Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 55
Book Description
Applications of Time-sharing Computer in a Spectrochemistry Laboratory: Optical Emission and X-ray Fluorescence
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 55
Book Description
Publisher:
ISBN:
Category : Computers
Languages : en
Pages : 55
Book Description
Applications of a Time-sharing Computer in a Spectrochemistry Laboratory: Optical Emission and X-ray Fluorescence
Author: Stanley D. Rasberry
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 64
Book Description
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 64
Book Description
X-ray Wavelength Conversion Tables and Graphs for Qualitative Electron Probe Microanalysis
Author: Kurt F. J. Heinrich
Publisher:
ISBN:
Category : Chemistry, Analytic
Languages : en
Pages : 574
Book Description
Publisher:
ISBN:
Category : Chemistry, Analytic
Languages : en
Pages : 574
Book Description
NBS Technical Note
Author:
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 116
Book Description
Publisher:
ISBN:
Category : Physical instruments
Languages : en
Pages : 116
Book Description
Responding to National Needs
NIST Special Publication
Author:
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 1044
Book Description
Publisher:
ISBN:
Category : Weights and measures
Languages : en
Pages : 1044
Book Description
Monthly Catalog of United States Government Publications
Author: United States. Superintendent of Documents
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1464
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 1464
Book Description
Advances in X-Ray Analysis
Author: Charles Barrett
Publisher: Springer Science & Business Media
ISBN: 1461399661
Category : Science
Languages : en
Pages : 582
Book Description
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.
Publisher: Springer Science & Business Media
ISBN: 1461399661
Category : Science
Languages : en
Pages : 582
Book Description
The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single ions. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference.
Journal of Research of the National Bureau of Standards
Author: United States. National Bureau of Standards
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 826
Book Description
Publisher:
ISBN:
Category : Chemistry
Languages : en
Pages : 826
Book Description
Activities of the NBS Spectrochemical Analysis Section, July 1966 to June 1967
Author: Bourdon Francis Scribner
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 88
Book Description
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 88
Book Description