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Author: National Research Council Publisher: National Academies ISBN: 0309039959 Category : Science Languages : en Pages : 436
Book Description
This book reevaluates the health risks of ionizing radiation in light of data that have become available since the 1980 report on this subject was published. The data include new, much more reliable dose estimates for the A-bomb survivors, the results of an additional 14 years of follow-up of the survivors for cancer mortality, recent results of follow-up studies of persons irradiated for medical purposes, and results of relevant experiments with laboratory animals and cultured cells. It analyzes the data in terms of risk estimates for specific organs in relation to dose and time after exposure, and compares radiation effects between Japanese and Western populations.
Author: National Research Council Publisher: National Academies ISBN: 0309039959 Category : Science Languages : en Pages : 436
Book Description
This book reevaluates the health risks of ionizing radiation in light of data that have become available since the 1980 report on this subject was published. The data include new, much more reliable dose estimates for the A-bomb survivors, the results of an additional 14 years of follow-up of the survivors for cancer mortality, recent results of follow-up studies of persons irradiated for medical purposes, and results of relevant experiments with laboratory animals and cultured cells. It analyzes the data in terms of risk estimates for specific organs in relation to dose and time after exposure, and compares radiation effects between Japanese and Western populations.
Author: Dan M. Fleetwood Publisher: World Scientific ISBN: 9789812794703 Category : Technology & Engineering Languages : en Pages : 354
Book Description
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metalOCooxideOCosemiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level. Contents: Single Event Effects in Avionics and on the Ground (E Normand); Soft Errors in Commercial Integrated Circuits (R C Baumann); System Level Single Event Upset Mitigation Strategies (W F Heidergott); Space Radiation Effects in Optocouplers (R A Reed et al.); The Effects of Space Radiation Exposure on Power MOSFETs: A Review (K Shenai et al.); Total Dose Effects in Linear Bipolar Integrated Circuits (H J Barnaby); Hardness Assurance for Commercial Microelectronics (R L Pease); Switching Oxide Traps (T R Oldham); Online and Realtime Dosimetry Using Optically Stimulated Luminescence (L Dusseau & J Gasiot); and other articles. Readership: Practitioners, researchers, managers and graduate students in electrical and electronic engineering, semiconductor science and technology, and microelectronics."
Author: Paul Leroux Publisher: MDPI ISBN: 3039212796 Category : Technology & Engineering Languages : en Pages : 210
Book Description
Research on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications.
Author: Krzysztof Iniewski Publisher: CRC Press ISBN: 1439826951 Category : Technology & Engineering Languages : en Pages : 432
Book Description
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause. Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter—in terms of ionization effects and nuclear displacement Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems—and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.
Author: Raoul Velazco Publisher: Springer Science & Business Media ISBN: 140205646X Category : Technology & Engineering Languages : en Pages : 273
Book Description
This volume provides an extensive overview of radiation effects on integrated circuits, offering major guidelines for coping with radiation effects on components. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, November 20-25, 2005.
Author: Marta Bagatin Publisher: CRC Press ISBN: 1498722636 Category : Technology & Engineering Languages : en Pages : 394
Book Description
Ionizing Radiation Effects in Electronics: From Memories to Imagers delivers comprehensive coverage of the effects of ionizing radiation on state-of-the-art semiconductor devices. The book also offers valuable insight into modern radiation-hardening techniques. The text begins by providing important background information on radiation effects, their underlying mechanisms, and the use of Monte Carlo techniques to simulate radiation transport and the effects of radiation on electronics. The book then: Explains the effects of radiation on digital commercial devices, including microprocessors and volatile and nonvolatile memories—static random-access memories (SRAMs), dynamic random-access memories (DRAMs), and Flash memories Examines issues like soft errors, total dose, and displacement damage, together with hardening-by-design solutions for digital circuits, field-programmable gate arrays (FPGAs), and mixed-analog circuits Explores the effects of radiation on fiber optics and imager devices such as complementary metal-oxide-semiconductor (CMOS) sensors and charge-coupled devices (CCDs) Featuring real-world examples, case studies, extensive references, and contributions from leading experts in industry and academia, Ionizing Radiation Effects in Electronics: From Memories to Imagers is suitable both for newcomers who want to become familiar with radiation effects and for radiation experts who are looking for more advanced material or to make effective use of beam time.
Author: Joseph Masco Publisher: Princeton University Press ISBN: 0691202176 Category : History Languages : en Pages : 454
Book Description
An important investigation of the sociocultural fallout of America's work on the atomic bomb In The Nuclear Borderlands, Joseph Masco offers an in-depth look at the long-term consequences of the Manhattan Project. Masco examines how diverse groups in and around Los Alamos, New Mexico understood and responded to the U.S. nuclear weapons project in the post–Cold War period. He shows that the American focus on potential nuclear apocalypse during the Cold War obscured the broader effects of the nuclear complex on society, and that the atomic bomb produced a new cognitive orientation toward daily life, reconfiguring concepts of time, nature, race, and citizenship. This updated edition includes a brand-new preface by the author discussing current developments in nuclear politics and the scientific impact of the nuclear age on the present epoch of a human-altered climate.
Author: Charles Pope Publisher: Australian Self Publishing Group ISBN: 0648213447 Category : Comics & Graphic Novels Languages : en Pages : 177
Book Description
Charles Pope a well know expert on Non-destructive radiation expels a few myths surrounding the fears associated with the use of radiation. Charles is what you would discribe, a Nuclear Greenie. He has written a layman’s guide in plain English to ionising radiation over the last 4 billion years via prehistoric Gabon, Einstein, Hiroshima, Chernobyl and Fukushima. We really do stress ourselves too much about nuclear radiation simply because we don’t understand it. In the process we forfeit our best get-out-of-jail card for base load carbon-free energy until the hoped-for renewables can fill the gap. Charles Pope is a nuclear environmentalist and has used radioactive materials and X-ray equipment for his working life and trained others in their safe use. He is more convinced by arithmetic than emotion. It’s time to stop shouting slogans and start understanding the manageable risks of nuclear energy.
Author: Susan B Klein Publisher: World Scientific ISBN: 9811257671 Category : Medical Languages : en Pages : 399
Book Description
Fundamentals of Radiation Biology presents a contemporary, comprehensive review of the interactions between ionizing radiations and biological materials, tracking the consequences to three inevitable endpoints: cell restitution, cell death, or cell transformation.The introductory narrative is followed by examination of larger scale phenomena including tissue responses to radiation injury, organ failure modes, and resultant human illness including cancer. Ultimately, Fundamentals of Radiation Biology considers circumstantial radiation incidents impacting biological systems including radiological terrorism and radiation pollution remediation. Chapters presenting an overview of carcinogenesis and radiation therapy techniques based in radiobiology discuss two significant expansions central to the concerns of the text.This book takes an unprecedented narrative approach to radiobiology; each chapter expands on the fundamentals surveyed previously to lead the reader steadily to a panorama of radiation biocomplexity. No biological event happens in isolation. Actions evoke reactions that alter structures and cause living systems to adapt. It also examines the components constituting mammalian radiation response machinery and correlates them with resultant physiological behaviors.
Author: National Research Council
Author: National Research Council
Author: Dan M. Fleetwood
Author: Paul Leroux
Author: Krzysztof Iniewski
Author: 
Author: Raoul Velazco
Author: Marta Bagatin
Author: Joseph Masco
Author: Charles Pope
Author: Susan B Klein