Author: Chester R. Fultz
Publisher:
ISBN:
Category : Ion sources
Languages : en
Pages : 28
Book Description
An Improved Ion Source for Mass Spectrometric Analysis of Solids
Author: Chester R. Fultz
Publisher:
ISBN:
Category : Ion sources
Languages : en
Pages : 28
Book Description
Publisher:
ISBN:
Category : Ion sources
Languages : en
Pages : 28
Book Description
Mass Spectrometric Analysis of Solids
Author: Arthur John Ahearn
Publisher:
ISBN:
Category : Mass spectrometry
Languages : en
Pages : 192
Book Description
Publisher:
ISBN:
Category : Mass spectrometry
Languages : en
Pages : 192
Book Description
Ion Mobility Spectrometry - Mass Spectrometry
Author: Charles L. Wilkins
Publisher: CRC Press
ISBN: 1439813256
Category : House & Home
Languages : en
Pages : 374
Book Description
The analytical power of ion mobility spectrometry-mass spectrometry (IMS-MS) instruments is poised to advance this technology from research to analytical laboratories. Exploring these developments at this critical juncture, Ion Mobility Spectrometry-Mass Spectrometry: Theory and Applications covers the tools, techniques, and applications involved w
Publisher: CRC Press
ISBN: 1439813256
Category : House & Home
Languages : en
Pages : 374
Book Description
The analytical power of ion mobility spectrometry-mass spectrometry (IMS-MS) instruments is poised to advance this technology from research to analytical laboratories. Exploring these developments at this critical juncture, Ion Mobility Spectrometry-Mass Spectrometry: Theory and Applications covers the tools, techniques, and applications involved w
Trace Analysis of Solids by Mass Spectrometry
Author: Richard E. Honig
Publisher:
ISBN:
Category :
Languages : en
Pages : 31
Book Description
The report covers work done to improve the performance of a mass spectrograph in the semi-quantitative analysis of solids. Reproducibility and accuracy were found to be limited by many instrumental factors, as well as sample inhomogeneity. A broad-based evaluation of highest-purity materials, to be used as compacting powders or counterelectrodes, has led to at least one source which can supply gold of adequate purity. The design and construction of a short-pulse ion source was finished which is of particular value in surface studies. Ionsensitive thin-film plates were developed which show marked improvements in line sharpness, halation, signal-to-noise ratio, and vacuum characteristics. (Author).
Publisher:
ISBN:
Category :
Languages : en
Pages : 31
Book Description
The report covers work done to improve the performance of a mass spectrograph in the semi-quantitative analysis of solids. Reproducibility and accuracy were found to be limited by many instrumental factors, as well as sample inhomogeneity. A broad-based evaluation of highest-purity materials, to be used as compacting powders or counterelectrodes, has led to at least one source which can supply gold of adequate purity. The design and construction of a short-pulse ion source was finished which is of particular value in surface studies. Ionsensitive thin-film plates were developed which show marked improvements in line sharpness, halation, signal-to-noise ratio, and vacuum characteristics. (Author).
Ion Formation from Organic Solids (IFOS III)
Author: Alfred Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642827187
Category : Science
Languages : en
Pages : 228
Book Description
The 3rd International Conference on Ion Formation from Organic Solids (IFOS III) was held at the University of Munster, September 16-18, 1985. The conference was attended by 60 invited scientists from all over the world. Of the 43 papers which were presented, 40 are included in these proceedings. The aim of IFOS III was to promote the exchange of results and new ideas between scientists actively working in the field of mass spectrometry of involatile materials. Various aspects of the ion formation process - realization and optimization, theoretical understanding and analytical application -were treated, as well as instrumental developments. Some emphasis was placed on recent developments in time-of-flight and Fourier transform ion cyclotron resonance mass spectrometry, and its impact on the mass spectrometry of involatile materials. The most important goal of the conference was to combine facets of the understanding of the most complex ion formation processes with the many different aspects of its analytical application. The participants came from a wide variety of different fields, including pure and applied physics and chemistry, medicine, pharmacy, and space research. Finally, on behalf of all the conference participants, I would like to thank Dr. W. Sichtermann and :\1iss I. Bekemeier for the perfect preparation and technical organization of the conference. The next conference in this series, IFOS IV, is planned for the autumn of 1987, in Munster.
Publisher: Springer Science & Business Media
ISBN: 3642827187
Category : Science
Languages : en
Pages : 228
Book Description
The 3rd International Conference on Ion Formation from Organic Solids (IFOS III) was held at the University of Munster, September 16-18, 1985. The conference was attended by 60 invited scientists from all over the world. Of the 43 papers which were presented, 40 are included in these proceedings. The aim of IFOS III was to promote the exchange of results and new ideas between scientists actively working in the field of mass spectrometry of involatile materials. Various aspects of the ion formation process - realization and optimization, theoretical understanding and analytical application -were treated, as well as instrumental developments. Some emphasis was placed on recent developments in time-of-flight and Fourier transform ion cyclotron resonance mass spectrometry, and its impact on the mass spectrometry of involatile materials. The most important goal of the conference was to combine facets of the understanding of the most complex ion formation processes with the many different aspects of its analytical application. The participants came from a wide variety of different fields, including pure and applied physics and chemistry, medicine, pharmacy, and space research. Finally, on behalf of all the conference participants, I would like to thank Dr. W. Sichtermann and :\1iss I. Bekemeier for the perfect preparation and technical organization of the conference. The next conference in this series, IFOS IV, is planned for the autumn of 1987, in Munster.
