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Author: Xiaolei Wu Publisher: CRC Press ISBN: 100035332X Category : Technology & Engineering Languages : en Pages : 796
Book Description
Heterostructured (HS) materials represent an emerging class of materials that are expected to become a major research field for the communities of materials, mechanics, and physics in the next couple of decades. One of the biggest advantages of HS materials is that they can be produced by large-scale industrial facilities and technologies and therefore can be commercialized without the scaling up and high-cost barriers that are often encountered by other advanced materials. This book collects recent papers on the progress in the field of HS materials, especially their fundamental physics. The papers are arranged in a sequence of chapters that will help new researchers entering the field to have a quick and comprehensive understanding of HS materials, including the fundamentals and recent progress in their processing, characterization, and properties.
Author: Xiaolei Wu Publisher: CRC Press ISBN: 100035332X Category : Technology & Engineering Languages : en Pages : 796
Book Description
Heterostructured (HS) materials represent an emerging class of materials that are expected to become a major research field for the communities of materials, mechanics, and physics in the next couple of decades. One of the biggest advantages of HS materials is that they can be produced by large-scale industrial facilities and technologies and therefore can be commercialized without the scaling up and high-cost barriers that are often encountered by other advanced materials. This book collects recent papers on the progress in the field of HS materials, especially their fundamental physics. The papers are arranged in a sequence of chapters that will help new researchers entering the field to have a quick and comprehensive understanding of HS materials, including the fundamentals and recent progress in their processing, characterization, and properties.
Author: James C. M. Li Publisher: CRC Press ISBN: 9814241970 Category : Science Languages : en Pages : 346
Book Description
This book concentrates on both understanding and development of nanocrystalline materials. The original relation that connects grain size and strength, known as the Hall-Petch relation, is studied in the nanometer grain size region. The breakdown of such a relation is a challenge. Why and how to overcome it? Is the dislocation mechanism still operating when the grain size is very small, approaching the amorphous limit? How do we go from the microstructure information to the continuum description of the mechanical properties?
Author: Randall M. German Publisher: CRC Press ISBN: 1000148602 Category : Technology & Engineering Languages : en Pages : 552
Book Description
Based on the sintering conference held at the Pennsylvania State University, USA, this text presents advances in the application of sintering to the most important industrial materials. It offers results on both solid-state and microphase sintering as well as microstructure evolution, and introduces new applications, processes, materials and solutions to technical problems.
Author: C. Barry Carter Publisher: Springer ISBN: 3319266519 Category : Technology & Engineering Languages : en Pages : 543
Book Description
This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Author: L.A. Feigin Publisher: Springer Science & Business Media ISBN: 1475766246 Category : Science Languages : en Pages : 339
Book Description
Small-angle scattering of X rays and neutrons is a widely used diffraction method for studying the structure of matter. This method of elastic scattering is used in various branches of science and technology, includ ing condensed matter physics, molecular biology and biophysics, polymer science, and metallurgy. Many small-angle scattering studies are of value for pure science and practical applications. It is well known that the most general and informative method for investigating the spatial structure of matter is based on wave-diffraction phenomena. In diffraction experiments a primary beam of radiation influences a studied object, and the scattering pattern is analyzed. In principle, this analysis allows one to obtain information on the structure of a substance with a spatial resolution determined by the wavelength of the radiation. Diffraction methods are used for studying matter on all scales, from elementary particles to macro-objects. The use of X rays, neutrons, and electron beams, with wavelengths of about 1 A, permits the study of the condensed state of matter, solids and liquids, down to atomic resolution. Determination of the atomic structure of crystals, i.e., the arrangement of atoms in a unit cell, is an important example of this line of investigation.
Author: Wei Cai Publisher: Cambridge University Press ISBN: 1316571718 Category : Technology & Engineering Languages : en Pages : 535
Book Description
This textbook provides students with a complete working knowledge of the properties of imperfections in crystalline solids. Readers will learn how to apply the fundamental principles of mechanics and thermodynamics to defect properties in materials science, gaining all the knowledge and tools needed to put this into practice in their own research. Beginning with an introduction to defects and a brief review of basic elasticity theory and statistical thermodynamics, the authors go on to guide the reader in a step-by-step way through point, line, and planar defects, with an emphasis on their structural, thermodynamic, and kinetic properties. Numerous end-of-chapter exercises enable students to put their knowledge into practice, and with solutions for instructors and MATLAB® programs available online, this is an essential text for advanced undergraduate and introductory graduate courses in crystal defects, as well as being ideal for self-study.
Author: Anthony E. Hughes Publisher: Springer ISBN: 9401775400 Category : Technology & Engineering Languages : en Pages : 429
Book Description
This book covers a broad range of materials science that has been brought to bear on providing solutions to the challenges of developing self-healing and protective coatings for a range of metals. The book has a strong emphasis on characterisation techniques, particularly new techniques that are beginning to be used in the coatings area. It features many contributions written by experts from various industrial sectors which examine the needs of the sectors and the state of the art. The development of self-healing and protective coatings has been an expanding field in recent years and applies a lot of new knowledge gained from other fields as well as other areas of materials science to the development of coatings. It has borrowed from fields such as the food and pharmaceutical industries who have used, polymer techniques, sol-gel science and colloidosome technology for a range encapsulation techniques. It has also borrowed from fields like hydrogen storage such as from the development of hierarchical and other materials based on organic templating as “nanocontainers” for the delivery of inhibitors. In materials science, recent developments in high throughput and other characterisation techniques, such as those available from synchrotrons, are being increasing used for novel characterisation – one only needs to look at the application of these techniques in self healing polymers to gauge wealth of new information that has been gained from these techniques. This work is largely driven by the need to replace environmental pollutants and hazardous chemicals that represent risk to humans such as chromate inhibitors which are still used in some applications.
Author: Williams Lefebvre Publisher: Academic Press ISBN: 0128047453 Category : Science Languages : en Pages : 418
Book Description
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process. - Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials - Written for both experienced researchers and new users - Includes exercises, along with corrections, for users to practice the techniques discussed - Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Author: Joshua Pelleg Publisher: Springer Science & Business Media ISBN: 9400743424 Category : Science Languages : en Pages : 645
Book Description
The subject of mechanical behavior has been in the front line of basic studies in engineering curricula for many years. This textbook was written for engineering students with the aim of presenting, in a relatively simple manner, the basic concepts of mechanical behavior in solid materials. A second aim of the book is to guide students in their laboratory experiments by helping them to understand their observations in parallel with the lectures of their various courses; therefore the first chapter of the book is devoted to mechanical testing. Another aim of the book is to provide practicing engineers with basic help to bridge the gap of time that has passed from their graduation up to their actual involvement in engineering work. The book also serves as the basis for more advanced studies and seminars when pursuing courses on a graduate level. The content of this textbook and the topics discussed correspond to courses that are usually taught in universities and colleges all over the world, but with a different and more modern approach. It is however unique by the inclusion of an extensive chapter on mechanical behavior in the micron and submicron/nanometer range. Mechanical deformation phenomena are explained and often related to the presence of dislocations in structures. Many practical illustrations are provided representing various observations encountered in actual structures of particularly technical significance. A comprehensive list of references at the end of each chapter is included to provide a broad basis for further studying the subject.
Author: Xiaolei Wu
Author: Xiaolei Wu
Author: Donald McLean
Author: James C. M. Li
Author: Randall M. German
Author: C. Barry Carter
Author: L.A. Feigin
Author: Wei Cai
Author: Anthony E. Hughes
Author: Williams Lefebvre
Author: Joshua Pelleg