Author: International Union of Pure and Applied Chemistry. Physical and Biophysical Chemistry Division
Publisher: Royal Society of Chemistry
ISBN: 0854044337
Category : Reference
Languages : en
Pages : 240
Book Description
Prepared by the IUPAC Physical Chemistry Division this definitive manual, now in its third edition, is designed to improve the exchange of scientific information among the readers in different disciplines and across different nations. This book has been systematically brought up to date and new sections added to reflect the increasing volume of scientific literature and terminology and expressions being used. The Third Edition reflects the experience of the contributors with the previous editions and the comments and feedback have been integrated into this essential resource. This edition has been compiled in machine-readable form and will be available online.
Quantities, Units and Symbols in Physical Chemistry
Author: International Union of Pure and Applied Chemistry. Physical and Biophysical Chemistry Division
Publisher: Royal Society of Chemistry
ISBN: 0854044337
Category : Reference
Languages : en
Pages : 240
Book Description
Prepared by the IUPAC Physical Chemistry Division this definitive manual, now in its third edition, is designed to improve the exchange of scientific information among the readers in different disciplines and across different nations. This book has been systematically brought up to date and new sections added to reflect the increasing volume of scientific literature and terminology and expressions being used. The Third Edition reflects the experience of the contributors with the previous editions and the comments and feedback have been integrated into this essential resource. This edition has been compiled in machine-readable form and will be available online.
Publisher: Royal Society of Chemistry
ISBN: 0854044337
Category : Reference
Languages : en
Pages : 240
Book Description
Prepared by the IUPAC Physical Chemistry Division this definitive manual, now in its third edition, is designed to improve the exchange of scientific information among the readers in different disciplines and across different nations. This book has been systematically brought up to date and new sections added to reflect the increasing volume of scientific literature and terminology and expressions being used. The Third Edition reflects the experience of the contributors with the previous editions and the comments and feedback have been integrated into this essential resource. This edition has been compiled in machine-readable form and will be available online.
CMOS
Author: R. Jacob Baker
Publisher: John Wiley & Sons
ISBN: 0470229411
Category : Technology & Engineering
Languages : en
Pages : 1074
Book Description
This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.
Publisher: John Wiley & Sons
ISBN: 0470229411
Category : Technology & Engineering
Languages : en
Pages : 1074
Book Description
This edition provides an important contemporary view of a wide range of analog/digital circuit blocks, the BSIM model, data converter architectures, and more. The authors develop design techniques for both long- and short-channel CMOS technologies and then compare the two.
Applied Engineering Principles Manual - Training Manual (NAVSEA)
Author: Naval Sea Systems Command
Publisher:
ISBN: 9780359793839
Category :
Languages : en
Pages : 454
Book Description
Chapter 1 ELECTRICAL REVIEW 1.1 Fundamentals Of Electricity 1.2 Alternating Current Theory 1.3 Three-Phase Systems And Transformers 1.4 Generators 1.5 Motors 1.6 Motor Controllers 1.7 Electrical Safety 1.8 Storage Batteries 1.9 Electrical Measuring Instruments Chapter 2 ELECTRONICS REVIEW 2.1 Solid State Devices 2.2 Magnetic Amplifiers 2.3 Thermocouples 2.4 Resistance Thermometry 2.5 Nuclear Radiation Detectors 2.6 Nuclear Instrumentation Circuits 2.7 Differential Transformers 2.8 D-C Power Supplies 2.9 Digital Integrated Circuit Devices 2.10 Microprocessor-Based Computer Systems Chapter 3 REACTOR THEORY REVIEW 3.1 Basics 3.2 Stability Of The Nucleus 3.3 Reactions 3.4 Fission 3.5 Nuclear Reaction Cross Sections 3.6 Neutron Slowing Down 3.7 Thermal Equilibrium 3.8 Neutron Density, Flux, Reaction Rates, And Power 3.9 Slowing Down, Diffusion, And Migration Lengths 3.10 Neutron Life Cycle And The Six-Factor Formula 3.11 Buckling, Leakage, And Flux Shapes 3.12 Multiplication Factor 3.13 Temperature Coefficient...
