X-Ray Optics - The Diffraction of X-Rays by Finite and Imperfect Crystals PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download X-Ray Optics - The Diffraction of X-Rays by Finite and Imperfect Crystals PDF full book. Access full book title X-Ray Optics - The Diffraction of X-Rays by Finite and Imperfect Crystals by A.J.C. Wilson. Download full books in PDF and EPUB format.
Author: A.J.C. Wilson Publisher: Detzer Press ISBN: 9781447416203 Category : Science Languages : en Pages : 134
Book Description
This fascinating text contains a detailed treatise on the use of X-Ray optics in the taxonomy of minerals and gem stones. An interesting and informative book on the subject, X-Ray Optics - The Diffraction of X-Rays by Finite and Imperfect Crystals is a must-have for anyone with an interest the study of crystals and constitutes a great addition to any gemmological collection. Arthur James Cochran Wilson (28 November 1914 - 1 July 1995) was a Canadian crystallographer, most famous for his contributions to X-ray crystallography and elected as a Fellow of the Royal Society in 1963. This book has been elected for republication now due to its immense educational value, and is proudly republished here complete with a new introduction to the subject.
Author: A.J.C. Wilson Publisher: Detzer Press ISBN: 9781447416203 Category : Science Languages : en Pages : 134
Book Description
This fascinating text contains a detailed treatise on the use of X-Ray optics in the taxonomy of minerals and gem stones. An interesting and informative book on the subject, X-Ray Optics - The Diffraction of X-Rays by Finite and Imperfect Crystals is a must-have for anyone with an interest the study of crystals and constitutes a great addition to any gemmological collection. Arthur James Cochran Wilson (28 November 1914 - 1 July 1995) was a Canadian crystallographer, most famous for his contributions to X-ray crystallography and elected as a Fellow of the Royal Society in 1963. This book has been elected for republication now due to its immense educational value, and is proudly republished here complete with a new introduction to the subject.
Author: René Guinebretière Publisher: John Wiley & Sons ISBN: 1118613953 Category : Technology & Engineering Languages : en Pages : 290
Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Author: G. Brown Publisher: The Mineralogical Society of Great Britain and Ireland ISBN: 0903056089 Category : Science Languages : en Pages : 518
Book Description
Structures of layer silicates; order-disorder in clay mineral structures; interlayer and intercalation complexes of clay minerals; interstratified clay minerals; X-ray diffraction procedures for clay mineral identification; associated minerals; quantitative X-ray mineral analysis of clays; appendix: tables for the determination of d in Å from 20 for the Ka and Kb radiations of copper, cobalt and iron.
Author: Mario Birkholz Publisher: John Wiley & Sons ISBN: 3527607048 Category : Technology & Engineering Languages : en Pages : 378
Book Description
With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner.
Author: Publisher: Newnes ISBN: 0080993710 Category : Science Languages : en Pages : 1748
Book Description
The first edition of the Handbook of Clay Science published in 2006 assembled the scattered literature on the varied and diverse aspects that make up the discipline of clay science. The topics covered range from the fundamental structures (including textures) and properties of clays and clay minerals, through their environmental, health and industrial applications, to their analysis and characterization by modern instrumental techniques. Also included are the clay-microbe interaction, layered double hydroxides, zeolites, cement hydrates, and genesis of clay minerals as well as the history and teaching of clay science. The 2e adds new information from the intervening 6 years and adds some important subjects to make this the most comprehensive and wide-ranging coverage of clay science in one source in the English language. - Provides up-to-date, comprehensive information in a single source - Covers applications of clays, as well as the instrumental analytical techniques - Provides a truly multidisciplinary approach to clay science
Author: Gubicza, Jen? Publisher: IGI Global ISBN: 1466658533 Category : Technology & Engineering Languages : en Pages : 359
Book Description
X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Author: Daniel Chateigner Publisher: John Wiley & Sons ISBN: 1118622642 Category : Technology & Engineering Languages : en Pages : 382
Book Description
This book introduces and details the key facets of Combined Analysis—an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing—a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabilized, quantitative texture analysis is also detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analysis concept, showing how it is superior to the view presented when we look at only one part of the analyses. This book shows that the existence of texture in a specimen can be envisaged as a way to decouple ordinarily strongly correlated parameters, as measured for instance in powder diagrams, and to examine and detail deeper material characterizations in a single methodology.
Author: Adam Morawiec Publisher: Springer Nature ISBN: 3031110773 Category : Science Languages : en Pages : 427
Book Description
This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination. The book is intended equally for materials scientists curious about ‘nuts and bolts’ of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.
Author: A.J.C. Wilson
Author: A.J.C. Wilson
Author: Arthur James Cochran WILSON
Author: René Guinebretière
Author: G. Brown
Author: Mario Birkholz
Author: 
Author: Gubicza, Jen?
Author: William Alfred Adams
Author: Daniel Chateigner
Author: Adam Morawiec