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Author: John C. Russ Publisher: Butterworth-Heinemann ISBN: 1483164004 Category : Science Languages : en Pages : 315
Book Description
Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.
Author: John C. Russ Publisher: Butterworth-Heinemann ISBN: 1483164004 Category : Science Languages : en Pages : 315
Book Description
Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis.
Author: Alice M. W. Hunt Publisher: Oxford University Press ISBN: 0199681538 Category : Antiques & Collectibles Languages : en Pages : 777
Book Description
This volume draws together topics and methodologies essential for the socio-cultural, mineralogical, and geochemical analysis of archaeological ceramic, one of the most complex and ubiquitous archaeomaterials in the archaeological record. It provides an invaluable resource for archaeologists, anthropologists, and archaeological materials scientists.
Author: Eva Margui Publisher: Momentum Press ISBN: 1606503936 Category : Technology & Engineering Languages : en Pages : 149
Book Description
X-ray fluorescence spectrometry (XRF) is a well-established analytical technique for qualitative and quantitative elemental analysis of a wide variety of routine quality control and research samples. Among its many desirable features, it delivers true multi-element character analysis, acceptable speed and economy, easy of automation, and the capacity to analyze solid samples. This remarkable contribution to this field provides a comprehensive and up-to-date account of basic principles, recent developments, instrumentation, sample preparation procedures, and applications of XRF analysis. If you are a professional in materials science, analytic chemistry, or physics, you will benefit from not only the review of basics, but also the newly developed technologies with XRF. Those recent technological advances, including the design of low-power micro- focus tubes and novel X-ray optics and detectors, have made it possible to extend XRF to the analysis of low-Z elements and to obtain 2D or 3D information on a micrometer-scale. And, the recent development and commercialization of bench top and portable instrumentation, offering extreme simplicity of operation in a low-cost design, have extended the applications of XRF to many more analytical problems.
Author: M. Steven Shackley Publisher: Springer Science & Business Media ISBN: 1441968865 Category : Social Science Languages : en Pages : 244
Book Description
Since the 1960s, x-ray fluorescence spectrometry (XRF), both wavelength and energy-dispersive have served as the workhorse for non-destructive and destructive analyses of archaeological materials. Recently eclipsed by other instrumentation such as LA-ICP-MS, XRF remains the mainstay of non-destructive chemical analyses in archaeology, particularly for volcanic rocks, and most particularly for obsidian. In a world where heritage and repatriation issues drive archaeological method and theory, XRF remains an important tool for understanding the human past, and will remain so for decades to come. Currently, there is no comprehensive book in XRF applications in archaeology at a time when the applications of portable XRF and desktop XRF instrumentation are exploding particularly in anthropology and archaeology departments worldwide. The contributors to this volume are the experts in the field, and most are at the forefront of the newest applications of XRF to archaeological problems. It covers all relevant aspects of the field for those using the newest XRF technologies to deal with very current issues in archaeology.
Author: Kenneth P. Severin Publisher: Springer Science & Business Media ISBN: 1402028415 Category : Science Languages : en Pages : 228
Book Description
This book provides a very basic introduction to electron microscopy and energy dispersive spectrometry (EDS). It has the largest compiled collection of EDS spectra ever published and covers most common rock forming minerals. In addition, it provides a key to help the novice wade through the large number of spectra.
