Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download Accelerated Testing PDF full book. Access full book title Accelerated Testing by Wayne B. Nelson. Download full books in PDF and EPUB format.
Author: Wayne B. Nelson Publisher: John Wiley & Sons ISBN: 0470317477 Category : Mathematics Languages : en Pages : 626
Book Description
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." –Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." –Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.
Author: Wayne B. Nelson Publisher: John Wiley & Sons ISBN: 0470317477 Category : Mathematics Languages : en Pages : 626
Book Description
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." –Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." –Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.
Author: Rong Pan Publisher: ISBN: 9781498753517 Category : Electronic books Languages : en Pages :
Book Description
"Accelerated life tests (ALTs) have become an indispensable tool for reliability engineers to quantify a product’s reliability, and for product managers to make product release decisions. However, there are many common misuses of ALTs and misinterpretations of their results. This book provides a framework for the proper design and analysis of ALTs. It compares ALTs with other industrial testing experiments, and provides guidance on their appropriate application. It features lots of examples using real data from industrial experiments, and provides statistical software for their implementation. It can be used as a textbook for students of reliability, or as a reference for practitioners"--Provided by publisher.
Author: Narayanaswamy Balakrishnan Publisher: John Wiley & Sons ISBN: 1119664012 Category : Mathematics Languages : en Pages : 240
Book Description
Provides authoritative guidance on statistical analysis techniques and inferential methods for one-shot device life-testing Estimating the reliability of one-shot devices—electro-expolsive devices, fire extinguishers, automobile airbags, and other units that perform their function only once—poses unique analytical challenges to conventional approaches. Due to how one-shot devices are censored, their precise failure times cannot be obtained from testing. The condition of a one-shot device can only be recorded at a specific inspection time, resulting in a lack of lifetime data collected in life-tests. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis addresses the fundamental issues of statistical modeling based on data collected from accelerated life-tests of one-shot devices. The authors provide inferential methods and procedures for planning accelerated life-tests, and describe advanced statistical techniques to help reliability practitioners overcome estimation problems in the real world. Topics covered include likelihood inference, competing-risks models, one-shot devices with dependent components, model selection, and more. Enabling readers to apply the techniques to their own lifetime data and arrive at the most accurate inference possible, this practical resource: Provides expert guidance on comprehensive data analysis of one-shot devices under accelerated life-tests Discusses how to design experiments for data collection from efficient accelerated life-tests while conforming to budget constraints Helps readers develops optimal designs for constant-stress and step-stress accelerated life-tests, mainstream life-tests commonly used in reliability practice Includes R code in each chapter for readers to use in their own analyses of one-shot device testing data Features numerous case studies and practical examples throughout Highlights important issues, problems, and future research directions in reliability theory and practice Accelerated Life Testing of One-shot Devices: Data Collection and Analysis is essential reading for graduate students, researchers, and engineers working on accelerated life testing data analysis.
Author: Publisher: ISBN: Category : Languages : en Pages : 21
Book Description
An accelerated life testing problem in which the stress s can take only a fixed, finite number of values is known as accelerated life test with step stress. In general, the item under test is started under the lowest stress first and if an item has not failed until a certain specified time, then it is moved into the next level of stress. This process is continued until the item fails. Thus the life test duration of the item is shortened. A Bayesian formulation of the problem is given in this paper. It is assumed that there only two stress values under consideration (1) standard use environmental condition (ii) a higher level of stress that is fixed in advance and is the same for all items to be tested. However, the time at which an item on test is taken out of use environment and put under higher stress environment can be chosen by the experimenter subject to a cost structure. We consider the inference and the optimal design problem of when the change the stress as the test progress. Keywords: Accelerated life test, Step stress, Optimal design, Bayesian approach.
