2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) PDF Download
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Author: IEEE Staff Publisher: ISBN: 9781509036240 Category : Languages : en Pages :
Book Description
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
Author: IEEE Staff Publisher: ISBN: 9781509036240 Category : Languages : en Pages :
Book Description
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
Author: Publisher: IEEE ISBN: 9780769507194 Category : Computers Languages : en Pages : 422
Book Description
This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.
Author: IEEE Staff Publisher: ISBN: 9781479986316 Category : Languages : en Pages :
Book Description
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest
Author: IEEE Staff Publisher: ISBN: 9781538603635 Category : Integrated circuits Languages : en Pages :
Book Description
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance One of the unique features of this symposium is to combine new academic research with state of the art industrial data, necessary ingredients for significant advances in this field
Author: IEEE Staff
Author: IEEE Staff
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Author: International Symposium on Defect and Fault Tolerance in VLSI Systems
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Author: IEEE Staff
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Author: IEEE Staff