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Author: David Adler Publisher: Springer Science & Business Media ISBN: 1489922601 Category : Science Languages : en Pages : 448
Book Description
The Institute for Amorphous Studies was founded in 1982 as the international center for the investigation of amorphous mate rials. It has since played an important role in promoting the und er standing of disordered matter in general. An Institute lecture series on "Fundamentals of Amorphous Materials and Devices" was held during 1982-83 with distinguished speakers from universities and industry. These events were free and open to the public ,and were attended by many representatives of the scientific community. The lectures themselves were highly successful inasmuch as they provided not only formal instruction but also an opportunity for vigorous and stimulating debate. That last element could not be captured within the pages of a book I but the lectures concentrated on the latest advances in the field I which is why their essential contents are he re reproduced in collective form. Together they constitute an interdisciplinary status report of the field. The speakers brought many different viewpoints and a variety of back ground experiences io bear on the problems involved I but though language and conventions vary I the essential unity of the concerns is very clear I as indeed are the ultimate benefits of the many-sided approach.
Author: David Adler Publisher: Springer Science & Business Media ISBN: 1489922601 Category : Science Languages : en Pages : 448
Book Description
The Institute for Amorphous Studies was founded in 1982 as the international center for the investigation of amorphous mate rials. It has since played an important role in promoting the und er standing of disordered matter in general. An Institute lecture series on "Fundamentals of Amorphous Materials and Devices" was held during 1982-83 with distinguished speakers from universities and industry. These events were free and open to the public ,and were attended by many representatives of the scientific community. The lectures themselves were highly successful inasmuch as they provided not only formal instruction but also an opportunity for vigorous and stimulating debate. That last element could not be captured within the pages of a book I but the lectures concentrated on the latest advances in the field I which is why their essential contents are he re reproduced in collective form. Together they constitute an interdisciplinary status report of the field. The speakers brought many different viewpoints and a variety of back ground experiences io bear on the problems involved I but though language and conventions vary I the essential unity of the concerns is very clear I as indeed are the ultimate benefits of the many-sided approach.
Book Description
Cet ouvrage est destiné à tous les étudiants qui suivent des formations scientifiques ou techniques en relation avec l'étude des matériaux, aux chercheurs, aux ingénieurs et techniciens de laboratoires. Il traite de l'utilisation de la microscopie électronique à balayage sous environnement gazeux (MEB-EG). Cette technique est très répandue aussi bien dans le monde académique qu'industriel. Avec les avancées dans le domaine des matériaux, il devient crucial de pouvoir étudier les matériaux dans des conditions réelles d'utilisation. Le MEB-EG est une technique de choix pour étudier tout type de matériaux et nanomatériaux quel que soit son état : sec, humide, isolant, conducteur... Cet ouvrage s'articule autour de trois parties. Une première partie concerne le fonctionnement du MEB conventionnel (MEB-C) et ses limites. La seconde partie détaille le fonctionnement du MEB-EG en relation avec la présence du gaz et ses effets. Le contenu de la troisième partie permet à l'expérimentateur de choisir les meilleures conditions pour l'imagerie et pour la microanalyse X dans le MEB-EG. Cet ouvrage est une référence pour les utilisateurs des MEB environnementaux (ESEM) et à pression variable ou contrôlée (VP-SEM, CP-SEM).
Author: François Brisset Publisher: EDP Sciences ISBN: 2759803481 Category : Science Languages : fr Pages : 930
Book Description
Aussi bien essentielle dans les milieux académiques qu'industriels, la microscopie électronique à balayage et les microanalyses associéessont au coeur de la recherche scientifique et industrielle. L'ensemble des bases théoriques, les principales caractéristiques techniques, ainsi que des compléments pratiques d'utilisation et d'entretien liés à ces disciplines sont développés dans cet ouvrage. Les microscopes électroniques sous haut vide ou vide contrôlé sont exposées profondément, les microanalyses EDS et WDS de dernières générations également. À coté de ces piliers structurants, d'autres techniques d'analyse ou d'observation sont abordées, telles l'analyse EBSD et l'imagerie 3D, le FIB, les simulations de Monte-Carlo et les essais in-situ, etc. Ce volume en langue française est le seul traitant du sujet de façon aussi exhaustive ; il représente la version actualisée et totalement refondue d'une précédente édition de 1979 aujourd'hui épuisée ; il regroupe enfin les cours dispensés lors de l'école d'été de Saint Martin d'Hères en 2006, organisée par le Groupement National de Microscopie Électronique à Balayage et de microAnalyses (GN-MEBA). Ce livre est particulièrement recommandé aux expérimentateurs mais intéressera aussi les spécialistes en science des matériaux (durs ou mous, conducteurs ou non-conducteurs, stratifiés, etc.) désireux de s'investir dans toutes ces techniques d'imagerie et d'analyse, afin d'en exploiter pleinement les forts potentiels. Il a été écrit par les enseignants de l'école d'été, tous chercheurs ou ingénieurs et spécialistes dans leur domaine. Cet ouvrage s'inscrit dans une collection de publications du GN-MEBA consacrée aux principes, aux techniques expérimentales et aux méthodes de calcul et de simulation en Microscopie Électronique à Balayage et en microanalyses.
