Author: Daniel Malacara
Publisher: John Wiley & Sons
ISBN: 0471484040
Category : Science
Languages : en
Pages : 882
Book Description
The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.
Optical Shop Testing
Author: Daniel Malacara
Publisher: John Wiley & Sons
ISBN: 0471484040
Category : Science
Languages : en
Pages : 882
Book Description
The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.
Publisher: John Wiley & Sons
ISBN: 0471484040
Category : Science
Languages : en
Pages : 882
Book Description
The purpose of this third edition is to bring together in a single book descriptions of all tests carried out in the optical shop that are applicable to optical components and systems. This book is intended for the specialist as well as the non-specialist engaged in optical shop testing. There is currently a great deal of research being done in optical engineering. Making this new edition very timely.
Scientific and Technical Aerospace Reports
IUTAM Symposium on Advanced Optical Methods and Applications in Solid Mechanics
Author: Alexis Lagarde
Publisher: Springer Science & Business Media
ISBN: 0792366042
Category : Science
Languages : en
Pages : 673
Book Description
The request to organize under its patronage at Poitiers in 1998 a Symposium entitled “Advanced Optical Methods and Applications in Solid Mechanics” by the International Union of Theoretical and Applied Mechanics (I.U.T.A.M.) was well received for the following two reasons. First, for nearly 20 years no Symposium devoted to optical methods in solids had been organized. Second, recent advances in digital image processing provided many new applications which are described in the following. We have the honour to present here the proceedings of this Symposium. st th The Symposium took place from august 31 to September 4 at the Institut International de la Prospective in Futuroscope near Poitiers. A significant number of internationally renowned specialists had expressed their wish to participate in this meeting. The Scientific Committee proposed 16 general conferences and selected 33 regular lectures and 17 poster presentations. Papers corresponding to posters are not differentiated in the proceedings from those that were presented orally. It is worth noting that a total of 80 participants, representing 16 countries, registered for this symposium.. The Scientific Committee deserves praise for attracting a significant number of young scientists, both as authors and as participants. Let us add our warm acknowledgements to Professor J.W. Dally and to Professor A.S. Kobayashi who, throughout the symposium preparation time, brought us valuable help.
Publisher: Springer Science & Business Media
ISBN: 0792366042
Category : Science
Languages : en
Pages : 673
Book Description
The request to organize under its patronage at Poitiers in 1998 a Symposium entitled “Advanced Optical Methods and Applications in Solid Mechanics” by the International Union of Theoretical and Applied Mechanics (I.U.T.A.M.) was well received for the following two reasons. First, for nearly 20 years no Symposium devoted to optical methods in solids had been organized. Second, recent advances in digital image processing provided many new applications which are described in the following. We have the honour to present here the proceedings of this Symposium. st th The Symposium took place from august 31 to September 4 at the Institut International de la Prospective in Futuroscope near Poitiers. A significant number of internationally renowned specialists had expressed their wish to participate in this meeting. The Scientific Committee proposed 16 general conferences and selected 33 regular lectures and 17 poster presentations. Papers corresponding to posters are not differentiated in the proceedings from those that were presented orally. It is worth noting that a total of 80 participants, representing 16 countries, registered for this symposium.. The Scientific Committee deserves praise for attracting a significant number of young scientists, both as authors and as participants. Let us add our warm acknowledgements to Professor J.W. Dally and to Professor A.S. Kobayashi who, throughout the symposium preparation time, brought us valuable help.
Electron Beam Testing Technology
Author: John T.L. Thong
Publisher: Springer Science & Business Media
ISBN: 1489915222
Category : Science
Languages : en
Pages : 467
Book Description
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
Publisher: Springer Science & Business Media
ISBN: 1489915222
Category : Science
Languages : en
Pages : 467
Book Description
Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing. While ICs were being fabricated on design rules of several microns, the mechanical ne edle probe served quite adequately for internal chip probing. This scenario changed with growing device complexity and shrinking geometries, prompting IC manufacturers to take note ofthis new testing technology. It required several more years and considerable investment by electron beam tester manufacturers, however, to co me up with user-friendly automated systems that were acceptable to IC test engineers. These intervening years witnessed intense activity in the development of instrumentation, testing techniques, and system automation, as evidenced by the proliferation of technical papers presented at conferences. With the shift of interest toward applications, the technology may now be considered as having come of age.
