Author: Minesh Balkrishan AminPublisher:
ISBN:
Category :
Languages : en
Pages : 264
Book Description
Data Parallel Fault Simulation for Combinational and Sequential Circuits
Author: Minesh Balkrishan AminPublisher:
ISBN:
Category :
Languages : en
Pages : 264
Book Description
On Improving the Performance of Parallel Fault Simulation for Synchronous Sequential Circuits
Author: Chin-Yaw TiewPublisher:
ISBN:
Category : Electric circuits, Parallel
Languages : en
Pages : 176
Book Description
A Modified Parallel Fault Simulator for Combinational Circuits
Author: Shih-Ming LiPublisher:
ISBN:
Category : Digital electronics
Languages : en
Pages : 86
Book Description
New methods for parallel fast fault simulation for synchronous sequential circuits
Author: Mehrdad MojtahediStructure based methods for parallel pattern fault simulation in combinational circuits
Author: Bernd BeckerParallel Pattern Fault Simulation Based on Stem Faults in Combinational Circuits
Author: Ohyoung SongParallel Algorithms for Sequential Circuit Fault Simulation and Test Generation
Author: Dilip KrishnaswamyPARIS
Author: Nikolaus GoudersConcurrent and Comparative Discrete Event Simulation
Author: Ernst G. UlrichPublisher: Springer Science & Business Media
ISBN: 1461527384
Category : Technology & Engineering
Languages : en
Pages : 199
Book Description
Concurrent simulation is over twenty years old. During that pe riod it has been widely adopted for the simulation of faults in digital circuits, for which it provides a combination of extreme efficiency and generality . Yet, it is remarkable that no book published so far presents a correct and sufficiently detailed treatment of concurrent simulation. A first reason to welcome into print the effort of the authors is, therefore, that it provides a much needed account of an important topic in design automation. This book is, however, unique for sev eral other reasons. It is safe to state that no individual has contrib uted more than Ernst Ulrich to the development of digital logic simulation. For concurrent simulation, one may say that Ernst has contributed more than the rest of the world. We would find such a claim difficult to dispute. The unique experience of the authors con fers a special character to this book: It is authoritative, inspired, and focused on what is conceptually important. Another unique aspect of this book, perhaps the one that will be the most surprising for many readers, is that it is strongly projected towards the future. Concurrent simulation is presented as a general experimentation methodology and new intriguing applications are analyzed. The discussion of multi-domain concurrent simulation-- recent work of Karen Panetta Lentz and Ernst Ulrich---is fascinat ing.
VLSI Test Principles and Architectures
Author: Laung-Terng WangPublisher: Elsevier
ISBN: 0080474799
Category : Technology & Engineering
Languages : en
Pages : 809
Book Description
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.