Author: United States. Congress. Joint Committee ...Publisher:
ISBN:
Category :
Languages : en
Pages : 1640
Book Description
TID.
Author: Proceedings of Technical Meetings
Author: U.S. Atomic Energy CommissionPublisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 36
Book Description
Hearings
Author: United States. Congress. Joint Committee ...Publisher:
ISBN:
Category :
Languages : en
Pages : 1640
Book Description
Symposia in Fields Related to Atomic Energy
Author: Theodore F. DavisPublisher:
ISBN:
Category : Nuclear energy
Languages : en
Pages : 22
Book Description
28th European Symposium on Computer Aided Process Engineering
Author: Stefan RadlPublisher: Elsevier
ISBN: 0444642366
Category : Technology & Engineering
Languages : en
Pages : 1766
Book Description
28th European Symposium on Computer Aided Process Engineering, Volume 43 contains the papers presented at the 28th European Society of Computer-Aided Process Engineering (ESCAPE) event held in Graz, Austria June 10-13 , 2018. It is a valuable resource for chemical engineers, chemical process engineers, researchers in industry and academia, students, and consultants for chemical industries. Presents findings and discussions from the 28th European Society of Computer-Aided Process Engineering (ESCAPE) event
Nuclear Science Abstracts
Author: Committee prints
Author: United States. Congress. Joint Committee on Atomic EnergyPublisher:
ISBN:
Category :
Languages : en
Pages : 1068
Book Description
Contamination-Free Manufacturing for Semiconductors and Other Precision Products
Author: Robert P. DonovanPublisher: CRC Press
ISBN: 9780824703806
Category : Technology & Engineering
Languages : en
Pages : 466
Book Description
Recognizing the need for improved control measures in the manufacturing process of highly sensitized semiconductor technology, this practical reference provides in-depth and advanced treatment on the origins, procedures, and disposal of a variety of contaminants. It uses contemporary examples based on the latest hardware and processing apparatus to illustrate previously unavailable results and insights along with experimental and theoretical developments. Ensures the proper methods necessary to meet the standards established in the 1997 National Technology Roadmap for Semiconductors (NTRS)! Summarizing up-to-date control practices in the industry, Contamination-Free Manufacturing for Semiconductors and Other Precision Products: Details the physics and chemistry behind the mechanisms leading to contamination-induced failures Considers particles and molecular contaminants, including the entire spectrum of mass-based contaminants Outlines primary contamination problems and target control levels Reveals and offers solutions to inadequate areas of measurement capability and control technology Clarifies significant problems and decisions facing the industry by analyzing NTRS standards and contamination mechanisms Containing over 700 literature references, drawings, photographs, equations, and tables, Contamination-Free Manufacturing for Semiconductors and Other Precision Products is an essential reference for electrical and electronics, instrumentation, process, manufacturing, development, contamination control and quality engineers; physicists; and upper-level undergraduate and graduate students in these disciplines.
List
Author: Bibliography on Nuclear Reactor Fuel Reprocessing and Waste Disposal: Process chemistry and engineering
Author: T. F. ConnollyPublisher:
ISBN:
Category : Nuclear reactors
Languages : en
Pages : 312
Book Description