Author: Michael J. LuValle Publisher: CRC Press ISBN: 020349203X Category : Business & Economics Languages : en Pages : 248
Book Description
Early approaches to accelerated testing were based on the assumption that there was a simple acceleration factor that would correspond to a linear scaling of time from the operating stress to the accelerating stress. This corresponds to the simplest physical model of the kinetics governing the underlying degradation, but this simple model does not
Author: Yung-Li Lee Publisher: Elsevier ISBN: 0080477690 Category : Technology & Engineering Languages : en Pages : 417
Book Description
Fatigue Testing and Analysis: Theory and Practice presents the latest, proven techniques for fatigue data acquisition, data analysis, and test planning and practice. More specifically, it covers the most comprehensive methods to capture the component load, to characterize the scatter of product fatigue resistance and loading, to perform the fatigue damage assessment of a product, and to develop an accelerated life test plan for reliability target demonstration. This book is most useful for test and design engineers in the ground vehicle industry. Fatigue Testing and Analysis introduces the methods to account for variability of loads and statistical fatigue properties that are useful for further probabilistic fatigue analysis. The text incorporates and demonstrates approaches that account for randomness of loading and materials, and covers the applications and demonstrations of both linear and double-linear damage rules. The reader will benefit from summaries of load transducer designs and data acquisition techniques, applications of both linear and non-linear damage rules and methods, and techniques to determine the statistical fatigue properties for the nominal stress-life and the local strain-life methods. - Covers the useful techniques for component load measurement and data acquisition, fatigue properties determination, fatigue analysis, and accelerated life test criteria development, and, most importantly, test plans for reliability demonstrations - Written from a practical point of view, based on the authors' industrial and academic experience in automotive engineering design - Extensive practical examples are used to illustrate the main concepts in all chapters
Author: V. N. A NAIKAN Publisher: PHI Learning Pvt. Ltd. ISBN: 9788120335936 Category : Technology & Engineering Languages : en Pages : 388
Book Description
This compact and easy-to-understand text presents the underlying principles and practice of reliability engineering and life testing. It describes the various techniques available for reliability analysis and prediction and explains the statistical methods necessary for reliability modelling, analysis and estimation. The text also discusses in detail the concepts of life testing, its classification and methodologies as well as accelerated life tests, the methodologies and models of stress related failure rates evaluation, and data analysis. Besides, it elaborates on the principles, methods and equipment of highly accelerated life testing and highly accelerated stress screening. Finally, the book concludes with a discussion on the parametric as well as non-parametric methods generally used for reliability estimation, and the recent developments in life testing of engineering components. Key Features The book is up-to-date and very much relevant to the present industrial, research, design, and development scenarios. Provides adequate tools to predict the system reliability at the design stage, to plan and conduct life testing on the products at various stages of development, and to use the life test and field data to estimate the product reliability. Gives sufficiently large number of worked-out examples. Primarily intended as a textbook for the postgraduate students of engineering (M.Tech., Reliability Engineering), the book would also be quite useful for reliability practitioners, professional engineers, and researchers.
Author: Preeti Wanti Srivastava Publisher: World Scientific ISBN: 9813141271 Category : Technology & Engineering Languages : en Pages : 444
Book Description
Today's manufacturers are under tremendous pressure to develop new technological and high reliability products in record time. This has motivated reliability engineers to evaluate the reliabilities of such products. Reliability testing under accelerated environment — accelerated life testing helps to meet this challenge.This comprehensive and must-have edition provides a broad coverage of the optimal design of Accelerated Life Test Plans under time-varying stress loadings. It also focuses on the formulation of Accelerated Life Test Sampling Plans (ALTSPs) which integrate accelerated life tests with quality control technique of acceptance sampling plans. These plans help to determine optimal experimental variables such as appropriate stress levels, optimal allocation at each stress levels, stress change points, etc, depending on the stress loading scheme. ALTSPs determine optimal plans such that the producers' and consumers' risks are safeguarded.
Author: Cabarbaye André Publisher: Cab Innovation Editeur ISBN: Category : Science Languages : en Pages : 128
Book Description
The accelerated life testing is used to quickly demonstrate the ability of a product to perform its role, by increasing the stress conditions compared to those of its operational life. This educational book on the implementation of accelerated life testing therefore explains its theoretical foundations and offers a practical application guide which covers state-of-the-art thinking on design techniques and optimal planning of tests.
Author: Lev M. Klyatis Publisher: Academic Press ISBN: 0128188421 Category : Technology & Engineering Languages : en Pages : 360
Book Description
Accelerated testing (most types of laboratory testing, proving ground testing, intensive field/flight testing, any experimental research) is increasingly a key component for predicting of product's/process performance. Trends in Development Accelerated Testing for Automotive and Aerospace Engineering provides a completely updated analysis of the current status of accelerated testing, including the basic general directions of testing (methods and equipment) development, how one needs to study real world conditions for their accurate simulation and successful accelerated testing, describes in details the role of accurate simulation in the development of automotive and aerospace engineering, shows that failures are most often found in the interconnections, step-by-step instructions and examples. This is the only book presently available that considers in detail both the positive and negative trends in testing development for prediction quality, reliability, safety, durability, maintainability, supportability, profit, and decreasing life-cycle cost, recalls, complaints and other performance components of the product. The author presents new ideas and offers a unique strategic approach to obtaining solutions which were not possible using earlier. His methodology has been widely implemented, continue to be adopted throughout the world, and leads to advance society through product improvement that can reduce loss of life, injuries, financial losses, and product recalls. It also covers new ideas in development positive and cost- effective trends in testing development, especially accelerated reliability and durability testing (ART/ADT), which includes integration accurate simulation of field/flight influences, safety, human factors, and leads to successful prediction of product performance during pre-design, design, manufacturing, and usage for the product's service life. Engineers, researchers, teachers and postgraduate/advanced students who are involved in automotive and aerospace engineering will find this a useful reference on how to apply the accelerated testing method to solve practical problems in these areas. - Explains the similarities and differences between accelerated testing technologies used in automotive, aerospace, and other engineering fields - Provides a step-by-step guide for the accurate physical simulation of field conditions for test subjects - Includes case studies of accelerated testing in automotive and aerospace engineering
Author: Wayne B. Nelson
Author: Wayne B. Nelson
Author: Rong Pan
Author: Narayanaswamy Balakrishnan
Author: 
Author: Michael J. LuValle
Author: Yung-Li Lee
Author: V. N. A NAIKAN
Author: Preeti Wanti Srivastava
Author: Cabarbaye André
Author: Lev M. Klyatis