Field Ionization Mass Spectrometry
Author: Hans-D. Beckey
Publisher:
ISBN:
Category : Field desorption mass spectrometry
Languages : en
Pages : 376
Book Description
Field Ionization Mass Spectrometry focuses on developments in field ionization (FI) mass spectrometry and describes its applications in physical chemistry, with emphasis on mass spectrometric problems. Physico-chemical problems as well as problems of chemical analysis are considered based on issues such as the probability of field ionization; field dissociation and charge distribution; kinetics of ion decomposition in high fields; negative ions; surface diffusion; activation of FI emitters; and elucidation of the structures of organic compounds. This book is comprised of four chapters and beg.
Publisher:
ISBN:
Category : Field desorption mass spectrometry
Languages : en
Pages : 376
Book Description
Field Ionization Mass Spectrometry focuses on developments in field ionization (FI) mass spectrometry and describes its applications in physical chemistry, with emphasis on mass spectrometric problems. Physico-chemical problems as well as problems of chemical analysis are considered based on issues such as the probability of field ionization; field dissociation and charge distribution; kinetics of ion decomposition in high fields; negative ions; surface diffusion; activation of FI emitters; and elucidation of the structures of organic compounds. This book is comprised of four chapters and beg.
Cluster Secondary Ion Mass Spectrometry
Author: Christine M. Mahoney
Publisher: John Wiley & Sons
ISBN: 1118589246
Category : Science
Languages : en
Pages : 325
Book Description
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Publisher: John Wiley & Sons
ISBN: 1118589246
Category : Science
Languages : en
Pages : 325
Book Description
Explores the impact of the latest breakthroughs in cluster SIMS technology Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severely limited in its ability to characterize soft samples as a result of damage from the atomic source. Molecular samples were essentially destroyed during analysis, limiting the method's sensitivity and precluding compositional depth profiling. The use of new and emerging cluster ion beam technologies has all but eliminated these limitations, enabling researchers to enter into new fields once considered unattainable by the SIMS method. With contributions from leading mass spectrometry researchers around the world, Cluster Secondary Ion Mass Spectrometry: Principles and Applications describes the latest breakthroughs in instrumentation, and addresses best practices in cluster SIMS analysis. It serves as a compendium of knowledge on organic and polymeric surface and in-depth characterization using cluster ion beams. It covers topics ranging from the fundamentals and theory of cluster SIMS, to the important chemistries behind the success of the technique, as well as the wide-ranging applications of the technology. Examples of subjects covered include: Cluster SIMS theory and modeling Cluster ion source types and performance expectations Cluster ion beams for surface analysis experiments Molecular depth profiling and 3-D analysis with cluster ion beams Specialty applications ranging from biological samples analysis to semiconductors/metals analysis Future challenges and prospects for cluster SIMS This book is intended to benefit any scientist, ranging from beginning to advanced in level, with plenty of figures to help better understand complex concepts and processes. In addition, each chapter ends with a detailed reference set to the primary literature, facilitating further research into individual topics where desired. Cluster Secondary Ion Mass Spectrometry: Principles and Applications is a must-have read for any researcher in the surface analysis and/or imaging mass spectrometry fields.
Secondary Ion Mass Spectrometry SIMS III
Author: A. Benninghoven
Publisher: Springer Science & Business Media
ISBN: 3642881521
Category : Science
Languages : en
Pages : 455
Book Description
Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
Publisher: Springer Science & Business Media
ISBN: 3642881521
Category : Science
Languages : en
Pages : 455
Book Description
Following the biannual meetings in MUnster (1977) and Stanford (1979) the Third International Conference on Secondary Ion Mass Spectroscopy was held in Budapest from August 31 to September 5, 1981. The Conference was attended by about 250 participants. The success of the 1981 Conference in Budapest was especially due to the excellent preparation and organization by the Local Organizing Committee. We would also like to acknowledge the generous hospitality and cooperation of the Hungarian Academy of Sciences. Japan was chosen to be the location for the next conference in 1983. SIMS conferences are devoted to two main issues: improving the application of SIMS in different and especially new fields, and understanding the ion formation process. Needless to say, there is a very strong interaction be tween these two issues. The major reason for the rapid increase in SIMS activities in the last few years is the fact that SIMS is a powerful tool for bulk, thin-film, and surface analysis. Today it is extensively and successfully applied in such different fields as depth profiling and imaging of semiconductor devices, in isotope analysis of minerals, in imaging biological tissues, in the study of catalysts and catalytic reactions, in oxide-layer analysis on metals in drug detection, and in the analysis of body fluids.
An Electron Bombardment Ion Source for Mass Spectrometry of Solids
Author: Alan Emerson Cameron
Publisher:
ISBN:
Category : Ion sources
Languages : en
Pages : 18
Book Description
Publisher:
ISBN:
Category : Ion sources
Languages : en
Pages : 18
Book Description
Inorganic Mass Spectrometry
Author: F. Adams
Publisher: Wiley-Interscience
ISBN:
Category : Science
Languages : en
Pages : 424
Book Description
This monograph covers the recent developments in the techniques of mass spectrometry which employ inductively coupled plasma, glow discharge, spark source, laser microprobe, isotope dilution, and the modern instruments for secondary ion mass spectrometry.
Publisher: Wiley-Interscience
ISBN:
Category : Science
Languages : en
Pages : 424
Book Description
This monograph covers the recent developments in the techniques of mass spectrometry which employ inductively coupled plasma, glow discharge, spark source, laser microprobe, isotope dilution, and the modern instruments for secondary ion mass spectrometry.