Author: Yuriy S. Shmaliy
Publisher: Springer Nature
ISBN: 9819927307
Category : Technology & Engineering
Languages : en
Pages : 1060
Book Description
This book collects selected aspects of recent advances and experiences, emerging technology trends that have positively impacted our world from operators, authorities, and associations from CCIE 2022, to help address the world’s advanced computing, control technology, information technology, artificial intelligence, machine learning, deep learning, and neural networks. Meanwhile, the topics included in the proceedings have high research value and present current insights, developments, and trends in computing, control, and industrial engineering.
7th International Conference on Computing, Control and Industrial Engineering (CCIE 2023)
Author: Yuriy S. Shmaliy
Publisher: Springer Nature
ISBN: 9819927307
Category : Technology & Engineering
Languages : en
Pages : 1060
Book Description
This book collects selected aspects of recent advances and experiences, emerging technology trends that have positively impacted our world from operators, authorities, and associations from CCIE 2022, to help address the world’s advanced computing, control technology, information technology, artificial intelligence, machine learning, deep learning, and neural networks. Meanwhile, the topics included in the proceedings have high research value and present current insights, developments, and trends in computing, control, and industrial engineering.
Publisher: Springer Nature
ISBN: 9819927307
Category : Technology & Engineering
Languages : en
Pages : 1060
Book Description
This book collects selected aspects of recent advances and experiences, emerging technology trends that have positively impacted our world from operators, authorities, and associations from CCIE 2022, to help address the world’s advanced computing, control technology, information technology, artificial intelligence, machine learning, deep learning, and neural networks. Meanwhile, the topics included in the proceedings have high research value and present current insights, developments, and trends in computing, control, and industrial engineering.
NIST Technical Note
Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 558
Book Description
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 558
Book Description
The 22nd Annual Precise Time and Time Interval (PTTI) Applications and Planning Meeting
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 534
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 534
Book Description
Monthly Catalogue, United States Public Documents
Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1114
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1114
Book Description
NASA Conference Publication
Proceedings of the Twelfth Annual Precise Time and Time Interval (PTTI) Applications and Planning Meeting
The Measurement of Time
Author: Claude Audoin
Publisher: Cambridge University Press
ISBN: 9780521003971
Category : Reference
Languages : en
Pages : 356
Book Description
A unique insight into the measurement of time and its applications, at an introductory level.
Publisher: Cambridge University Press
ISBN: 9780521003971
Category : Reference
Languages : en
Pages : 356
Book Description
A unique insight into the measurement of time and its applications, at an introductory level.
Monthly Catalog of United States Government Publications
Author:
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 968
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 968
Book Description
Recent Advances in Metrology and Fundamental Constants
Author: T.J. Quinn
Publisher: IOS Press
ISBN: 1614990026
Category : Science
Languages : en
Pages : 836
Book Description
The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.
Publisher: IOS Press
ISBN: 1614990026
Category : Science
Languages : en
Pages : 836
Book Description
The exchange between physics and metrology is always fascinating and exciting. Many are the open problems in physics that call for extremely precise standards, many are the advances in metrology made possible by a deep and assiduous study of the underlying physics. One has just to think of the enormous sophistication required in the measurements of some absolute quantities such as the Avogadro, the gas, or the gravitational constants. It is also worth noticing that not only the units of a metrological system are interrelated through the fundamental constants, but also the latter find their full significance when they are determined through the most exacting metrological experiments. Over the past decade many improvements took place and these are discussed in this book; from one side the old caesium SI second definition has found a new realisation, with the “fountain” approach, replacing the classical thermal atomic beam. The use of “cold” atom techniques, in which bunches of inert atoms are collected, slowed down, and cooled, has opened a number of new and unexpected avenues for metrology and fundamental constants; one of these possibilities being the atom interferometry. Another important “quantum jump” was the demonstration of the possibility of performing a direct frequency division in the visible, using ultra short femtosecond pulses. In addition, the possibility of “counting” electrons or photons gave a fundamental support to the development of single-electron capacitance standards and to new scenarios in the absolute calibration of photo-detectors.