Author: Florian Banhart Publisher: World Scientific ISBN: 9812797343 Category : Science Languages : en Pages : 318
Book Description
In-situ high-resolution electron microscopy is a modern and powerful technique in materials research, physics, and chemistry. In-situ techniques are hardly treated in textbooks of electron microscopy. Thus, there is a need to collect the present knowledge about the techniques and achievements of in-situ electron microscopy in one book. Since high-resolution electron microscopes are available in most modern laboratories of materials science, more and more scientists or students are starting to work on this subject.In this comprehensive volume, the most important techniques and achievements of in-situ high-resolution electron microscopy will be reviewed by renowned experts. Applications in several fields of materials science will also be demonstrated.
Author: Klaus Wetzig Publisher: Wiley-VCH ISBN: Category : Science Languages : en Pages : 252
Book Description
The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.
Author: Kenichi Shimizu Publisher: Springer Science & Business Media ISBN: 3642031609 Category : Technology & Engineering Languages : en Pages : 172
Book Description
In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
Author: Xiao-Feng Zhang Publisher: Springer Science & Business Media ISBN: 9783540676805 Category : Medical Languages : en Pages : 400
Book Description
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Author: Thomas Willum Hansen Publisher: Springer ISBN: 3319229885 Category : Technology & Engineering Languages : en Pages : 334
Book Description
This book illustrates the practical workings of environmental transmission electron microscopy (ETEM) from history and instrument design through to solving practical problems. Aspects of instrument design, performance, and operating procedures are covered, together with common problems and pitfalls of the technique. Not only will a properly operated instrument and a carefully set up experiment provide new insight into your specimen, but the ability to observe the specimen in its natural habitat will be essential to meeting specific design criteria for the development of the next generation of materials. Over the past five decades, transmission electron microscopy (TEM) under environmental conditions relevant to a particular sample has been of increasing interest. Symposia dealing with the topic are now among the best attended at international microscopy conferences. Since typical operating modes for the ETEM require the sample be subjected to a harsh environment consisting of corrosive gases and high temperatures, the challenges of adapting and operating the instrument for observation under dynamic operating conditions are numerous. However, careful consideration of the interaction of the electrons with the gases and sample, as well as the gases with the microscope components, can lead to highly rewarding results. In Controlled Atmosphere Transmission Electron Microscopy, leading experts help you to perform successful experiments using the ETEM, and to interpret and understand the results.
Author: Renu Sharma Publisher: ISBN: Category : Science Languages : en Pages : 250
Book Description
Electron microscopy techniques are among the most powerful methods for characterization of materials, with the ability to reveal both the atomic-scale structure and composition. This information may be used to elucidate macroscopic properties or to optimize materials synthesis and processing. Instrumentation and techniques for dynamic in situ experiments are undergoing rapid development and have recently been applied to a wide range of problems. This book focuses on time-resolved electron microscopy (including diffraction and spectroscopy), as well as novel instrumentation for temperature and pressure control. In addition to discussing the application of electron microscopy techniques to the in situ study of the kinetics, thermodynamics and mechanisms of reaction, the book also explores their utility as efficient methods of optimizing processing conditions. Imaging techniques featured include: scanning tunneling microscopy, high-resolution electron microscopy, dark field transmission and reflection electron microscopy, Lorentz microscopy, electron holography, scanning and low-energy electron microscopy and photoemission electron microscopy
Author: David Adler
Author: David Adler
Author: Lahcen Khouchaf
Author: François Brisset
Author: Florian Banhart
Author: Klaus Wetzig
Author: Kenichi Shimizu
Author: Philip James Grundy
Author: Xiao-Feng Zhang
Author: Thomas Willum Hansen
Author: Renu Sharma