Author: Yi-Kan Cheng
Publisher: Springer Science & Business Media
ISBN: 0306470241
Category : Technology & Engineering
Languages : en
Pages : 220
Book Description
This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.