Author:
Publisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 586
Book Description
Nuclear Science Abstracts
NBS Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 700
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 700
Book Description
Publications of the National Institute of Standards and Technology ... Catalog
Author: National Institute of Standards and Technology (U.S.)
Publisher:
ISBN:
Category :
Languages : en
Pages : 696
Book Description
Publisher:
ISBN:
Category :
Languages : en
Pages : 696
Book Description
Scientific and Technical Aerospace Reports
Energy Research Abstracts
Publications
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 620
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 620
Book Description
Publications of the National Bureau of Standards ... Catalog
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 704
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 704
Book Description
Ionizing Radiation Effects in MOS Devices and Circuits
Author: T. P. Ma
Publisher: John Wiley & Sons
ISBN: 9780471848936
Category : Technology & Engineering
Languages : en
Pages : 616
Book Description
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
Publisher: John Wiley & Sons
ISBN: 9780471848936
Category : Technology & Engineering
Languages : en
Pages : 616
Book Description
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
Publications of the National Bureau of Standards 1978 Catalog
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 692
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 692
Book Description
Proceedings of the Sixth Workshop on Electronics for LHC Experiments
Author:
Publisher:
ISBN:
Category : Automatic data collection systems
Languages : en
Pages : 612
Book Description
The purpose of the workshop was to review the electronics for LHC experiments and to identify areas and encourage common efforts for the development of electronics within and between the different LHC experiments and to promote collaboration in the engineering and physics communities involed in the LHC activities..
Publisher:
ISBN:
Category : Automatic data collection systems
Languages : en
Pages : 612
Book Description
The purpose of the workshop was to review the electronics for LHC experiments and to identify areas and encourage common efforts for the development of electronics within and between the different LHC experiments and to promote collaboration in the engineering and physics communities involed in the LHC activities..