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Doping Engineering for Device Fabrication: Volume 912

Doping Engineering for Device Fabrication: Volume 912 PDF Author: B. J. Pawlak
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 240

Book Description
This volume from the 2006 MRS Spring Meeting focuses on fundamental materials science and device research for current transistor technologies. Materials scientists come together with silicon technologists and TCAD researchers and activation technologies for integrated circuits, to discuss current achievements research directions.

Doping Engineering for Device Fabrication: Volume 912

Doping Engineering for Device Fabrication: Volume 912 PDF Author: B. J. Pawlak
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 240

Book Description
This volume from the 2006 MRS Spring Meeting focuses on fundamental materials science and device research for current transistor technologies. Materials scientists come together with silicon technologists and TCAD researchers and activation technologies for integrated circuits, to discuss current achievements research directions.

Materials in Extreme Environments: Volume 929

Materials in Extreme Environments: Volume 929 PDF Author: Daryush Ila
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 242

Book Description
This book investigates the fundamental properties and response of materials in extreme environments such as static and dynamic high pressure, high strain and high strain-rates, high radiation and electromagnetic fields, high and low temperatures, corrosive conditions, environments causing embrittlement, and environments containing atomic oxygen. This is an extremely active and vibrant field of research, in particular because it is now possible to create laboratory conditions similar in pressure, temperature and radiation to those found in planetary interiors and in space. In addition, advanced simulation methods, coupled with high-performance computing platforms, now afford predictions - on a first-principles basis - of the properties of materials in extreme environments. Scientists from a broad spectrum of fields are represented, including space science, planetary science, high-pressure research, shock physics, ultrafast science, and energetic materials research.

Silicon Carbide 2006--materials, Processing and Devices

Silicon Carbide 2006--materials, Processing and Devices PDF Author: Michael Dudley
Publisher:
ISBN: 9781558998674
Category : Science
Languages : en
Pages : 496

Book Description


Transistor Scaling: Volume 913

Transistor Scaling: Volume 913 PDF Author: Scott Thompson
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 234

Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book shares results and physical models related to MOSFETs and to discuss innovative approaches necessary to continue the transistor scaling. Expanded versions of presentations in the areas of technology development are featured

Doping Engineering for Front-End Processing: Volume 1070

Doping Engineering for Front-End Processing: Volume 1070 PDF Author: Materials Research Society. Meeting Symposium E.
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 344

Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

Solid-state Lighting Materials and Devices

Solid-state Lighting Materials and Devices PDF Author: F. Shahedipour-Sandvik
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 152

Book Description


Semiconductor Material and Device Characterization

Semiconductor Material and Device Characterization PDF Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800

Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Materials, Technology and Reliability of Low-k Dielectrics and Copper Interconnects

Materials, Technology and Reliability of Low-k Dielectrics and Copper Interconnects PDF Author: Ting Y. Tsui
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 498

Book Description


Smart Nanotextiles

Smart Nanotextiles PDF Author: Xiaoming Tao
Publisher:
ISBN:
Category : Design
Languages : en
Pages : 176

Book Description


Chalcogenide Alloys for Reconfigurable Electronics: Volume 918

Chalcogenide Alloys for Reconfigurable Electronics: Volume 918 PDF Author: P. Craig Taylor
Publisher:
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 218

Book Description
The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.