Author: Sabu Thomas
Publisher: Elsevier
ISBN: 012820883X
Category : Technology & Engineering
Languages : en
Pages : 610
Book Description
Design, Fabrication, and Characterization of Multifunctional Nanomaterials covers major techniques for the design, synthesis, and development of multifunctional nanomaterials. The chapters highlight the main characterization techniques, including X-ray diffraction, scanning electron microscopy, high-resolution transmission electron microscopy, energy dispersive X-ray spectroscopy, and scanning probe microscopy.The book explores major synthesis methods and functional studies, including: - Brillouin spectroscopy; - Temperature-dependent Raman spectroscopic studies; - Magnetic, ferroelectric, and magneto-electric coupling analysis; - Organ-on-a-chip methods for testing nanomaterials; - Magnetron sputtering techniques; - Pulsed laser deposition techniques; - Positron annihilation spectroscopy to prove defects in nanomaterials; - Electroanalytic techniques. This is an important reference source for materials science students, scientists, and engineers who are looking to increase their understanding of design and fabrication techniques for a range of multifunctional nanomaterials. - Explains the major design and fabrication techniques and processes for a range of multifunctional nanomaterials; - Demonstrates the design and development of magnetic, ferroelectric, multiferroic, and carbon nanomaterials for electronic applications, energy generation, and storage; - Green synthesis techniques and the development of nanofibers and thin films are also emphasized.
Design, Fabrication, and Characterization of Multifunctional Nanomaterials
Author: Sabu Thomas
Publisher: Elsevier
ISBN: 012820883X
Category : Technology & Engineering
Languages : en
Pages : 610
Book Description
Design, Fabrication, and Characterization of Multifunctional Nanomaterials covers major techniques for the design, synthesis, and development of multifunctional nanomaterials. The chapters highlight the main characterization techniques, including X-ray diffraction, scanning electron microscopy, high-resolution transmission electron microscopy, energy dispersive X-ray spectroscopy, and scanning probe microscopy.The book explores major synthesis methods and functional studies, including: - Brillouin spectroscopy; - Temperature-dependent Raman spectroscopic studies; - Magnetic, ferroelectric, and magneto-electric coupling analysis; - Organ-on-a-chip methods for testing nanomaterials; - Magnetron sputtering techniques; - Pulsed laser deposition techniques; - Positron annihilation spectroscopy to prove defects in nanomaterials; - Electroanalytic techniques. This is an important reference source for materials science students, scientists, and engineers who are looking to increase their understanding of design and fabrication techniques for a range of multifunctional nanomaterials. - Explains the major design and fabrication techniques and processes for a range of multifunctional nanomaterials; - Demonstrates the design and development of magnetic, ferroelectric, multiferroic, and carbon nanomaterials for electronic applications, energy generation, and storage; - Green synthesis techniques and the development of nanofibers and thin films are also emphasized.
Publisher: Elsevier
ISBN: 012820883X
Category : Technology & Engineering
Languages : en
Pages : 610
Book Description
Design, Fabrication, and Characterization of Multifunctional Nanomaterials covers major techniques for the design, synthesis, and development of multifunctional nanomaterials. The chapters highlight the main characterization techniques, including X-ray diffraction, scanning electron microscopy, high-resolution transmission electron microscopy, energy dispersive X-ray spectroscopy, and scanning probe microscopy.The book explores major synthesis methods and functional studies, including: - Brillouin spectroscopy; - Temperature-dependent Raman spectroscopic studies; - Magnetic, ferroelectric, and magneto-electric coupling analysis; - Organ-on-a-chip methods for testing nanomaterials; - Magnetron sputtering techniques; - Pulsed laser deposition techniques; - Positron annihilation spectroscopy to prove defects in nanomaterials; - Electroanalytic techniques. This is an important reference source for materials science students, scientists, and engineers who are looking to increase their understanding of design and fabrication techniques for a range of multifunctional nanomaterials. - Explains the major design and fabrication techniques and processes for a range of multifunctional nanomaterials; - Demonstrates the design and development of magnetic, ferroelectric, multiferroic, and carbon nanomaterials for electronic applications, energy generation, and storage; - Green synthesis techniques and the development of nanofibers and thin films are also emphasized.
