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Author: Joe Kelly Publisher: Artech House Publishers ISBN: 9781580537094 Category : Embedded computer systems Languages : en Pages : 0
Book Description
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.
Author: Joe Kelly Publisher: Artech House Publishers ISBN: 9781580537094 Category : Embedded computer systems Languages : en Pages : 0
Book Description
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.
Author: Keith B. Schaub Publisher: Artech House ISBN: 9781580538480 Category : Technology & Engineering Languages : en Pages : 276
Book Description
Technological advances have created a need for the merger and rethinking of past testing approaches for wireless equipment. This first-of-its-kind resource offers professionals an in-depth overview of cutting-edge RF (radio frequency) and SOC (system on a chip) product testing for wireless communications.
Author: Jose Moreira Publisher: Artech House ISBN: 1608079864 Category : Technology & Engineering Languages : en Pages : 709
Book Description
This second edition of An Engineer's Guide to Automated Testing of High-Speed Interfaces provides updates to reflect current state-of-the-art high-speed digital testing with automated test equipment technology (ATE). Featuring clear examples, this one-stop reference covers all critical aspects of automated testing, including an introduction to high-speed digital basics, a discussion of industry standards, ATE and bench instrumentation for digital applications, and test and measurement techniques for characterization and production environment. Engineers learn how to apply automated test equipment for testing high-speed digital I/O interfaces and gain a better understanding of PCI-Express 4, 100Gb Ethernet, and MIPI while exploring the correlation between phase noise and jitter. This updated resource provides expanded material on 28/32 Gbps NRZ testing and wireless testing that are becoming increasingly more pertinent for future applications. This book explores the current trend of merging high-speed digital testing within the fields of photonic and wireless testing.
Author: Michael Hrobak Publisher: Springer ISBN: 3658097639 Category : Technology & Engineering Languages : en Pages : 449
Book Description
Michael Hrobak studied hybrid integrated front end modules for high frequency measurement equipment and especially for synthetic automatic test systems. Recent developments of innovative, critical millimeter-wave components like frequency multipliers, directional couplers, filters, triple balanced mixers and power detectors are illustrated by the author separately and in combination.
Author: Krzysztof Iniewski Publisher: Artech House ISBN: 1596933186 Category : Computers Languages : en Pages : 453
Book Description
Supported with over 280 illustrations and over 160 equations, the book offers cutting-edge guidance on designing integrated circuits for wireless biosensing, body implants, biosensing interfaces, and molecular biology. You discover innovative design techniques and novel materials to help you achieve higher levels circuit and system performance.
Author: Publisher: ISBN: Category : Languages : en Pages : 56
Book Description
Advanced Packaging serves the semiconductor packaging, assembly and test industry. Strategically focused on emerging and leading-edge methods for manufacturing and use of advanced packages.
Author: Publisher: ISBN: Category : Languages : en Pages : 32
Book Description
Advanced Packaging serves the semiconductor packaging, assembly and test industry. Strategically focused on emerging and leading-edge methods for manufacturing and use of advanced packages.
Author: Laung-Terng Wang Publisher: Morgan Kaufmann ISBN: 012373973X Category : Computers Languages : en Pages : 856
Book Description
Written by a stellar team of field experts, this title is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that allow VSLI designers, DFT practitioners, and students to master quickly System-on-Chip Test architectures, memory, and analog/mixed-signal designs.
Author: Ken-ya Hashimoto Publisher: Artech House ISBN: 1596933224 Category : Technology & Engineering Languages : en Pages : 293
Book Description
This timely book presents a thorough overview of RF BAW filters, covering a vast range of technologies, optimal device design, filter topologies, packaging, fabrication processes, and high quality piezoelectric thin films. Moreover, the book discusses the integration of BAW filters in RF systems.
Author: Joe Kelly
Author: Joe Kelly
Author: Keith B. Schaub
Author: Jose Moreira
Author: Michael Hrobak
Author: Krzysztof Iniewski
Author: 
Author: 
Author: 
Author: Laung-Terng Wang
Author: Ken-ya Hashimoto