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Author: Lih-Tyng Hwang Publisher: John Wiley & Sons ISBN: 1119289661 Category : Technology & Engineering Languages : en Pages : 602
Book Description
An interdisciplinary guide to enabling technologies for 3D ICs and 5G mobility, covering packaging, design to product life and reliability assessments Features an interdisciplinary approach to the enabling technologies and hardware for 3D ICs and 5G mobility Presents statistical treatments and examples with tools that are easily accessible, such as Microsoft’s Excel and Minitab Fundamental design topics such as electromagnetic design for logic and RF/passives centric circuits are explained in detail Provides chapter-wise review questions and powerpoint slides as teaching tools
Author: Lih-Tyng Hwang Publisher: John Wiley & Sons ISBN: 1119289661 Category : Technology & Engineering Languages : en Pages : 602
Book Description
An interdisciplinary guide to enabling technologies for 3D ICs and 5G mobility, covering packaging, design to product life and reliability assessments Features an interdisciplinary approach to the enabling technologies and hardware for 3D ICs and 5G mobility Presents statistical treatments and examples with tools that are easily accessible, such as Microsoft’s Excel and Minitab Fundamental design topics such as electromagnetic design for logic and RF/passives centric circuits are explained in detail Provides chapter-wise review questions and powerpoint slides as teaching tools
Author: Kalyan Biswas Publisher: John Wiley & Sons ISBN: 1394188943 Category : Technology & Engineering Languages : en Pages : 340
Book Description
Comprehensive reference on the fundamental principles and basic physics dictating metal–oxide–semiconductor field-effect transistor (MOSFET) operation Advanced Nanoscale MOSFET Architectures provides an in-depth review of modern metal–oxide–semiconductor field-effect transistor (MOSFET) device technologies and advancements, with information on their operation, various architectures, fabrication, materials, modeling and simulation methods, circuit applications, and other aspects related to nanoscale MOSFET technology. The text begins with an introduction to the foundational technology before moving on to describe challenges associated with the scaling of nanoscale devices. Other topics covered include device physics and operation, strain engineering for highly scaled MOSFETs, tunnel FET, graphene based field effect transistors, and more. The text also compares silicon bulk and devices, nanosheet transistors and introduces low-power circuit design using advanced MOSFETs. Additional topics covered include: High-k gate dielectrics and metal gate electrodes for multi-gate MOSFETs, covering gate stack processing and metal gate modification Strain engineering in 3D complementary metal-oxide semiconductors (CMOS) and its scaling impact, and strain engineering in silicon–germanium (SiGe) FinFET and its challenges and future perspectives TCAD simulation of multi-gate MOSFET, covering model calibration and device performance for analog and RF applications Description of the design of an analog amplifier circuit using digital CMOS technology of SCL for ultra-low power VLSI applications Advanced Nanoscale MOSFET Architectures helps readers understand device physics and design of new structures and material compositions, making it an important resource for the researchers and professionals who are carrying out research in the field, along with students in related programs of study.
Author: John H. Lau Publisher: Springer ISBN: 9811372241 Category : Technology & Engineering Languages : en Pages : 381
Book Description
Heterogeneous integration uses packaging technology to integrate dissimilar chips, LED, MEMS, VCSEL, etc. from different fabless houses and with different functions and wafer sizes into a single system or subsystem. How are these dissimilar chips and optical components supposed to talk to each other? The answer is redistribution layers (RDLs). This book addresses the fabrication of RDLs for heterogeneous integrations, and especially focuses on RDLs on: A) organic substrates, B) silicon substrates (through-silicon via (TSV)-interposers), C) silicon substrates (bridges), D) fan-out substrates, and E) ASIC, memory, LED, MEMS, and VCSEL systems. The book offers a valuable asset for researchers, engineers, and graduate students in the fields of semiconductor packaging, materials sciences, mechanical engineering, electronic engineering, telecommunications, networking, etc.
Author: P. Satish Rama Chowdary Publisher: Springer Nature ISBN: 981153828X Category : Technology & Engineering Languages : en Pages : 762
Book Description
This book discusses the latest developments and outlines future trends in the fields of microelectronics, electromagnetics and telecommunication. It includes original research presented at the International Conference on Microelectronics, Electromagnetics and Telecommunication (ICMEET 2019), organized by the Department of ECE, Raghu Institute of Technology, Andhra Pradesh, India. Written by scientists, research scholars and practitioners from leading universities, engineering colleges and R&D institutes around the globe, the papers share the latest breakthroughs in and promising solutions to the most important issues facing today’s society.
