Author: Harold M. Levy
Publisher:
ISBN:
Category :
Languages : en
Pages : 133
Book Description
The ability to test a digital network as simply as possible has become quite important recently due to advances in integrated circuit technology and the consequent increases in the complexity of the networks being produced. The paper presents several existing methods of 'fault detection test generation'. A new approach to the problem of finding a minimal test set is then presented. The test set is obtained by solving a set of equations which are obtained directly from the network. It is shown that the solutions to these equations constitute a complete test set both for a nonreconvergent fanout network and for a reconvergent fanout network. A general solution procedure is presented which will generate a minimal test set for any network. An algorithm for generating a minimal test set for a nonreconvergent fanout network is also presented. (Author).
Fault Detection Methods in Combinational Digital Logic Networks
Author: Harold M. Levy
Publisher:
ISBN:
Category :
Languages : en
Pages : 133
Book Description
The ability to test a digital network as simply as possible has become quite important recently due to advances in integrated circuit technology and the consequent increases in the complexity of the networks being produced. The paper presents several existing methods of 'fault detection test generation'. A new approach to the problem of finding a minimal test set is then presented. The test set is obtained by solving a set of equations which are obtained directly from the network. It is shown that the solutions to these equations constitute a complete test set both for a nonreconvergent fanout network and for a reconvergent fanout network. A general solution procedure is presented which will generate a minimal test set for any network. An algorithm for generating a minimal test set for a nonreconvergent fanout network is also presented. (Author).
Publisher:
ISBN:
Category :
Languages : en
Pages : 133
Book Description
The ability to test a digital network as simply as possible has become quite important recently due to advances in integrated circuit technology and the consequent increases in the complexity of the networks being produced. The paper presents several existing methods of 'fault detection test generation'. A new approach to the problem of finding a minimal test set is then presented. The test set is obtained by solving a set of equations which are obtained directly from the network. It is shown that the solutions to these equations constitute a complete test set both for a nonreconvergent fanout network and for a reconvergent fanout network. A general solution procedure is presented which will generate a minimal test set for any network. An algorithm for generating a minimal test set for a nonreconvergent fanout network is also presented. (Author).
Fault Detection Methods in Combinational Ditital Logic Networks
Author: Harold M. Levy
Publisher:
ISBN:
Category : Combinatory logic
Languages : en
Pages : 246
Book Description
Publisher:
ISBN:
Category : Combinatory logic
Languages : en
Pages : 246
Book Description
Fault Detection Tests for Combinational Logic Networks
Author: Daniel Charles Scavezze
Publisher:
ISBN:
Category :
Languages : en
Pages : 162
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 162
Book Description
Optimum Statistical Fault Detection in Combinational Circuits
Fault Analysis of Combinational Logic Networks
Author: Lung-Hsiung Chang
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 248
Book Description
Publisher:
ISBN:
Category : Electronic digital computers
Languages : en
Pages : 248
Book Description
Fault Diagnosis of Digital Circuits
Author: V. N. Yarmolik
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 216
Book Description
The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 216
Book Description
The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.
Fault Detection in Digital Circuits
Author: Arthur D. Friedman
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 252
Book Description
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 252
Book Description
Fault Diagnosis of Multiple Output Combinational Logic Networks
Spectral Techniques and Fault Detection
Author: Marg Karpovsky
Publisher: Elsevier
ISBN: 032314442X
Category : Technology & Engineering
Languages : en
Pages : 619
Book Description
Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.
Publisher: Elsevier
ISBN: 032314442X
Category : Technology & Engineering
Languages : en
Pages : 619
Book Description
Spectral Techniques and Fault Detection focuses on the spectral techniques for the analysis, testing, and design of digital devices. This book discusses the error detection and correction in digital devices. Organized into 10 chapters, this book starts with an overview of the concepts and tools to evaluate the applicability of various spectral approaches and fault-detection techniques to the design. This text then describes the class of generalized Programmable Logic Array configurations called Encoded PLAs. Other chapters consider the two-sided Chrestenson Transform to the analysis of some pattern properties. This book describes as well a certain type of cellular arrays for highly parallel processing, namely, three-dimensional arrays. The final chapter deals with the system design methods that allow and encourage designers to incorporate the necessary distributed error correction throughout any digital system. This book is a valuable resource for graduate students and engineers working in the fields of logic design, spectral techniques, testing, and self-testing of digital devices.