Author:
Publisher:
ISBN: 9781509050529
Category :
Languages : en
Pages :
Book Description
SMACD 2017
2017 14th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
Author: IEEE Staff
Publisher:
ISBN: 9781509050536
Category :
Languages : en
Pages :
Book Description
SMACD is a dedicated forum devoted to Design Methods and Tools for Analog, Mixed signal, RF (AMS RF) and multi domain (MEMs, nanoelectronic, optoelectronic, biological, etc ) integrated circuits and systems
Publisher:
ISBN: 9781509050536
Category :
Languages : en
Pages :
Book Description
SMACD is a dedicated forum devoted to Design Methods and Tools for Analog, Mixed signal, RF (AMS RF) and multi domain (MEMs, nanoelectronic, optoelectronic, biological, etc ) integrated circuits and systems
SMACD 2017
Author:
Publisher:
ISBN:
Category : Electronic circuit design
Languages : en
Pages :
Book Description
Publisher:
ISBN:
Category : Electronic circuit design
Languages : en
Pages :
Book Description
Special Issue on the International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD 2015) for Integration, the VLSI Journal and Special Issue on the 14th International Conference on Computer-Aided Design and Computer Graphics (CAD/GRAPHICS 2015)
2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
Author: IEEE Staff
Publisher:
ISBN: 9781509004911
Category :
Languages : en
Pages :
Book Description
SMACD is a dedicated forum devoted to Design Methods and Tools for Analog, Mixed signal, RF (AMS RF) and multi domain (MEMs, nanoelectronic, optoelectronic, biological, etc ) integrated circuits and systems
Publisher:
ISBN: 9781509004911
Category :
Languages : en
Pages :
Book Description
SMACD is a dedicated forum devoted to Design Methods and Tools for Analog, Mixed signal, RF (AMS RF) and multi domain (MEMs, nanoelectronic, optoelectronic, biological, etc ) integrated circuits and systems
Advanced VLSI Design and Testability Issues
Author: Suman Lata Tripathi
Publisher: CRC Press
ISBN: 1000168158
Category : Technology & Engineering
Languages : en
Pages : 379
Book Description
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.
Publisher: CRC Press
ISBN: 1000168158
Category : Technology & Engineering
Languages : en
Pages : 379
Book Description
This book facilitates the VLSI-interested individuals with not only in-depth knowledge, but also the broad aspects of it by explaining its applications in different fields, including image processing and biomedical. The deep understanding of basic concepts gives you the power to develop a new application aspect, which is very well taken care of in this book by using simple language in explaining the concepts. In the VLSI world, the importance of hardware description languages cannot be ignored, as the designing of such dense and complex circuits is not possible without them. Both Verilog and VHDL languages are used here for designing. The current needs of high-performance integrated circuits (ICs) including low power devices and new emerging materials, which can play a very important role in achieving new functionalities, are the most interesting part of the book. The testing of VLSI circuits becomes more crucial than the designing of the circuits in this nanometer technology era. The role of fault simulation algorithms is very well explained, and its implementation using Verilog is the key aspect of this book. This book is well organized into 20 chapters. Chapter 1 emphasizes on uses of FPGA on various image processing and biomedical applications. Then, the descriptions enlighten the basic understanding of digital design from the perspective of HDL in Chapters 2–5. The performance enhancement with alternate material or geometry for silicon-based FET designs is focused in Chapters 6 and 7. Chapters 8 and 9 describe the study of bimolecular interactions with biosensing FETs. Chapters 10–13 deal with advanced FET structures available in various shapes, materials such as nanowire, HFET, and their comparison in terms of device performance metrics calculation. Chapters 14–18 describe different application-specific VLSI design techniques and challenges for analog and digital circuit designs. Chapter 19 explains the VLSI testability issues with the description of simulation and its categorization into logic and fault simulation for test pattern generation using Verilog HDL. Chapter 20 deals with a secured VLSI design with hardware obfuscation by hiding the IC’s structure and function, which makes it much more difficult to reverse engineer.
Ageing of Integrated Circuits
Author: Basel Halak
Publisher: Springer Nature
ISBN: 3030237818
Category : Technology & Engineering
Languages : en
Pages : 228
Book Description
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Publisher: Springer Nature
ISBN: 3030237818
Category : Technology & Engineering
Languages : en
Pages : 228
Book Description
This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits.
Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2015 International Conference on
2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
Author:
Publisher:
ISBN: 9781509004904
Category : Electronic circuit design
Languages : en
Pages :
Book Description
Annotation SMACD is a dedicated forum devoted to Design Methods and Tools for Analog, Mixed signal, RF (AMS RF) and multi domain (MEMs, nanoelectronic, optoelectronic, biological, etc ) integrated circuits and systems.
Publisher:
ISBN: 9781509004904
Category : Electronic circuit design
Languages : en
Pages :
Book Description
Annotation SMACD is a dedicated forum devoted to Design Methods and Tools for Analog, Mixed signal, RF (AMS RF) and multi domain (MEMs, nanoelectronic, optoelectronic, biological, etc ) integrated circuits and systems.
Noise in Nanoscale Semiconductor Devices
Author: Tibor Grasser
Publisher: Springer Nature
ISBN: 3030375005
Category : Technology & Engineering
Languages : en
Pages : 724
Book Description
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
Publisher: Springer Nature
ISBN: 3030375005
Category : Technology & Engineering
Languages : en
Pages : 724
Book Description
This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.