Author: Rick Partlow
Publisher:
ISBN:
Category :
Languages : en
Pages : 294
Book Description
Go to war or go to jail.For small-time street hustler Cam Alvarez, the choice is simple. He has no family, no friends, no place in the world...nothing to lose. When his latest con results in the death of a cartel hitman, Cam opts to join the Marines and leave Earth to fight a vicious alien enemy. Drafted into the Marine Drop-Troopers, Cam discovers there's one thing he's even better at than running street-con games, and that's killing the enemy. Wrapped in an armored battlesuit, Cam finds purpose amidst the horror and destruction of the war, and the opportunity for a new sort of friends and family...if he can break the habits of a life spent alone, trusting no one. And, if he can survive...Rick Partlow returns with another kickass Military Sci-Fi epic. It's perfect for fans of Jay Allan, Jasper T. Scott, and Scott Bartlett.
Contact Front
Author: Rick Partlow
Publisher:
ISBN:
Category :
Languages : en
Pages : 294
Book Description
Go to war or go to jail.For small-time street hustler Cam Alvarez, the choice is simple. He has no family, no friends, no place in the world...nothing to lose. When his latest con results in the death of a cartel hitman, Cam opts to join the Marines and leave Earth to fight a vicious alien enemy. Drafted into the Marine Drop-Troopers, Cam discovers there's one thing he's even better at than running street-con games, and that's killing the enemy. Wrapped in an armored battlesuit, Cam finds purpose amidst the horror and destruction of the war, and the opportunity for a new sort of friends and family...if he can break the habits of a life spent alone, trusting no one. And, if he can survive...Rick Partlow returns with another kickass Military Sci-Fi epic. It's perfect for fans of Jay Allan, Jasper T. Scott, and Scott Bartlett.
Publisher:
ISBN:
Category :
Languages : en
Pages : 294
Book Description
Go to war or go to jail.For small-time street hustler Cam Alvarez, the choice is simple. He has no family, no friends, no place in the world...nothing to lose. When his latest con results in the death of a cartel hitman, Cam opts to join the Marines and leave Earth to fight a vicious alien enemy. Drafted into the Marine Drop-Troopers, Cam discovers there's one thing he's even better at than running street-con games, and that's killing the enemy. Wrapped in an armored battlesuit, Cam finds purpose amidst the horror and destruction of the war, and the opportunity for a new sort of friends and family...if he can break the habits of a life spent alone, trusting no one. And, if he can survive...Rick Partlow returns with another kickass Military Sci-Fi epic. It's perfect for fans of Jay Allan, Jasper T. Scott, and Scott Bartlett.
Choreographics
Author: Ann Hutchinson Guest
Publisher: Routledge
ISBN: 1134388454
Category : Music
Languages : en
Pages : 222
Book Description
Here for the first time is an account of how each of thirteen historical as well as present-day systems cope with indicating body movement, time, space (direction and level) and other basic movement aspects of paper. A one-to-one comparison is made of how the same simple patterns, such as walking, jumping, turning, etc. are notated in each system.
Publisher: Routledge
ISBN: 1134388454
Category : Music
Languages : en
Pages : 222
Book Description
Here for the first time is an account of how each of thirteen historical as well as present-day systems cope with indicating body movement, time, space (direction and level) and other basic movement aspects of paper. A one-to-one comparison is made of how the same simple patterns, such as walking, jumping, turning, etc. are notated in each system.
Semiconductor Material and Device Characterization
Author: Dieter K. Schroder
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Publisher: John Wiley & Sons
ISBN: 0471739065
Category : Technology & Engineering
Languages : en
Pages : 800
Book Description
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: Updated and revised figures and examples reflecting the most current data and information 260 new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
Report
Multibody Mechanics and Visualization
Author: Harry Dankowicz
Publisher: Springer Science & Business Media
ISBN: 1846280680
Category : Technology & Engineering
Languages : en
Pages : 516
Book Description
Multibody Mechanics and Visualization appeals to computer-savvy students who will acquire significant skills in mathematical and physical modelling of mechanical systems in the process of producing attractive computer simulations and animations. The approachable style and clear presentation of this text will help readers grasp the essentials of: modeling the kinematics and dynamics of arbitrary multibody mechanisms; formulating a mathematical description of general motions of such mechanisms; implementing the description in a computer-graphics application for the animation/visualization of the movement. Supported in the text in parallel with the theoretical presentation is the simulation and animation application Mambo. The Mambo toolbox enables you to provide these specifications for mechanisms that would pose insurmountable algebraic challenges to manual calculation. Mambo works with the widely operated Maple mathematical software that can be downloaded from the Web and enables students to visualize the mechanical systems described in the text.
