Author: Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 514
Book Description
EE, Evaluation Engineering
Author: Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 514
Book Description
Evaluation Engineering
Author: Publisher:
ISBN:
Category : Electronic apparatus and appliances
Languages : en
Pages : 786
Book Description
NBS Technical Note
Author: Transactions of the American Institute of Electrical Engineers
Author: Publisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 704
Book Description
Wire-bond Electrical Connections
Author: Harry A. SchafftPublisher:
ISBN:
Category : Sealing (Technology)
Languages : en
Pages : 64
Book Description
Advances in Electronic Testing
Author: Dimitris GizopoulosPublisher: Springer Science & Business Media
ISBN: 0387294090
Category : Technology & Engineering
Languages : en
Pages : 431
Book Description
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
On-Line Testing for VLSI
Author: Michael NicolaidisPublisher: Springer Science & Business Media
ISBN: 1475760698
Category : Technology & Engineering
Languages : en
Pages : 152
Book Description
Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
AMST'05 Advanced Manufacturing Systems and Technology
Author: Elso KuljanicPublisher: Springer Science & Business Media
ISBN: 3211380531
Category : Technology & Engineering
Languages : en
Pages : 791
Book Description
Manufacturing a product is not difficult, the difficulty consists in manufacturing a product of high quality, at a low cost and rapidly. Drastic technological advances are changing global markets very rapidly. In such conditions the ability to compete successfully must be based on innovative ideas and new products which has to be of high quality yet low in price. One way to achieve these objecti ves would be through massive investments in research of computer based technology and by applying the approaches presented in this book. The First International Conference on Advanced Manufacturing Systems and Technology AMST87 was held in Opatija (Croatia) in October 1987. The Second International Conference on Advanced Manufacturing Systems and Technology AMSV90 was held in Trento (Italy) in lune 1990. The Third, Fourth, Fifth and Sixth Conferences on Advanced Manufacturing Systems and Technology were all held in Udine (Italy) as follows: AMST93 in April 1993, AMST96 in September 1996, AMST99 in June 1999 and AMST02 in June 2002.
Journal of the American Institute of Electrical Engineers
Author: American Institute of Electrical EngineersPublisher:
ISBN:
Category : Electrical engineering
Languages : en
Pages : 1010
Book Description
Includes preprints of: Transactions of the American Institute of Electrical Engineers, ISSN 0096-3860.
Handbook of Semiconductor Interconnection Technology
Author: Geraldine Cogin ShwartzPublisher: CRC Press
ISBN: 9780849384660
Category : Technology & Engineering
Languages : en
Pages : 598
Book Description
Covering materials, processes, equipment, methodologies, characterization techniques, clean room practices, and ways to control contamination-related defects, this work offers up-to-date information on the application of interconnection technology to semiconductors. It offers an integration of technical, patent and industry literature.