The Summary of Engineering Research
Author: University of Illinois (Urbana-Champaign campus). Engineering Experiment Station
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 416
Book Description
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 416
Book Description
Low-Dimensional and Nanostructured Materials and Devices
Author: Hilmi Ünlü
Publisher: Springer
ISBN: 3319253409
Category : Science
Languages : en
Pages : 688
Book Description
This book focuses on the fundamental phenomena at nanoscale. It covers synthesis, properties, characterization and computer modelling of nanomaterials, nanotechnologies, bionanotechnology, involving nanodevices. Further topics are imaging, measuring, modeling and manipulating of low dimensional matter at nanoscale. The topics covered in the book are of vital importance in a wide range of modern and emerging technologies employed or to be employed in most industries, communication, healthcare, energy, conservation , biology, medical science, food, environment, and education, and consequently have great impact on our society.
Publisher: Springer
ISBN: 3319253409
Category : Science
Languages : en
Pages : 688
Book Description
This book focuses on the fundamental phenomena at nanoscale. It covers synthesis, properties, characterization and computer modelling of nanomaterials, nanotechnologies, bionanotechnology, involving nanodevices. Further topics are imaging, measuring, modeling and manipulating of low dimensional matter at nanoscale. The topics covered in the book are of vital importance in a wide range of modern and emerging technologies employed or to be employed in most industries, communication, healthcare, energy, conservation , biology, medical science, food, environment, and education, and consequently have great impact on our society.
Dissertation Abstracts International
Author:
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 906
Book Description
Publisher:
ISBN:
Category : Dissertations, Academic
Languages : en
Pages : 906
Book Description
Memoirs of the Institute of Scientific and Industrial Research, Osaka University
Author: Ōsaka Daigaku. Sangyō Kagaku Kenkyūjo
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 416
Book Description
Publisher:
ISBN:
Category : Research
Languages : en
Pages : 416
Book Description
Lasers
Author: Charles Blain
Publisher: Nova Publishers
ISBN: 9781590332252
Category : Technology & Engineering
Languages : en
Pages : 214
Book Description
Developments in lasers continue to enable progress in many areas such as eye surgery, the recording industry and dozens of others. This book presents citations from the book literature for the last 25 years and groups them for ease of access which is also provided by subject, author and titles indexes.
Publisher: Nova Publishers
ISBN: 9781590332252
Category : Technology & Engineering
Languages : en
Pages : 214
Book Description
Developments in lasers continue to enable progress in many areas such as eye surgery, the recording industry and dozens of others. This book presents citations from the book literature for the last 25 years and groups them for ease of access which is also provided by subject, author and titles indexes.
Research in Progress
Quantum Dot Devices
Author: Zhiming M. Wang
Publisher: Springer Science & Business Media
ISBN: 1461435706
Category : Science
Languages : en
Pages : 375
Book Description
Quantum dots as nanomaterials have been extensively investigated in the past several decades from growth to characterization to applications. As the basis of future developments in the field, this book collects a series of state-of-the-art chapters on the current status of quantum dot devices and how these devices take advantage of quantum features. Written by 56 leading experts from 14 countries, the chapters cover numerous quantum dot applications, including lasers, LEDs, detectors, amplifiers, switches, transistors, and solar cells. Quantum Dot Devices is appropriate for researchers of all levels of experience with an interest in epitaxial and/or colloidal quantum dots. It provides the beginner with the necessary overview of this exciting field and those more experienced with a comprehensive reference source.
Publisher: Springer Science & Business Media
ISBN: 1461435706
Category : Science
Languages : en
Pages : 375
Book Description
Quantum dots as nanomaterials have been extensively investigated in the past several decades from growth to characterization to applications. As the basis of future developments in the field, this book collects a series of state-of-the-art chapters on the current status of quantum dot devices and how these devices take advantage of quantum features. Written by 56 leading experts from 14 countries, the chapters cover numerous quantum dot applications, including lasers, LEDs, detectors, amplifiers, switches, transistors, and solar cells. Quantum Dot Devices is appropriate for researchers of all levels of experience with an interest in epitaxial and/or colloidal quantum dots. It provides the beginner with the necessary overview of this exciting field and those more experienced with a comprehensive reference source.
Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
American Doctoral Dissertations
Author:
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 776
Book Description
Publisher:
ISBN:
Category : Dissertation abstracts
Languages : en
Pages : 776
Book Description