Publisher:
ISBN: 9780359793839
Category :
Languages : en
Pages : 454
Book Description
Chapter 1 ELECTRICAL REVIEW 1.1 Fundamentals Of Electricity 1.2 Alternating Current Theory 1.3 Three-Phase Systems And Transformers 1.4 Generators 1.5 Motors 1.6 Motor Controllers 1.7 Electrical Safety 1.8 Storage Batteries 1.9 Electrical Measuring Instruments Chapter 2 ELECTRONICS REVIEW 2.1 Solid State Devices 2.2 Magnetic Amplifiers 2.3 Thermocouples 2.4 Resistance Thermometry 2.5 Nuclear Radiation Detectors 2.6 Nuclear Instrumentation Circuits 2.7 Differential Transformers 2.8 D-C Power Supplies 2.9 Digital Integrated Circuit Devices 2.10 Microprocessor-Based Computer Systems Chapter 3 REACTOR THEORY REVIEW 3.1 Basics 3.2 Stability Of The Nucleus 3.3 Reactions 3.4 Fission 3.5 Nuclear Reaction Cross Sections 3.6 Neutron Slowing Down 3.7 Thermal Equilibrium 3.8 Neutron Density, Flux, Reaction Rates, And Power 3.9 Slowing Down, Diffusion, And Migration Lengths 3.10 Neutron Life Cycle And The Six-Factor Formula 3.11 Buckling, Leakage, And Flux Shapes 3.12 Multiplication Factor 3.13 Temperature Coefficient...
The Glossary of Prosthodontic Terms
Solving General Chemistry Problems
Author: Robert Nelson Smith
Publisher: W H Freeman & Company
ISBN: 9780716711179
Category : Chemistry
Languages : en
Pages : 474
Book Description
Publisher: W H Freeman & Company
ISBN: 9780716711179
Category : Chemistry
Languages : en
Pages : 474
Book Description
Radiological Safety Aspects of the Operation of Electron Linear Accelerators
Author: William P. Swanson
Publisher: Bernan Press(PA)
ISBN:
Category : Business & Economics
Languages : en
Pages : 350
Book Description
Electron linear accelerators are being used throughout the world in increasing numbers in a variety of important applications. Foremost among these is their role in the treatment of cancer. Commercial uses include non-destructive testing by radiography, food preservation, product sterilization and radiation processing of materials such as plastics and adhesives. Scientific applications include investigations in radiation biology, radiation chemistry, nuclear and elementary particle physics and radiation research. This manual provides authoritative guidance in radiation protection for this important category of radiation sources.
Publisher: Bernan Press(PA)
ISBN:
Category : Business & Economics
Languages : en
Pages : 350
Book Description
Electron linear accelerators are being used throughout the world in increasing numbers in a variety of important applications. Foremost among these is their role in the treatment of cancer. Commercial uses include non-destructive testing by radiography, food preservation, product sterilization and radiation processing of materials such as plastics and adhesives. Scientific applications include investigations in radiation biology, radiation chemistry, nuclear and elementary particle physics and radiation research. This manual provides authoritative guidance in radiation protection for this important category of radiation sources.
Physics of Surfaces and Interfaces
Author: Harald Ibach
Publisher: Springer Science & Business Media
ISBN: 3540347100
Category : Science
Languages : en
Pages : 653
Book Description
This graduate-level textbook covers the major developments in surface sciences of recent decades, from experimental tricks and basic techniques to the latest experimental methods and theoretical understanding. It is unique in its attempt to treat the physics of surfaces, thin films and interfaces, surface chemistry, thermodynamics, statistical physics and the physics of the solid/electrolyte interface in an integral manner, rather than in separate compartments. It is designed as a handbook for the researcher as well as a study-text for graduate students. Written explanations are supported by 350 graphs and illustrations.
Publisher: Springer Science & Business Media
ISBN: 3540347100
Category : Science
Languages : en
Pages : 653
Book Description
This graduate-level textbook covers the major developments in surface sciences of recent decades, from experimental tricks and basic techniques to the latest experimental methods and theoretical understanding. It is unique in its attempt to treat the physics of surfaces, thin films and interfaces, surface chemistry, thermodynamics, statistical physics and the physics of the solid/electrolyte interface in an integral manner, rather than in separate compartments. It is designed as a handbook for the researcher as well as a study-text for graduate students. Written explanations are supported by 350 graphs and illustrations.
Lunar Sourcebook
Author: Grant Heiken
Publisher: CUP Archive
ISBN: 9780521334440
Category : Science
Languages : en
Pages : 796
Book Description
The only work to date to collect data gathered during the American and Soviet missions in an accessible and complete reference of current scientific and technical information about the Moon.
Publisher: CUP Archive
ISBN: 9780521334440
Category : Science
Languages : en
Pages : 796
Book Description
The only work to date to collect data gathered during the American and Soviet missions in an accessible and complete reference of current scientific and technical information about the Moon.
Condensed Matter Field Theory
Author: Alexander Altland
Publisher: Cambridge University Press
ISBN: 0521769752
Category : Science
Languages : en
Pages : 785
Book Description
This primer is aimed at elevating graduate students of condensed matter theory to a level where they can engage in independent research. Topics covered include second quantisation, path and functional field integration, mean-field theory and collective phenomena.
Publisher: Cambridge University Press
ISBN: 0521769752
Category : Science
Languages : en
Pages : 785
Book Description
This primer is aimed at elevating graduate students of condensed matter theory to a level where they can engage in independent research. Topics covered include second quantisation, path and functional field integration, mean-field theory and collective phenomena.
Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.