Author: Publisher:
ISBN:
Category : Electronic microscopy
Languages : fr
Pages :
Book Description
Congres International de la Microscopie Electronique, Paris, 14-22 septembre 1950
Author: Comptes rendus
Author: Congrès international de microscopie électronique. 1er. Paris. 1950, 14-22 septembre..Publisher: Editions de la "Revue d'optique théorique et instrumentale" (Mâcon
ISBN:
Category :
Languages : fr
Pages : 768
Book Description
Comptes rendus du premier Congrès International de Microscopie Électronique, Paris, 14-22 Septembre, 1950
Author: Comptes-rendus du 1. congrès international de microscopie électronique, Paris, 14-22 septembre 1950
Author: Comptes rendus du 1er congrés international de microscopie électronique. Paris, 14-22 septembre 1950. Proceedings of the 1st international congress of electron microscopy...
Author: Congrès international de microscopie électronique. [1er. Paris. 1950, 14-22 septembre.].Publisher: Editions de la "Revue d'optique théorique et instrumentale" (Mâcon
ISBN:
Category :
Languages : fr
Pages : 768
Book Description
Comptes rendus du premier Congrès international de microscopie électronique
Author: Proceedings of the First International Congress of Electron Microscopy
Author: Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 768
Book Description
Computer Processing of Electron Microscope Images
Author: P. W. HawkesPublisher: Springer Science & Business Media
ISBN: 364281381X
Category : Science
Languages : en
Pages : 307
Book Description
Towards the end of the 1960s, a number of quite different circumstances combined to launch a period of intense activity in the digital processing of electron micro graphs. First, many years of work on correcting the resolution-limiting aberrations of electron microscope objectives had shown that these optical impediments to very high resolution could indeed be overcome, but only at the cost of immense exper imental difficulty; thanks largely to the theoretical work of K. -J. Hanszen and his colleagues and to the experimental work of F. Thon, the notions of transfer func tions were beginning to supplant or complement the concepts of geometrical optics in electron optical thinking; and finally, large fast computers, capable of manipu lating big image matrices in a reasonable time, were widely accessible. Thus the idea that recorded electron microscope images could be improved in some way or rendered more informative by subsequent computer processing gradually gained ground. At first, most effort was concentrated on three-dimensional reconstruction, particu larly of specimens with natural symmetry that could be exploited, and on linear operations on weakly scattering specimens (Chap. l). In 1973, however, R. W. Gerchberg and W. O. Saxton described an iterative algorithm that in principle yielded the phase and amplitude of the electron wave emerging from a strongly scattering speci men.
Comptes-rendus du premier Congrès International de Microcopie Electronique
Author: Société Française de Microscopie Théorique et AppliquéePublisher:
ISBN:
Category :
Languages : en
Pages : 768
Book Description
Micron and Microscopica Acta
Author: Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 458
Book Description