Publisher: Springer Science & Business Media
ISBN: 1846280680
Category : Technology & Engineering
Languages : en
Pages : 516
Book Description
Multibody Mechanics and Visualization appeals to computer-savvy students who will acquire significant skills in mathematical and physical modelling of mechanical systems in the process of producing attractive computer simulations and animations. The approachable style and clear presentation of this text will help readers grasp the essentials of: modeling the kinematics and dynamics of arbitrary multibody mechanisms; formulating a mathematical description of general motions of such mechanisms; implementing the description in a computer-graphics application for the animation/visualization of the movement. Supported in the text in parallel with the theoretical presentation is the simulation and animation application Mambo. The Mambo toolbox enables you to provide these specifications for mechanisms that would pose insurmountable algebraic challenges to manual calculation. Mambo works with the widely operated Maple mathematical software that can be downloaded from the Web and enables students to visualize the mechanical systems described in the text.
Organizational, Direct Support, and General Support Maintenance Manual for Cable Assembly, Special Purpose, CX-11230/G (5995-00-133-9126) and Cable Assembly, Adapter, CX-10734/G(5995-00-133-9125) Including Repair Parts and Special Tools List
Time Out Miami and the Florida Keys
Author: Editors of Time Out
Publisher: Time Out
ISBN: 1846702593
Category : Travel
Languages : en
Pages : 497
Book Description
The sixth edition of Time Out Miami and the Florida Keys is your VIP pass to this A-list city. Time Out's intrepid team of insiders has combed its beaches, bars, restaurants and secret spots to create the definitive guide to the fabulous surreal life of Miami. All rumors of this city being heaven's waiting room will be dispelled as Miami's vibrant, youthful culture is exposed and explored. We will shed light-and not just a neon one on the evolution of what was once a sleepy beach town into one of the world's most glamorous spots.
Publisher: Time Out
ISBN: 1846702593
Category : Travel
Languages : en
Pages : 497
Book Description
The sixth edition of Time Out Miami and the Florida Keys is your VIP pass to this A-list city. Time Out's intrepid team of insiders has combed its beaches, bars, restaurants and secret spots to create the definitive guide to the fabulous surreal life of Miami. All rumors of this city being heaven's waiting room will be dispelled as Miami's vibrant, youthful culture is exposed and explored. We will shed light-and not just a neon one on the evolution of what was once a sleepy beach town into one of the world's most glamorous spots.
Friction and Wear: From Elementary Mechanisms to Macroscopic Behavior
Author: Valentin L. Popov
Publisher: Frontiers Media SA
ISBN: 2889630749
Category :
Languages : en
Pages : 104
Book Description
Friction and the interaction of surfaces can usually be felt at the scale of the contacting bodies. Indeed, phenomena such as the frictional resistance or the occurrence of wear can be observable with plain eye, but to characterize them and in order to make a prediction, a more detailed understanding at smaller scales is often required. These can include individual roughness peaks or single molecule interactions. In this Research Topic, we have gathered a collection of articles representing the state of the art in tribology’s endeavor to bridge the gap between nano scale elementary research and the macroscopic behavior of contacting bodies. These articles showcase the breadth of questions related to the interaction of micro and macro scale and give examples of successful transfer of insights from one to the other. We are delighted to present this Research Topic to the reader with the hope that it will further inspire and stimulate research in the field.
Publisher: Frontiers Media SA
ISBN: 2889630749
Category :
Languages : en
Pages : 104
Book Description
Friction and the interaction of surfaces can usually be felt at the scale of the contacting bodies. Indeed, phenomena such as the frictional resistance or the occurrence of wear can be observable with plain eye, but to characterize them and in order to make a prediction, a more detailed understanding at smaller scales is often required. These can include individual roughness peaks or single molecule interactions. In this Research Topic, we have gathered a collection of articles representing the state of the art in tribology’s endeavor to bridge the gap between nano scale elementary research and the macroscopic behavior of contacting bodies. These articles showcase the breadth of questions related to the interaction of micro and macro scale and give examples of successful transfer of insights from one to the other. We are delighted to present this Research Topic to the reader with the hope that it will further inspire and stimulate research in the field.
