Author: James R. Ehrstein
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
Spreading Resistance Symposium
Author: James R. Ehrstein
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 300
Book Description
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 956
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 956
Book Description
Physics Of Semiconductors, The - Proceedings Of The Xxi International Conference (In 2 Volumes)
Author: Ping Jiang
Publisher: World Scientific
ISBN: 9814554065
Category :
Languages : en
Pages : 2151
Book Description
The 21st conference proceedings continue the tradition of the ICPS series. The proceedings cover all aspects of semiconductor physics, including those related to materials, processing and devices. Plenary and invited speakers address areas of major interest.
Publisher: World Scientific
ISBN: 9814554065
Category :
Languages : en
Pages : 2151
Book Description
The 21st conference proceedings continue the tradition of the ICPS series. The proceedings cover all aspects of semiconductor physics, including those related to materials, processing and devices. Plenary and invited speakers address areas of major interest.
Physics of Failure in Electronics
Author: Morton E. Goldberg
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 696
Book Description
Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 696
Book Description
Technical Abstract Bulletin
SERI Photovoltaic Advanced Research and Development Bibliography, 1982-1985
Proceedings of the Ninth International Conference on Chemical Vapor Deposition, 1984
Author: McD. Robinson
Publisher:
ISBN:
Category : Vapor-plating
Languages : en
Pages : 828
Book Description
Publisher:
ISBN:
Category : Vapor-plating
Languages : en
Pages : 828
Book Description
National Semiconductor Metrology Program, Semiconductor Electronics Division, NIST List Of Publications, LP 103, March 1999
Proceedings of the ... Microelectronics Symposium
Comprehensive Test Pattern and Approach for Characterizing SOS Technology
Author: William E. Ham
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 388
Book Description
Publisher:
ISBN:
Category : Integrated circuits
Languages : en
Pages : 388
Book Description