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Author: Yoshio Waseda Publisher: Springer Science & Business Media ISBN: 3642166350 Category : Technology & Engineering Languages : en Pages : 320
Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author: Yoshio Waseda Publisher: Springer Science & Business Media ISBN: 3642166350 Category : Technology & Engineering Languages : en Pages : 320
Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author: B. E. Warren Publisher: Courier Corporation ISBN: 0486141616 Category : Science Languages : en Pages : 402
Book Description
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
Author: Shih-Lin Chang Publisher: Springer Science & Business Media ISBN: 9783540211969 Category : Science Languages : en Pages : 458
Book Description
This comprehensive text describes the fundamentals of X-ray multiple-wave interaction in crystals and its applications in condensed matter physics and crystallography. It covers current theoretical approaches and application methods for many materials, including macromolecular crystals, thin films, semiconductors, quasicrystals and nonlinear optical materials. X-ray optics is also addressed. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in X-ray diffraction.
Author: Tijmen Jan Moser Publisher: SEG Books ISBN: 1560803177 Category : Science Languages : en Pages : 823
Book Description
The use of diffraction imaging to complement the seismic reflection method is rapidly gaining momentum in the oil and gas industry. As the industry moves toward exploiting smaller and more complex conventional reservoirs and extensive new unconventional resource plays, the application of the seismic diffraction method to image sub-wavelength features such as small-scale faults, fractures and stratigraphic pinchouts is expected to increase dramatically over the next few years. “Seismic Diffraction” covers seismic diffraction theory, modeling, observation, and imaging. Papers and discussion include an overview of seismic diffractions, including classic papers which introduced the potential of diffraction phenomena in seismic processing; papers on the forward modeling of seismic diffractions, with an emphasis on the theoretical principles; papers which describe techniques for diffraction mathematical modeling as well as laboratory experiments for the physical modeling of diffractions; key papers dealing with the observation of seismic diffractions, in near-surface-, reservoir-, as well as crustal studies; and key papers on diffraction imaging.
Author: A. Guinier Publisher: Courier Corporation ISBN: 0486141349 Category : Science Languages : en Pages : 404
Book Description
Exploration of fundamentals of x-ray diffraction theory using Fourier transforms applies general results to various atomic structures, amorphous bodies, crystals, and imperfect crystals. 154 illustrations. 1963 edition.
Author: Joseph W. Goodman Publisher: Roberts and Company Publishers ISBN: 9780974707723 Category : Science Languages : en Pages : 520
Book Description
This textbook deals with fourier analysis applications in optics, and in particular with its applications to diffraction, imaging, optical data processing, holography and optical communications. Fourier analysis is a universal tool that has found application within a wide range of areas in physics and engineering and this third edition has been written to help your students understand the complexity of a subject that can be challenging to grasp at times. Chapters cover foundations of scalar diffraction theory, Fresnel and Fraunhofer diffraction moving onto Wave-Optics Analysis of Coherent Optical Systems and Wavefront Modulation. Joseph Goodman’s work in Electrical Engineering has been recognised by a variety of awards and honours, so his text is able to guide students through a comprehensive introduction into Fourier Optics.
Author: Pyotr Ya. Ufimtsev Publisher: John Wiley & Sons ISBN: 1118848691 Category : Science Languages : en Pages : 496
Book Description
The book is a complete, comprehensive description of the modern Physical Theory of Diffraction (PTD) based upon the concept of elementary edge waves. The theory is demonstrated with examples of the diffraction of acoustic and electromagnetic waves at perfectly reflecting objects. Readers develop the skills to apply PTD to solve various scattering problems. The derived analytic expressions clearly illustrate the physical structure of the scattered field. They additionally describe all of the reflected and diffracted rays and beams, as well as the fields in the vicinity of caustics and foci. Shadow radiation, a fundamental component of PTD, is introduced and proven to contain half the total scattered power. The equivalence relationships between acoustic and electromagnetic diffracted waves are established and emphasized. Throughout the book, the author enables readers to master both the theory and its practical applications. Plotted numeric results supplement the theory and facilitate the visualization of individual contributions of distinct parts of the scattering objects to the total diffracted field Detailed comments help readers understand and implement all the critical steps of the analytic and numeric calculations Problem sets in each chapter give readers an opportunity to analyse and investigate the diffraction phenomena
Author: Igor T. Selezov Publisher: Springer ISBN: 9811049238 Category : Science Languages : en Pages : 251
Book Description
This book presents two distinct aspects of wave dynamics – wave propagation and diffraction – with a focus on wave diffraction. The authors apply different mathematical methods to the solution of typical problems in the theory of wave propagation and diffraction and analyze the obtained results. The rigorous diffraction theory distinguishes three approaches: the method of surface currents, where the diffracted field is represented as a superposition of secondary spherical waves emitted by each element (the Huygens–Fresnel principle); the Fourier method; and the separation of variables and Wiener–Hopf transformation method. Chapter 1 presents mathematical methods related to studying the problems of wave diffraction theory, while Chapter 2 deals with spectral methods in the theory of wave propagation, focusing mainly on the Fourier methods to study the Stokes (gravity) waves on the surface of inviscid fluid. Chapter 3 then presents some results of modeling the refraction of surf ace gravity waves on the basis of the ray method, which originates from geometrical optics. Chapter 4 is devoted to the diffraction of surface gravity waves and the final two chapters discuss the diffraction of waves by semi-infinite domains on the basis of method of images and present some results on the problem of propagation of tsunami waves. Lastly, it provides insights into directions for further developing the wave diffraction theory.
Author: Myeongkyu Lee Publisher: CRC Press ISBN: 1315361973 Category : Science Languages : en Pages : 302
Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Yoshio Waseda
Author: Yoshio Waseda
Author: John Maxwell Cowley
Author: B. E. Warren
Author: Shih-Lin Chang
Author: Tijmen Jan Moser
Author: A. Guinier
Author: Joseph W. Goodman
Author: Pyotr Ya. Ufimtsev
Author: Igor T. Selezov
Author: Myeongkyu Lee