Author: Thomas C. Furnas
Publisher:
ISBN:
Category : Spectrograph
Languages : en
Pages : 32
Book Description
A Program of Basic Research to Study X-ray Spectra in the Region 15 to 50 Å
Author: Thomas C. Furnas
Publisher:
ISBN:
Category : Spectrograph
Languages : en
Pages : 32
Book Description
Publisher:
ISBN:
Category : Spectrograph
Languages : en
Pages : 32
Book Description
A Program of Basic Research to Study X-ray Spectra in the Region 15 to 50 Å
Author: Donald W. Beard
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 36
Book Description
Publisher:
ISBN:
Category : Spectrum analysis
Languages : en
Pages : 36
Book Description
Program of Basic Research to Study X-ray Spectra in the Region 15 to 50 A
A Program of Basic Research to Study X-ray Spectra in the Region 15 to 50 Angstroms
Author: THOMAS C. JR. FURNAS
Publisher:
ISBN:
Category :
Languages : en
Pages : 1
Book Description
Performance tests were completed on a vacuum spectrographic system. High-intensity X-ray excitation was found to produce low working intensities, and was not useful in the detection and analysis of low energy X-rays. Electron excitation provided satisfactory intensities, and made possible the measurement of radiation as 'soft' as carbon (44A), as well as the L series spectra from transitional elements. A wave length shift in the L alpha line was observed between metallic iron and iron in the form of the oxide. A Bendix M-304 detector was studied and found to give non-proportional response to incident photon energy, but it did maintain a low noise level. (Author).
Publisher:
ISBN:
Category :
Languages : en
Pages : 1
Book Description
Performance tests were completed on a vacuum spectrographic system. High-intensity X-ray excitation was found to produce low working intensities, and was not useful in the detection and analysis of low energy X-rays. Electron excitation provided satisfactory intensities, and made possible the measurement of radiation as 'soft' as carbon (44A), as well as the L series spectra from transitional elements. A wave length shift in the L alpha line was observed between metallic iron and iron in the form of the oxide. A Bendix M-304 detector was studied and found to give non-proportional response to incident photon energy, but it did maintain a low noise level. (Author).
U.S. Government Research Reports
Advances in X-Ray Analysis
Author: Gavin R. Mallett
Publisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Publisher: Springer Science & Business Media
ISBN: 1468476335
Category : Science
Languages : en
Pages : 554
Book Description
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Bibliography of Bibliographies (unclassified Title)
Author: Defense Documentation Center (U.S.)
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 124
Book Description
Publisher:
ISBN:
Category : Science
Languages : en
Pages : 124
Book Description
Bibliography of Bibliographies (unclassified Title); Supplement
Author: Defense Documentation Center (U.S.)
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 114
Book Description
Publisher:
ISBN:
Category : Engineering
Languages : en
Pages : 114
Book Description
Keywords Index to U.S. Government Technical Reports
Author: United States. Department of Commerce. Office of Technical Services
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 990
Book Description
Publisher:
ISBN:
Category : Government publications
Languages : en
Pages : 990
Book Description
A Review of the Air Force Materials Research and Development Program
Author: Air Force Materials Laboratory (U.S.)
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 294
Book Description
Technical reports published by the Air Force Materials Laboratoy during the period 1 July 1962 - 30 June 1963 are abstracted herein. Reports on reseqrch conducted by the Air Force Materials Laboratory personnel as well as that conducted on contract are included. These reports cover basic and applied research in the materials area being conducted by the Metals and Ceramics Division, Non-metallic Materials Division, Materials Physics Division, Manufacturing Technology Division, and Materials Applications Division of the Air Force Materials Laboratory.
Publisher:
ISBN:
Category : Materials
Languages : en
Pages : 294
Book Description
Technical reports published by the Air Force Materials Laboratoy during the period 1 July 1962 - 30 June 1963 are abstracted herein. Reports on reseqrch conducted by the Air Force Materials Laboratory personnel as well as that conducted on contract are included. These reports cover basic and applied research in the materials area being conducted by the Metals and Ceramics Division, Non-metallic Materials Division, Materials Physics Division, Manufacturing Technology Division, and Materials Applications Division of the Air Force Materials Laboratory.