A Diagnostic Computer System for Fault Diagnosis of Digital Circuits PDF Download

Author: Fredric Rowland Boswell
Publisher:
ISBN:
Category :
Languages : en
Pages : 458

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Author: Herbert Y. Chang
Publisher: Krieger Publishing Company
ISBN:
Category : Computers
Languages : en
Pages : 186

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Author: V. N. Yarmolik
Publisher: John Wiley & Sons
ISBN:
Category : Technology & Engineering
Languages : en
Pages : 216

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Book Description
The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits.

Author: Ruey-wen Liu
Publisher: Springer Science & Business Media
ISBN: 1461597471
Category : Computers
Languages : en
Pages : 290

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Book Description
IS THE TOPIC ANALOG TESTING AND DIAGNOSIS TIMELY? Yes, indeed it is. Testing and Diagnosis is an important topic and fulfills a vital need for the electronic industry. The testing and diagnosis of digital electronic circuits has been successfuIly developed to the point that it can be automated. Unfortu nately, its development for analog electronic circuits is still in its Stone Age. The engineer's intuition is still the most powerful tool used in the industry! There are two reasons for this. One is that there has been no pressing need from the industry. Analog circuits are usuaIly small in size. Sometimes, the engineer's experience and intuition are sufficient to fulfill the need. The other reason is that there are no breakthrough results from academic re search to provide the industry with critical ideas to develop tools. This is not because of a lack of effort. Both academic and industrial research groups have made major efforts to look into this problem. Unfortunately, the prob lem for analog circuits is fundamentally different from and much more diffi cult than its counterpart for digital circuits. These efforts have led to some important findings, but are still not at the point of being practicaIly useful. However, these situations are now changing. The current trend for the design of VLSI chips is to use analog/digital hybrid circuits, instead of digital circuits from the past. Therefore, even Ix x Preface though the analog circuit may be small, the total circuit under testing is large.

Author: Henry B. Metcalf
Publisher:
ISBN:
Category : Computer programs
Languages : en
Pages : 28

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A computer program, NASAP (Network Analysis for Systems Applications Program), has been adapted to perform fault diagnosis in frequency-dependent systems. The program simulates a short circuit and an open circuit for each network parameter and prints out a modified transfer function of the network corresponding to each simulated failure. Experimental and simulated data are subjected to correlation and variance analysis in order to rank all parameters according to probability of failure in the network model. The program lists, at present, single failures in order to decreasing probability. Possible extensions of the program to multiple failures are examined.

Author: Richard Saeks
Publisher: Marcel Dekker
ISBN:
Category : Business & Economics
Languages : en
Pages : 264

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Book Description
Information on the development of rational procedures for detection, location, & prediction of faults in a variety of systems. Includes a chapter on computer-aided fault analysis.

Author: Arthur D. Friedman
Publisher: Prentice Hall
ISBN:
Category : Computers
Languages : en
Pages : 252

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Author: Fangming Ye
Publisher: Springer
ISBN: 3319402102
Category : Technology & Engineering
Languages : en
Pages : 154

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Book Description
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design. • Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.

Author:
Publisher:
ISBN:
Category : Aeronautics
Languages : en
Pages : 836

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Author: Library of Congress. Copyright Office
Publisher: Copyright Office, Library of Congress
ISBN:
Category : Copyright
Languages : en
Pages : 1076

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