Electromagnetic Scattering and Material Characterization PDF Download

Author: Abbas Omar
Publisher: Artech House
ISBN: 1596932171
Category : Science
Languages : en
Pages : 314

View

Book Description
Based on the authorOCOs more-than 30 years of experience, this first-of-its-kind volume presents a comprehensive and systematic analysis of electromagnetic fields and their scattering by material objects. The book considers all three categories of scattering environments commonly used for material measurements OCo unbounded regions, waveguides, and cavity resonators. The book covers such essential topics as electromagnetic field propagation, radiation, and scattering, containing mathematically rigorous approaches for the computation of electromagnetic fields and the explanation of their behavior. Moreover, the book explore new measurement techniques for material characterization most of which have never been published before. This detailed reference is packed with over 400 equations.

Author: John W. Schultz
Publisher: Artech House
ISBN: 1630819476
Category : Technology & Engineering
Languages : en
Pages : 331

View

Book Description
This book is a practical engineering guide to microwave material measurements for both laboratory and manufacturing/field environments, including nondestructive inspection (NDI) and nondestructive evaluation (NDE). The book covers proven methods for characterizing materials at microwave frequencies, including both resonant and wide-bandwidth techniques, and gives you the necessary theory and equations for implementing these methods. You’ll understand how to invert dielectric and/or magnetic material properties from free space transmission and reflection, and how to measure traveling wave attenuation. You’ll also know how to measure dielectric and/or magnetic material properties from transmission line fixtures, and learn how to use computational electromagnetic modeling with a measurement fixture. The book shows you how to build and use microwave NDE equipment for radomes and/or structural dielectric materials. This is an excellent resource for Engineers/scientists conducting or analyzing RF/Microwave/MMW material measurements for applications in electromagnetic materials, as well as those who are developing or applying microwave non-destructive evaluation (NDE) methods to their manufacturing problems.

Author: Tribikram Kundu
Publisher: CRC Press
ISBN: 1466570474
Category : Science
Languages : en
Pages : 890

View

Book Description
Most books on nondestructive evaluation (NDE) focus either on the theoretical background or on advanced applications. Bridging the gap between the two, Ultrasonic and Electromagnetic NDE for Structure and Material Characterization: Engineering and Biomedical Applications brings together the principles, equations, and applications of ultrasonic and

Author: Sandra Costanzo
Publisher: BoD – Books on Demand
ISBN: 9535108484
Category : Technology & Engineering
Languages : en
Pages : 174

View

Book Description
Microwave Materials Characterization is an edited book discussing recent researches on basic and innovative measurement techniques for the characterization of materials at microwave frequencies, in terms of quantitative determination of their electromagnetic parameters, namely the complex permittivity and permeability. It is divided into two parts: Part 1, including original contributions on advanced techniques for the characterization of dielectric materials, and Part 2, devoted to the microwave characterization of biological tissues.

Author: Victorino Franco
Publisher: Springer Nature
ISBN: 3030704432
Category : Technology & Engineering
Languages : en
Pages : 814

View

Book Description
This book discusses the most commonly used techniques for characterizing magnetic material properties and their applications. It provides a comprehensive and easily digestible collection and review of magnetic measurement techniques. It also examines the underlying operating principles and techniques of magnetic measurements, and presents current examples where such measurements and properties are relevant. Given the pervasive nature of magnetic materials in everyday life, this book is a vital resource for both professionals and students wishing to deepen their understanding of the subject.

Author: Kannan M. Krishnan
Publisher: Oxford University Press
ISBN: 0198830254
Category : Science
Languages : en
Pages : 869

View

Book Description
Characterization enables a microscopic understanding of the fundamental properties of materials (Science) to predict their macroscopic behaviour (Engineering). With this focus, Principles of Materials Characterization and Metrology presents a comprehensive discussion of the principles of materials characterization and metrology. Characterization techniques are introduced through elementary concepts of bonding, electronic structure of molecules and solids, and the arrangement of atoms in crystals. Then, the range of electrons, photons, ions, neutrons and scanning probes, used in characterization, including their generation and related beam-solid interactions that determine or limit their use, is presented. This is followed by ion-scattering methods, optics, optical diffraction, microscopy, and ellipsometry. Generalization of Fraunhofer diffraction to scattering by a three-dimensional arrangement of atoms in crystals leads to X-ray, electron, and neutron diffraction methods, both from surfaces and the bulk. Discussion of transmission and analytical electron microscopy, including recent developments, is followed by chapters on scanning electron microscopy and scanning probe microscopies. The book concludes with elaborate tables to provide a convenient and easily accessible way of summarizing the key points, features, and inter-relatedness of the different spectroscopy, diffraction, and imaging techniques presented throughout. Principles of Materials Characterization and Metrology uniquely combines a discussion of the physical principles and practical application of these characterization techniques to explain and illustrate the fundamental properties of a wide range of materials in a tool-based approach. Based on forty years of teaching and research, this book incorporates worked examples, to test the reader's knowledge with extensive questions and exercises.

Author: Dean James Friesen
Publisher: Artech House
ISBN: 1685690068
Category : Science
Languages : en
Pages : 249

View

Book Description
Electromagnetism for Engineers, VOL. I: Electrostatics is a comprehensive introduction to the fundamental principles of electromagnetism, making it an indispensable source for a wide range of readers. This volume covers the essential concepts of electrostatics, including Coulomb's law, electric fields, Gauss's law, and vector mathematics, which forms a foundational tool throughout the book. What sets this book apart are the numerous illustrations and diagrams that visually elucidate complex topics, ensuring a clear and thorough understanding. To reinforce learning, the text includes problem and solution sets, giving readers an opportunity to apply the concepts they have acquired. This book is particularly valuable for college graduates and engineering students who are beginning their journey into the realm of electromagnetism. It is also an excellent reference for practicing engineers seeking to refresh their knowledge of the basic principles of electromagnetism. With a focus on both theory and practical application, this volume provides a strong foundation for readers at various stages of their engineering education and career.

Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 1060

View

Book Description

Author: Xudong Chen
Publisher: John Wiley & Sons
ISBN: 1119311985
Category : Science
Languages : en
Pages : 325

View

Book Description
A comprehensive and updated overview of the theory, algorithms and applications of for electromagnetic inverse scattering problems Offers the recent and most important advances in inverse scattering grounded in fundamental theory, algorithms and practical engineering applications Covers the latest, most relevant inverse scattering techniques like signal subspace methods, time reversal, linear sampling, qualitative methods, compressive sensing, and noniterative methods Emphasizes theory, mathematical derivation and physical insights of various inverse scattering problems Written by a leading expert in the field

Author: Yang Leng
Publisher: John Wiley & Sons
ISBN: 3527334637
Category : Technology & Engineering
Languages : en
Pages : 405

View

Book Description
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.