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Author: Ahmed Belasri Publisher: Springer Nature ISBN: 9811554447 Category : Technology & Engineering Languages : en Pages : 659
Book Description
This book highlights peer reviewed articles from the 1st International Conference on Renewable Energy and Energy Conversion, ICREEC 2019, held at Oran in Algeria. It presents recent advances, brings together researchers and professionals in the area and presents a platform to exchange ideas and establish opportunities for a sustainable future. Topics covered in this proceedings, but not limited to, are photovoltaic systems, bioenergy, laser and plasma technology, fluid and flow for energy, software for energy and impact of energy on the environment.
Author: Ahmed Belasri Publisher: Springer Nature ISBN: 9811554447 Category : Technology & Engineering Languages : en Pages : 659
Book Description
This book highlights peer reviewed articles from the 1st International Conference on Renewable Energy and Energy Conversion, ICREEC 2019, held at Oran in Algeria. It presents recent advances, brings together researchers and professionals in the area and presents a platform to exchange ideas and establish opportunities for a sustainable future. Topics covered in this proceedings, but not limited to, are photovoltaic systems, bioenergy, laser and plasma technology, fluid and flow for energy, software for energy and impact of energy on the environment.
Author: Don Montague Publisher: Taylor & Francis ISBN: 9780419199106 Category : Architecture Languages : en Pages : 472
Book Description
This dual-language dictionary lists over 20,000 specialist terms in both French and English, covering architecture, building, engineering and property terms. It meets the needs of all building professionals working on projects overseas. It has been comprehensively researched and compiled to provide an invaluable reference source in an increasingly European marketplace.
Author: North Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development Publisher: ISBN: 9789283600046 Category : Aeronautics Languages : en Pages :
Author: Shubham Sahay Publisher: John Wiley & Sons ISBN: 1119523532 Category : Technology & Engineering Languages : en Pages : 496
Book Description
A comprehensive one-volume reference on current JLFET methods, techniques, and research Advancements in transistor technology have driven the modern smart-device revolution—many cell phones, watches, home appliances, and numerous other devices of everyday usage now surpass the performance of the room-filling supercomputers of the past. Electronic devices are continuing to become more mobile, powerful, and versatile in this era of internet-of-things (IoT) due in large part to the scaling of metal-oxide semiconductor field-effect transistors (MOSFETs). Incessant scaling of the conventional MOSFETs to cater to consumer needs without incurring performance degradation requires costly and complex fabrication process owing to the presence of metallurgical junctions. Unlike conventional MOSFETs, junctionless field-effect transistors (JLFETs) contain no metallurgical junctions, so they are simpler to process and less costly to manufacture.JLFETs utilize a gated semiconductor film to control its resistance and the current flowing through it. Junctionless Field-Effect Transistors: Design, Modeling, and Simulation is an inclusive, one-stop referenceon the study and research on JLFETs This timely book covers the fundamental physics underlying JLFET operation, emerging architectures, modeling and simulation methods, comparative analyses of JLFET performance metrics, and several other interesting facts related to JLFETs. A calibrated simulation framework, including guidance on SentaurusTCAD software, enables researchers to investigate JLFETs, develop new architectures, and improve performance. This valuable resource: Addresses the design and architecture challenges faced by JLFET as a replacement for MOSFET Examines various approaches for analytical and compact modeling of JLFETs in circuit design and simulation Explains how to use Technology Computer-Aided Design software (TCAD) to produce numerical simulations of JLFETs Suggests research directions and potential applications of JLFETs Junctionless Field-Effect Transistors: Design, Modeling, and Simulation is an essential resource for CMOS device design researchers and advanced students in the field of physics and semiconductor devices.
Author: Tibor Grasser Publisher: Springer ISBN: 3319089943 Category : Technology & Engineering Languages : en Pages : 518
Book Description
This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
Author: Jagadesh Kumar Mamidala Publisher: John Wiley & Sons ISBN: 111924630X Category : Technology & Engineering Languages : en Pages : 208
Book Description
Research into Tunneling Field Effect Transistors (TFETs) has developed significantly in recent times, indicating their significance in low power integrated circuits. This book describes the qualitative and quantitative fundamental concepts of TFET functioning, the essential components of the problem of modelling the TFET, and outlines the most commonly used mathematical approaches for the same in a lucid language. Divided into eight chapters, the topics covered include: Quantum Mechanics, Basics of Tunneling, The Tunnel FET, Drain current modelling of Tunnel FET: The task and its challenges, Modeling the Surface Potential in TFETs, Modelling the Drain Current, and Device simulation using Technology Computer Aided Design (TCAD). The information is well organized, describing different phenomena in the TFETs using simple and logical explanations. Key features: * Enables readers to understand the basic concepts of TFET functioning and modelling in order to read, understand, and critically analyse current research on the topic with ease. * Includes state-of-the-art work on TFETs, attempting to cover all the recent research articles published on the subject. * Discusses the basic physics behind tunneling, as well as the device physics of the TFETs. * Provides detailed discussion on device simulations along with device physics so as to enable researchers to carry forward their study on TFETs. Primarily targeted at new and practicing researchers and post graduate students, the book would particularly be useful for researchers who are working in the area of compact and analytical modelling of semiconductor devices.
Author: Fabio Remondino Publisher: Springer Science & Business Media ISBN: 3642275230 Category : Technology & Engineering Languages : en Pages : 243
Book Description
Today the cost of solid-state two-dimensional imagers has dramatically dropped, introducing low cost systems on the market suitable for a variety of applications, including both industrial and consumer products. However, these systems can capture only a two-dimensional projection (2D), or intensity map, of the scene under observation, losing a variable of paramount importance, i.e., the arrival time of the impinging photons. Time-Of-Flight (TOF) Range-Imaging (TOF) is an emerging sensor technology able to deliver, at the same time, depth and intensity maps of the scene under observation. Featuring different sensor resolutions, RIM cameras serve a wide community with a lot of applications like monitoring, architecture, life sciences, robotics, etc. This book will bring together experts from the sensor and metrology side in order to collect the state-of-art researchers in these fields working with RIM cameras. All the aspects in the acquisition and processing chain will be addressed, from recent updates concerning the photo-detectors, to the analysis of the calibration techniques, giving also a perspective onto new applications domains.
Author: Ernst Meyer Publisher: Springer Nature ISBN: 3030370895 Category : Science Languages : en Pages : 330
Book Description
Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.
Author: Ahmed Belasri
Author: Ahmed Belasri
Author: Don Montague
Author: North Atlantic Treaty Organization. Advisory Group for Aerospace Research and Development
Author: Shubham Sahay
Author: Tibor Grasser
Author: Jagadesh Kumar Mamidala
Author: Fabio Remondino
Author: Jean-Pierre Colinge
Author: Klaus Becker
Author: Ernst Meyer