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Author: Michael Haschke Publisher: John Wiley & Sons ISBN: 3527344632 Category : Science Languages : en Pages : 496
Book Description
Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.
Author: Michael Haschke Publisher: John Wiley & Sons ISBN: 3527344632 Category : Science Languages : en Pages : 496
Book Description
Provides comprehensive coverage on using X-ray fluorescence for laboratory applications This book focuses on the practical aspects of X-ray fluorescence (XRF) spectroscopy and discusses the requirements for a successful sample analysis, such as sample preparation, measurement techniques and calibration, as well as the quality of the analysis results. X-Ray Fluorescence Spectroscopy for Laboratory Applications begins with a short overview of the physical fundamentals of the generation of X-rays and their interaction with the sample material, followed by a presentation of the different methods of sample preparation in dependence on the quality of the source material and the objective of the measurement. After a short description of the different available equipment types and their respective performance, the book provides in-depth information on the choice of the optimal measurement conditions and the processing of the measurement results. It covers instrument types for XRF; acquisition and evaluation of X-Ray spectra; analytical errors; analysis of homogeneous materials, powders, and liquids; special applications of XRF; process control and automation. An important resource for the analytical chemist, providing concrete guidelines and support for everyday analyses Focuses on daily laboratory work with commercially available devices Offers a unique compilation of knowledge and best practices from equipment manufacturers and users Covers the entire work process: sample preparation, the actual measurement, data processing, assessment of uncertainty, and accuracy of the obtained results X-Ray Fluorescence Spectroscopy for Laboratory Applications appeals to analytical chemists, analytical laboratories, materials scientists, environmental chemists, chemical engineers, biotechnologists, and pharma engineers.
Author: Ron Jenkins Publisher: Wiley-Interscience ISBN: 9780471836759 Category : Science Languages : en Pages : 192
Book Description
X-Ray Fluorescence Spectrometry, Ron Jenkins Written by the principal scientist for JCPDS, the International Centre for Diffraction Data, Swarthmore, Pennsylvania, this book focuses on the scientific and technological developments achieved in the field during the past decade. It offers comprehensive coverage of all crucial topics, including: the properties and uses of X-ray emission spectrometry in material analysis; its industrial applications; X-ray diffraction; instrumentation for X-ray fluorescence spectrometry; a comparison of wavelength and energy dispersive spectrometers; and use of X-ray spectrometry for qualitative analysis.
Author: Eva Margui Publisher: Momentum Press ISBN: 1606503936 Category : Technology & Engineering Languages : en Pages : 149
Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Author: Michael Haschke Publisher: Springer Science & Business Media ISBN: 3319048643 Category : Science Languages : en Pages : 367
Book Description
Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a μ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.
Author: M. Steven Shackley Publisher: Springer Science & Business Media ISBN: 1441968865 Category : Social Science Languages : en Pages : 244
Book Description
Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come. Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide. The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.
Author: Burkhard Beckhoff Publisher: Springer Science & Business Media ISBN: 3540367225 Category : Science Languages : en Pages : 897
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: P. J. Potts Publisher: Royal Society of Chemistry ISBN: 085404552X Category : Science Languages : en Pages : 305
Book Description
This book brings together the knowledge and expertise of internationally recognised scientists with practical experience of in situ analysis using portable X-ray fluorescence technology.
Author: Victor R Preedy Publisher: Academic Press ISBN: 0080920861 Category : Technology & Engineering Languages : en Pages : 1335
Book Description
Over two billion people worldwide are at risk for the spectrum of disorders known as "The Iodine Deficiency Disorders." 1-10% will suffer cretinism; 5-30% will have some sort of brain damage or neurological impairment and 30-70% will be hypothyroid. The causes of iodine deficiencies can be considered from both simplistic and more complex perspectives: From the leaching of iodine from soil resulting in crops with low iodine content to malnutrition resulting in impaired iodine absorption. Poor dietary diversification and impoverished socio-economic development can also lead to iodine deficiencies. Although it is possible to diagnose and treat deficiencies, there is still an ongoing dialogue regarding the detailed molecular pathology of iodine homeostatis, how hypothyroidism impacts the body tissues, and efficient diagnosis and treatment of the Iodine Deficiency Disorders. This Handbook provides a resource of information on the various pathways and processes based on different countries or diseases. Because there is a constant flow of new information on iodine and related disorders, the goal of this Handbook is to provide a base of scientific information upon which additional knowledge can be applied. - Provides important information on one of the most common micro-nutrient deficiencies in the world, the most important "single nutrient-multiple consequences" paradigm today - Includes information on iodine-related diseases, including those that are common, preventable and treatable - Provides insight from a broad perspective of viewpoints -- from subcellular transports to economic impact
Author: Ron Jenkins Publisher: CRC Press ISBN: 9780824795542 Category : Science Languages : en Pages : 512
Book Description
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
Author: Rene Van Grieken Publisher: CRC Press ISBN: 9780203908709 Category : Science Languages : en Pages : 1016
Book Description
"Updates fundamentals and applications of all modes of x-ray spectrometry, including total reflection and polarized beam x-ray fluorescence analysis, and synchrotron radiation induced x-ray emission. Promotes the accurate measurement of samples while reducing the scattered background in the x-ray spectrum."
Author: Michael Haschke
Author: Michael Haschke
Author: Ron Jenkins
Author: Eva Margui
Author: Michael Haschke
Author: M. Steven Shackley
Author: Burkhard Beckhoff
Author: P. J. Potts
Author: Victor R Preedy
Author: Ron Jenkins
Author: Rene Van Grieken