Experimental Techniques of Texture Analysis PDF Download

Author: Hans Joachim Bunge
Publisher: D G M Metallurgy Information
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 466

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Author: Hans J. Bunge
Publisher:
ISBN:
Category :
Languages : en
Pages : 442

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Author: H.-J. Bunge
Publisher: Elsevier
ISBN: 1483278395
Category : Technology & Engineering
Languages : en
Pages : 614

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Book Description
Texture Analysis in Materials Science Mathematical Methods focuses on the methodologies, processes, techniques, and mathematical aids in the orientation distribution of crystallites. The manuscript first offers information on the orientation of individual crystallites and orientation distributions. Topics include properties and representations of rotations, orientation distance, and ambiguity of rotation as a consequence of crystal and specimen symmetry. The book also takes a look at expansion of orientation distribution functions in series of generalized spherical harmonics, fiber textures, and methods not based on the series expansion. The publication reviews special distribution functions, texture transformation, and system of programs for the texture analysis of sheets of cubic materials. The text also ponders on the estimation of errors, texture analysis, and physical properties of polycrystalline materials. Topics include comparison of experimental and recalculated pole figures; indetermination error for incomplete pole figures; and determination of the texture coefficients from anisotropie polycrystal properties. The manuscript is a dependable reference for readers interested in the use of mathematical aids in the orientation distribution of crystallites.

Author: Valerie Randle
Publisher: CRC Press
ISBN: 9789056992248
Category : Technology & Engineering
Languages : en
Pages : 412

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Book Description
Encompassing the concepts, practice, and application of orientation analysis, Introduction to Texture Analysis is an essential reference source for reserachers in textiles. The author uses an accessible style to share her expertise, providing comprehensive coverage of the theory and practice of the texture techniques now available and discusses their applications in research and industry. The text considers the merits of each technique for specific applications. Case studies expand upon the author's explanations and help illustrate the main principles involved. Topics include applications of diffraction, SEM- and TEM-based techniques, and crystallographic analyses.

Author: Olaf Engler
Publisher: CRC Press
ISBN: 1420063669
Category : Science
Languages : en
Pages : 490

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Book Description
The first edition of Introduction to Texture Analysis: Macrotexture, Microtexture, and Orientation Mapping broke new ground by collating seventy years worth of research in a convenient single-source format. Reflecting emerging methods and the evolution of the field, the second edition continues to provide comprehensive coverage of the concepts, pra

Author: Chi Hau Chen
Publisher: World Scientific
ISBN: 9814497649
Category : Computers
Languages : en
Pages : 1045

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Book Description
The very significant advances in computer vision and pattern recognition and their applications in the last few years reflect the strong and growing interest in the field as well as the many opportunities and challenges it offers. The second edition of this handbook represents both the latest progress and updated knowledge in this dynamic field. The applications and technological issues are particularly emphasized in this edition to reflect the wide applicability of the field in many practical problems. To keep the book in a single volume, it is not possible to retain all chapters of the first edition. However, the chapters of both editions are well written for permanent reference. This indispensable handbook will continue to serve as an authoritative and comprehensive guide in the field.

Author: H. J. Bunge
Publisher: CRC Press
ISBN: 9782881247231
Category : Science
Languages : en
Pages : 48

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Author: J. Dumas
Publisher: Elsevier
ISBN: 0444596542
Category : Technology & Engineering
Languages : en
Pages : 763

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Book Description
A wide range of progress in materials development [single crystals, ceramics, thin films, wire and tapes] is reported in the 169 papers in this volume. The main focus of the papers is in attaining a better understanding of the relationship between microstructure and electrical properties. Invited papers cover topics such as the effects of substitution and doping; multilayers; nanostructure characterisation; electric field effects in High Tc Superconductors [HTS]; surface stability; critical currents; flux pinning and magnetooptic imaging of flux patterns; effects of irradiation induced defects; properties and preparation of materials; microwave properties and electronic devices. A clearly broadened basis for understanding processes and mechanisms in [HTS] is portrayed. Appreciable progress has been achieved in the reproducible manufacturing of high quality materials supported by very efficient methods in microstructural analysis. This essential improvement is reflected in the increased number of practical devices encouraging the use of HTS in applications for electronics and power engineering, all of which are reviewed in depth in this work.

Author: Daniel Chateigner
Publisher: John Wiley & Sons
ISBN: 1118622642
Category : Technology & Engineering
Languages : en
Pages : 382

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Book Description
This book introduces and details the key facets of Combined Analysis—an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing—a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabilized, quantitative texture analysis is also detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analysis concept, showing how it is superior to the view presented when we look at only one part of the analyses. This book shows that the existence of texture in a specimen can be envisaged as a way to decouple ordinarily strongly correlated parameters, as measured for instance in powder diagrams, and to examine and detail deeper material characterizations in a single methodology.

Author: V. Randle
Publisher: CRC Press
ISBN: 1000944034
Category : Technology & Engineering
Languages : en
Pages : 147

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Book Description
A cornerstone in the study of both natural and technological materials is characterisation of microstructure. In the widest sense this topic encompasses, for all phases present: morphology, including size and shape distributions; chemical composition; crystallographic parameters, including orientation and orientation relationships. A landmark advance for the materials community occurred with the genesis of 'microtexture', which for the first time provided integration of crystallographic parameters and other aspects of the microstructure. A definition of microtexture is: 'a population of crystallographic orientations whose individual components are linked to their location within the microstructure.' The term microtexture also describes any experimental technique used to determine this information. Essentially, a stationary beam of electrons is diffracted by atomic planes in the sampled volume of specimen. Analysis of the resulting diffraction pattern provides crystallographic information which can be related back to its position of origin. An estimated 95 percent of microtexture determination is by 'electron backscatter diffraction' (EBSD) in a scanning electron microscope (SEM), with the remaining 5 percent contributed mainly by transmission electron microscopy (TEM) counterparts to EBSD. Evaluation (indexing) of EBSD diffraction patterns and output of data in a variety of formats is in most cases fully automated. The most exciting EBSD output is an 'orientation map', which is a quantitative depiction of the microstructure in terms of its orientation constituents. Microtexture determination is now firmly established as the most comprehensive experimental tool for quantitative characterisation and analysis of microstructure, and is used extensively in both research and industry. Much has changed since this book was first published and the second edition has been completely rewritten to reflect these changes.