
Category : Boundary scan testing
Languages : en
Pages : 200
Book Description
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that slows rigorous description of the component-specific aspects of such testability features.
IEEE Standard Test Access Port and Boundary-scan Architecture
Author: IEEE Standards Board
Publisher:
ISBN:
Category : Digital integrated circuits
Languages : en
Pages : 0
Book Description
Publisher:
ISBN:
Category : Digital integrated circuits
Languages : en
Pages : 0
Book Description
IEEE Std 1149.1-2001
1149.1-1990 IEEE Standard Test Access Port and Boundary - Scan Architecture
IEEE Std 1149.1-1990
Supplement to IEEE Std 1149.1-1990, IEEE Standard Test Access Port and Boundary-Scan Architecture
IEEE Standard for Test Access Port and Boundary-Scan Architecture - Redline
IEEE standard test access port and boundary-scan architecture
Author: Institute of Electrical and Electronics Engineers
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
The Test Access Port and Boundary-scan Architecture
Author: Colin M. Maunder
Publisher:
ISBN:
Category : Boundary scan testing
Languages : en
Pages : 408
Book Description
Publisher:
ISBN:
Category : Boundary scan testing
Languages : en
Pages : 408
Book Description