Author: Allen W. Scott Publisher: Wiley-IEEE Press ISBN: 9780470129487 Category : Technology & Engineering Languages : en Pages : 0
Book Description
The only source for practical, real-world information on RF measurements for cellular phones and wireless data systems It is predicted that by the year 2010, all digital wireless communications equipment—including cellular, PCS, and 3G phones; wireless LANs; GPS navigation systems; and DBS TV—will have data transfer capabilities of over 1 Mbps. Now, as this significant turning point quickly approaches, this book presents everything industry professionals need to know about the Radio Frequency (RF) measurements and tests that must be made on this new generation of digital wireless communications equipment. Presenting just enough theory as is absolutely required for comprehension, RF Measurements for Cellular Phones and Wireless Data Systems: Provides a review of basic RF principles and terminology Describes RF measurement equipment, including signal generators, power meters, frequency meters, vector network analyzers, spectrum analyzers, and vector signal analyzers Explains the RF devices that are used in cellular phones and wireless data transmission equipment—how they work, what their critical performance parameters are, how they're tested, and typical test results Illustrates the testing of RF devices and systems with digitally modulated signals that represent the voice, video, or data that the RF wave is carrying RF Measurements for Cellular Phones and Wireless Data Systems has been written to serve as the industry standard for RF measurements and testing. It is an indispensable resource for engineers, technicians, and managers involved in the construction, installation, or maintenance of cell phones and wireless data equipment.
Author: Ahmed H. Abdelrahman Publisher: Morgan & Claypool Publishers ISBN: 1627057064 Category : Technology & Engineering Languages : en Pages : 177
Book Description
In recent years, transmitarray antennas have attracted growing interest with many antenna researchers. Transmitarrays combines both optical and antenna array theory, leading to a low profile design with high gain, high radiation efficiency, and versatile radiation performance for many wireless communication systems. In this book, comprehensive analysis, new methodologies, and novel designs of transmitarray antennas are presented. Detailed analysis for the design of planar space-fed array antennas is presented. The basics of aperture field distribution and the analysis of the array elements are described. The radiation performances (directivity and gain) are discussed using array theory approach, and the impacts of element phase errors are demonstrated. The performance of transmitarray design using multilayer frequency selective surfaces (M-FSS) approach is carefully studied, and the transmission phase limit which are generally independent from the selection of a specific element shape is revealed. The maximum transmission phase range is determined based on the number of layers, substrate permittivity, and the separations between layers. In order to reduce the transmitarray design complexity and cost, three different methods have been investigated. As a result, one design is performed using quad-layer cross-slot elements with no dielectric material and another using triple-layer spiral dipole elements. Both designs were fabricated and tested at X-Band for deep space communications. Furthermore, the radiation pattern characteristics were studied under different feed polarization conditions and oblique angles of incident field from the feed. New design methodologies are proposed to improve the bandwidth of transmitarray antennas through the control of the transmission phase range of the elements. These design techniques are validated through the fabrication and testing of two quad-layer transmitarray antennas at Ku-band. A single-feed quad-beam transmitarray antenna with 50 degrees elevation separation between the beams is investigated, designed, fabricated, and tested at Ku-band. In summary, various challenges in the analysis and design of transmitarray antennas are addressed in this book. New methodologies to improve the bandwidth of transmitarray antennas have been demonstrated. Several prototypes have been fabricated and tested, demonstrating the desirable features and potential new applications of transmitarray antennas.
Author: Rabindranath Bera Publisher: Springer ISBN: 9811079013 Category : Technology & Engineering Languages : en Pages : 923
Book Description
The book provides insights of International Conference in Communication, Devices and Networking (ICCDN 2017) organized by the Department of Electronics and Communication Engineering, Sikkim Manipal Institute of Technology, Sikkim, India during 3 – 4 June, 2017. The book discusses latest research papers presented by researchers, engineers, academicians and industry professionals. It also assists both novice and experienced scientists and developers, to explore newer scopes, collect new ideas and establish new cooperation between research groups and exchange ideas, information, techniques and applications in the field of electronics, communication, devices and networking.
Author: Yan Li Publisher: Springer Nature ISBN: 9811570906 Category : Technology & Engineering Languages : en Pages : 629
Book Description
This book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research and development findings regarding this key industry trend, including TSV, die processing, micro-bumps for LMI and MMI, direct bonding and advanced materials, as well as quality, reliability, fault isolation, and failure analysis for 3D microelectronic packages. Images, tables, and didactic schematics are used to illustrate and elaborate on the concepts discussed. Readers will gain a general grasp of 3D packaging, quality and reliability concerns, and common causes of failure, and will be introduced to developing areas and remaining gaps in 3D packaging that can help inspire future research and development.
Author: John H. Lau Publisher: McGraw-Hill Professional Publishing ISBN: Category : Technology & Engineering Languages : en Pages : 600
Book Description
A guide to flip chip technologies, for professionals in flip chip and MCM research and development, and for engineers and technical managers choosing design and manufacturing processes for electronic packaging and interconnect systems. Discusses economic, design, material, quality, and reliability issues of flip chip technologies, and details aspects of classical solder-bumped flip chip interconnect technologies; the next generations of flip chip technologies; and known-good-die testing for multiple module applications. Annotation copyright by Book News, Inc., Portland, OR
Author: Lih-Tyng Hwang
Author: Lih-Tyng Hwang
Author: Kalyan Biswas
Author: John H. Lau
Author: Kim Ho Yeap
Author: P. Satish Rama Chowdary
Author: Allen W. Scott
Author: Ahmed H. Abdelrahman
Author: Rabindranath Bera
Author: Yan Li
Author: John H. Lau