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Languages : en
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Book Description
A rapid x-ray fluorescence (XRF) method for the quantitative analysis of uranium in ore and process samples is demonstrated. The method requires no uranium ore standards and provides a relative precision of +-2.5 percent. Particle-size and self-absorption effects are evaluated along with current methods of excitation and detection for M, L, and K series uranium x-rays. Sensitivities and detection limits are comparable using either energy dispersive or wavelength dispersive analysis of uranium L x-rays, and wavelength dispersive analysis of uranium M x-rays for both thick and thin samples. The XRF methods are more sensitive than the analysis of uranium by 252Cf neutron-induced .gamma.-ray analysis or by direct photon analysis of uranium daughters.