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International Test Conference 2000

International Test Conference 2000 PDF Author: IEEE, Press Staff
Publisher: IEEE
ISBN: 9780780365490
Category : Computers
Languages : en
Pages :

Book Description

International Test Conference 2000

International Test Conference 2000 PDF Author: IEEE, Press Staff
Publisher: IEEE
ISBN: 9780780365490
Category : Computers
Languages : en
Pages :

Book Description

2000 IEEE International Test Conference

2000 IEEE International Test Conference PDF Author:
Publisher:
ISBN: 9780780365476
Category : Electronic digital computers
Languages : en
Pages : 1158

Book Description

2000 International Test Conference

2000 International Test Conference PDF Author: IEEE Computer Society Staff
Publisher:
ISBN:
Category :
Languages : en
Pages :

Book Description

International Test Conference 2000

International Test Conference 2000 PDF Author:
Publisher:
ISBN: 9780780365483
Category :
Languages : en
Pages :

Book Description

2005 IEEE International Test Conference (ITC)

2005 IEEE International Test Conference (ITC) PDF Author: International Test Conference
Publisher:
ISBN:
Category :
Languages : en
Pages : 0

Book Description

2006 IEEE International Test Conference

2006 IEEE International Test Conference PDF Author: International Test Conference
Publisher:
ISBN:
Category :
Languages : en
Pages : 563

Book Description

Proceedings, 2016 IEEE International Test Conference (ITC)

Proceedings, 2016 IEEE International Test Conference (ITC) PDF Author:
Publisher:
ISBN: 9781467387736
Category :
Languages : en
Pages :

Book Description

2000 IEEE International Conference on Microelectronic Test Structures

2000 IEEE International Conference on Microelectronic Test Structures PDF Author: IEEE Electron Devices Society
Publisher: IEEE Standards Office
ISBN: 9780780362765
Category : Technology & Engineering
Languages : en
Pages : 251

Book Description
These conference proceedings cover such topics as: CD meteorology; device characterization; yield and interconnects; poster session; matching; reliability; parameter extraction; and process characterization.

Reliability, Availability and Serviceability of Networks-on-Chip

Reliability, Availability and Serviceability of Networks-on-Chip PDF Author: Érika Cota
Publisher: Springer Science & Business Media
ISBN: 1461407915
Category : Technology & Engineering
Languages : en
Pages : 220

Book Description
This book presents an overview of the issues related to the test, diagnosis and fault-tolerance of Network on Chip-based systems. It is the first book dedicated to the quality aspects of NoC-based systems and will serve as an invaluable reference to the problems, challenges, solutions, and trade-offs related to designing and implementing state-of-the-art, on-chip communication architectures.

Advances in Electronic Testing

Advances in Electronic Testing PDF Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 0387294090
Category : Technology & Engineering
Languages : en
Pages : 431

Book Description
This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.
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