Author: Publisher: ASTM International
ISBN:
Category :
Languages : en
Pages : 86
Book Description
Electron Beam Microanalysis
Author: Electron Beam Microanalysis
Author: Donald Robert BeamanPublisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 106
Book Description
BLL Conference Index, 1964-1973
Author: British Library. Lending DivisionPublisher: Boston Spa [Eng.] : British Library Lending Division
ISBN:
Category : British Library. Lending Division
Languages : en
Pages : 594
Book Description
Advances in Imaging and Electron Physics
Author: Peter W. HawkesPublisher: Academic Press
ISBN: 0123859859
Category : Computers
Languages : en
Pages : 369
Book Description
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Invaluable reference and guide for physicists, engineers and mathematicians
Welding Metallurgy of Stainless and Heat-Resisting Steels
Author: R. CastroPublisher: CUP Archive
ISBN: 9780521204316
Category : Technology & Engineering
Languages : en
Pages : 210
Book Description
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse
Author: Gottfried MöllenstedtPublisher: Springer Science & Business Media
ISBN: 3662121085
Category : Science
Languages : en
Pages : 624
Book Description
The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.
The Beginnings of Electron Microscopy - Part 1
Author: Peter W. HawkesPublisher: Academic Press
ISBN: 0323915086
Category : Technology & Engineering
Languages : en
Pages : 452
Book Description
The Beginnings of Electron Microscopy - Part 1, Volume 220 in the Advances in Imaging and Electron Physics series highlights new advances in the field, with this new volume presenting interesting chapters on Electron-optical Research at the AEG Forschungs-Institut 1928-1940, On the History of Scanning Electron Microscopy, of the Electron Microprobe, and of Early Contributions to Transmission Electron Microscopy, Random Recollections of the Early Days, Early History of Electron Microscopy in Czechoslovakia, Personal Reminiscences of Early Days in Electron, Megavolt Electron Microscopy, Cryo-Electron Microscopy and Ultramicrotomy: Reminiscences and Reflections, and much more. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in "Advances in Imaging and Electron Physics" series
Inorganic Materials
Author: Publisher:
ISBN:
Category : Chemistry, Inorganic
Languages : en
Pages : 1008
Book Description
Index of Conference Proceedings Received
Author: British Library. Lending DivisionPublisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 404
Book Description
Index of conference proceedings received by the BLL.
Author: British Library. Lending DivisionPublisher:
ISBN:
Category : Conference proceedings
Languages : en
Pages : 858
Book Description