2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) PDF Download
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Author: IEEE Staff Publisher: ISBN: 9781538649305 Category : Languages : en Pages :
Book Description
IPFA 2018 is devoted to the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability
Author: IEEE Staff Publisher: ISBN: 9781538649305 Category : Languages : en Pages :
Book Description
IPFA 2018 is devoted to the fundamental understanding of the electrical and physical characterization techniques and associated technologies that assist in probing the nature of wear out and failure in conventional and new CMOS devices, in turn resulting in improved knowhow of the physics of device circuit module failure that serves as critical input for future design for reliability
Author: Philip Ho Publisher: Institute of Electrical & Electronics Engineers(IEEE) ISBN: 9780780377226 Category : Integrated circuits Languages : en Pages : 220
Book Description
This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.
Author: IEEE Staff
Author: IEEE Staff
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Author: IEEE Singapore Section
Author: Philip Ho
Author: IEEE.
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Author: Souvik Mahapatra
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