Shock Waves
Author: Klaus Hannemann
Publisher: Springer Science & Business Media
ISBN: 3540851682
Category : Science
Languages : en
Pages : 810
Book Description
The 26th International Symposium on Shock Waves in Göttingen, Germany was jointly organised by the German Aerospace Centre DLR and the French-German Research Institute of Saint Louis ISL. The year 2007 marked the 50th anniversary of the Symposium, which first took place in 1957 in Boston and has since become an internationally acclaimed series of meetings for the wider Shock Wave Community. The ISSW26 focused on the following areas: Shock Propagation and Reflection, Detonation and Combustion, Hypersonic Flow, Shock Boundary Layer Interaction, Numerical Methods, Medical, Biological and Industrial Applications, Richtmyer Meshkov Instability, Blast Waves, Chemically Reacting Flows, Diagnostics, Facilities, Flow Visualisation, Ignition, Impact and Compaction, Multiphase Flow, Nozzles Flows, Plasmas and Propulsion. The two Volumes contain the papers presented at the symposium and serve as a reference for the participants of the ISSW 26 and individuals interested in these fields.
Publisher: Springer Science & Business Media
ISBN: 3540851682
Category : Science
Languages : en
Pages : 810
Book Description
The 26th International Symposium on Shock Waves in Göttingen, Germany was jointly organised by the German Aerospace Centre DLR and the French-German Research Institute of Saint Louis ISL. The year 2007 marked the 50th anniversary of the Symposium, which first took place in 1957 in Boston and has since become an internationally acclaimed series of meetings for the wider Shock Wave Community. The ISSW26 focused on the following areas: Shock Propagation and Reflection, Detonation and Combustion, Hypersonic Flow, Shock Boundary Layer Interaction, Numerical Methods, Medical, Biological and Industrial Applications, Richtmyer Meshkov Instability, Blast Waves, Chemically Reacting Flows, Diagnostics, Facilities, Flow Visualisation, Ignition, Impact and Compaction, Multiphase Flow, Nozzles Flows, Plasmas and Propulsion. The two Volumes contain the papers presented at the symposium and serve as a reference for the participants of the ISSW 26 and individuals interested in these fields.
Ceramic Microstructures
Author: Antoni P. Tomsia
Publisher: Springer Science & Business Media
ISBN: 9780306458170
Category : Technology & Engineering
Languages : en
Pages : 876
Book Description
This volume, titled Proceedings of the International Materials Symposium on Ce ramic Microstructures: Control at the Atomic Level summarizes the progress that has been achieved during the past decade in understanding and controlling microstructures in ceram ics. A particular emphasis of the symposium, and therefore of this volume, is advances in the characterization, understanding, and control of micro structures at the atomic or near-atomic level. This symposium is the fourth in a series of meetings, held every ten years, devoted to ceramic microstructures. The inaugural meeting took place in 1966, and focussed on the analysis, significance, and production of microstructure; the symposium emphasized the need for, and importance of characterization in achieving a more complete understanding of the physical and chemical characteristics of ceramics. A consensus emerged at that meeting on the critical importance of characterization in achieving a more complete understanding of ceramic properties. That point of view became widely accepted in the ensuing decade. The second meeting took place in 1976 at a time of world-wide energy shortages and thus emphasized energy-related applications of ceramics, and more specifically, microstructure-property relationships of those materials. The third meeting, held in 1986, was devoted to the role that interfaces played both during processing, and in influencing the ultimate properties of single and polyphase ceramics, and ceramic-metal systems.
Publisher: Springer Science & Business Media
ISBN: 9780306458170
Category : Technology & Engineering
Languages : en
Pages : 876
Book Description
This volume, titled Proceedings of the International Materials Symposium on Ce ramic Microstructures: Control at the Atomic Level summarizes the progress that has been achieved during the past decade in understanding and controlling microstructures in ceram ics. A particular emphasis of the symposium, and therefore of this volume, is advances in the characterization, understanding, and control of micro structures at the atomic or near-atomic level. This symposium is the fourth in a series of meetings, held every ten years, devoted to ceramic microstructures. The inaugural meeting took place in 1966, and focussed on the analysis, significance, and production of microstructure; the symposium emphasized the need for, and importance of characterization in achieving a more complete understanding of the physical and chemical characteristics of ceramics. A consensus emerged at that meeting on the critical importance of characterization in achieving a more complete understanding of ceramic properties. That point of view became widely accepted in the ensuing decade. The second meeting took place in 1976 at a time of world-wide energy shortages and thus emphasized energy-related applications of ceramics, and more specifically, microstructure-property relationships of those materials. The third meeting, held in 1986, was devoted to the role that interfaces played both during processing, and in influencing the ultimate properties of single and polyphase ceramics, and ceramic-metal systems.