Author: Ron Jenkins Publisher: John Wiley & Sons ISBN: 1118521048 Category : Science Languages : en Pages : 1
Book Description
X-ray fluorescence spectroscopy, one of the most powerful and flexible techniques available for the analysis and characterization of materials today, has gone through major changes during the past decade. Fully revised and expanded by 30%, X-Ray Fluorescence Spectrometry, Second Edition incorporates the latest industrial and scientific trends in all areas. It updates all previous material and adds new chapters on such topics as the history of X-ray fluorescence spectroscopy, the design of X-ray spectrometers, state-of-the-art applications, and X-ray spectra. Ron Jenkins draws on his extensive experience in training and consulting industry professionals for this clear and concise treatment, covering first the basic aspects of X rays, then the methodology of X-ray fluorescence spectroscopy and available instrumentation. He offers a comparison between wavelength and energy dispersive spectrometers as well as step-by-step guidelines to X-ray spectrometric techniques for qualitative and quantitative analysis-from specimen preparation to real-world industrial application. Favored by the American Chemical Society and the International Centre for Diffraction Data, X-Ray Fluorescence Spectrometry, Second Edition is an ideal introduction for newcomers to the field and an invaluable reference for experienced spectroscopists-in chemical analysis, geology, metallurgy, and materials science. An up-to-date review of X-ray spectroscopic techniques. This proven guidebook for industry professionals is thoroughly updated and expanded to reflect advances in X-ray analysis over the last decade. X-Ray Fluorescence Spectrometry, Second Edition includes: The history of X-ray fluorescence spectrometry-new to this edition. A critical review of the most useful X-ray spectrometers. Techniques and procedures for quantitative and qualitative analysis. Modern applications and industrial trends. X-ray spectra-new to this edition.
Author: Ron Jenkins Publisher: Wiley-Interscience ISBN: 9780471836759 Category : Science Languages : en Pages : 192
Book Description
X-Ray Fluorescence Spectrometry, Ron Jenkins Written by the principal scientist for JCPDS, the International Centre for Diffraction Data, Swarthmore, Pennsylvania, this book focuses on the scientific and technological developments achieved in the field during the past decade. It offers comprehensive coverage of all crucial topics, including: the properties and uses of X-ray emission spectrometry in material analysis; its industrial applications; X-ray diffraction; instrumentation for X-ray fluorescence spectrometry; a comparison of wavelength and energy dispersive spectrometers; and use of X-ray spectrometry for qualitative analysis.
Author: Richard A. Crocombe Publisher: John Wiley & Sons ISBN: 1119636434 Category : Science Languages : en Pages : 608
Book Description
The most comprehensive resource available on the many applications of portable spectrometers, including material not found in any other published work Portable Spectroscopy and Spectrometry: Volume Two is an authoritative and up-to-date compendium of the diverse applications for portable spectrometers across numerous disciplines. Whereas Volume One focuses on the specific technologies of the portable spectrometers themselves, Volume Two explores the use of portable instruments in wide range of fields, including pharmaceutical development, clinical research, food analysis, forensic science, geology, astrobiology, cultural heritage and archaeology. Volume Two features contributions by a multidisciplinary team of experts with hands-on experience using portable instruments in their respective areas of expertise. Organized both by instrumentation type and by scientific or technical discipline, 21 detailed chapters cover various applications of portable ion mobility spectrometry (IMS), infrared and near-infrared (NIR) spectroscopy, Raman and x-ray fluorescence (XRF) spectroscopy, smartphone spectroscopy, and many others. Filling a significant gap in literature on the subject, the second volume of Portable Spectroscopy and Spectrometry: Features a significant amount of content published for the first time, or not available in existing literature Brings together work by authors with assorted backgrounds and fields of study Discusses the central role of applications in portable instrument development Covers the algorithms, calibrations, and libraries that are of critical importance to successful applications of portable instruments Includes chapters on portable spectroscopy applications in areas such as the military, agriculture and feed, hazardous materials (HazMat), art conservation, and environmental science Portable Spectroscopy and Spectrometry: Volume Two is an indispensable resource for developers of portable instruments in universities, research institutes, instrument companies, civilian and government purchasers, trainers, operators of portable instruments, and educators and students in portable spectroscopy courses.
Author: Burkhard Beckhoff Publisher: Springer Science & Business Media ISBN: 3540367225 Category : Science Languages : en Pages : 897
Book Description
X-Ray fluorescence analysis is an established technique for non-destructive elemental materials analysis. This book gives a user-oriented practical guidance to the application of this method. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. This book is the bible of X-Ray fluorescence analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. It appeals to researchers, analytically active engineers and advanced students.
Author: John C. Russ
Author: John C. Russ
Author: Bohdan Dziunikowski
Author: Alice M. W. Hunt
Author: Eva Margui
Author: M. Steven Shackley
Author: Kenneth P. Severin
Author: Ron Jenkins
Author: Ron Jenkins
Author: Richard A. Crocombe
Author: Burkhard Beckhoff