Advances In Dynamics, Instrumentation And Control, Volume Ii - Proceedings Of The 2006 International Conference (Cdic '06)
Author: Chun-yi Su
Publisher: World Scientific
ISBN: 9814474908
Category : Technology & Engineering
Languages : en
Pages : 421
Book Description
This second volume is a compilation of 43 articles representing the scientific and technical advances in various aspects of system dynamics, instrumentation, measurement techniques, simulation and controls, which would serve as an important resource in the field. The articles represent state-of-the-art contributions in the fields of dynamics and control of nonlinear, hybrid and stochastic systems; nonlinear control theory; and adaptive, model predictive and real-time controls with applications involving fault diagnostics, manufacturing systems, vehicular dynamics, simulator designs, smart actuators, etc.
Publisher: World Scientific
ISBN: 9814474908
Category : Technology & Engineering
Languages : en
Pages : 421
Book Description
This second volume is a compilation of 43 articles representing the scientific and technical advances in various aspects of system dynamics, instrumentation, measurement techniques, simulation and controls, which would serve as an important resource in the field. The articles represent state-of-the-art contributions in the fields of dynamics and control of nonlinear, hybrid and stochastic systems; nonlinear control theory; and adaptive, model predictive and real-time controls with applications involving fault diagnostics, manufacturing systems, vehicular dynamics, simulator designs, smart actuators, etc.
Springer Handbook of Microscopy
Author: Peter W. Hawkes
Publisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
Publisher: Springer Nature
ISBN: 3030000699
Category : Technology & Engineering
Languages : en
Pages : 1561
Book Description
This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
High-Resolution NMR Techniques in Organic Chemistry
Author: Timothy D.W. Claridge
Publisher: Newnes
ISBN: 0080546285
Category : Mathematics
Languages : en
Pages : 400
Book Description
"Nuclear Magnetic Resonance (NMR) Spectroscopy remains the foremost analytical technique for the structure elucidation of organic molecules and an indispensable tool for the synthetic, medicinal and natural product chemist. New techniques continue to emerge and the application of NMR methods continues to expand. High-Resolution NMR Techniques in Organic Chemistry is designed for use in academic and industrial NMR facilities, as a text for graduate-level NMR courses, and as an accessible reference for the chemist's or spectroscopist's desk."--BOOK JACKET.
Publisher: Newnes
ISBN: 0080546285
Category : Mathematics
Languages : en
Pages : 400
Book Description
"Nuclear Magnetic Resonance (NMR) Spectroscopy remains the foremost analytical technique for the structure elucidation of organic molecules and an indispensable tool for the synthetic, medicinal and natural product chemist. New techniques continue to emerge and the application of NMR methods continues to expand. High-Resolution NMR Techniques in Organic Chemistry is designed for use in academic and industrial NMR facilities, as a text for graduate-level NMR courses, and as an accessible reference for the chemist's or spectroscopist's desk."--BOOK JACKET.
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 464
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 464
Book Description
Technical News Bulletin of the National Bureau of Standards
Handbook of Optical Dimensional Metrology
Author: Kevin Harding
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods
Publisher: Taylor & Francis
ISBN: 1439854823
Category : Science
Languages : en
Pages : 497
Book Description
Due to their speed, data density, and versatility, optical metrology tools play important roles in today's high-speed industrial manufacturing applications. Handbook of Optical Dimensional Metrology provides useful background information and practical examples to help readers understand and effectively use state-of-the-art optical metrology methods