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Author: Myeongkyu Lee Publisher: CRC Press ISBN: 1315361973 Category : Science Languages : en Pages : 302
Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Myeongkyu Lee Publisher: CRC Press ISBN: 1315361973 Category : Science Languages : en Pages : 302
Book Description
X-ray diffraction is a useful and powerful analysis technique for characterizing crystalline materials commonly employed in MSE, physics, and chemistry. This informative new book describes the principles of X-ray diffraction and its applications to materials characterization. It consists of three parts. The first deals with elementary crystallography and optics, which is essential for understanding the theory of X-ray diffraction discussed in the second section of the book. Part 2 describes how the X-ray diffraction can be applied for characterizing such various forms of materials as thin films, single crystals, and powders. The third section of the book covers applications of X-ray diffraction. The book presents a number of examples to help readers better comprehend the subject. X-Ray Diffraction for Materials Research: From Fundamentals to Applications also • provides background knowledge of diffraction to enable nonspecialists to become familiar with the topics • covers the practical applications as well as the underlying principle of X-ray diffraction • presents appropriate examples with answers to help readers understand the contents more easily • includes thin film characterization by X-ray diffraction with relevant experimental techniques • presents a huge number of elaborately drawn graphics to help illustrate the content The book will help readers (students and researchers in materials science, physics, and chemistry) understand crystallography and crystal structures, interference and diffraction, structural analysis of bulk materials, characterization of thin films, and nondestructive measurement of internal stress and phase transition. Diffraction is an optical phenomenon and thus can be better understood when it is explained with an optical approach, which has been neglected in other books. This book helps to fill that gap, providing information to convey the concept of X-ray diffraction and how it can be applied to the materials analysis. This book will be a valuable reference book for researchers in the field and will work well as a good introductory book of X-ray diffraction for students in materials science, physics, and chemistry.
Author: Kaimin Shih Publisher: Nova Science Publishers ISBN: 9781628085914 Category : Materials Languages : en Pages : 0
Book Description
An important milestone in the history of science, the diffraction of X-rays, was observed by Max von Laue in 1912. In the last 100 years, X-ray diffraction (XRD) studies have revealed highly valuable information about many ordered atomic structures seen in a variety of common materials. The understanding of material structures opened the door to the reliable application of these materials and allowed scientific discussions about material properties and structural features to become possible. Besides playing this crucial role in history, XRD has now also successfully transformed itself into a method in the forefront of extending much of our knowledge boundaries. Written by more than 30 X-ray diffraction experts from 9 countries/regions, this book consists of 11 chapters examining the development of the XRD technique and demonstrating various new opportunities for its application. Each chapter discusses timely and important subjects surrounding the XRD technique, including the past and future of the single-crystal XRD technique and new explorations with co-ordination polymers; the very successful implementation of Rietveld refinement analysis for alloys, intermetallics, cements, and ceramics; the application of XRD in nanoparticles structure study; the methodological developments in quantifying the state of residual stress in materials; and the state-of-the-art progress in combining XRD principles with electron crystallography for structure determination.
Author: Yoshio Waseda Publisher: Springer Science & Business Media ISBN: 3642166350 Category : Technology & Engineering Languages : en Pages : 320
Book Description
X-ray diffraction crystallography for powder samples is a well-established and widely used method. It is applied to materials characterization to reveal the atomic scale structure of various substances in a variety of states. The book deals with fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples and its application to the determination of the crystal structure. The reciprocal lattice and integrated diffraction intensity from crystals and symmetry analysis of crystals are explained. To learn the method of X-ray diffraction crystallography well and to be able to cope with the given subject, a certain number of exercises is presented in the book to calculate specific values for typical examples. This is particularly important for beginners in X-ray diffraction crystallography. One aim of this book is to offer guidance to solving the problems of 90 typical substances. For further convenience, 100 supplementary exercises are also provided with solutions. Some essential points with basic equations are summarized in each chapter, together with some relevant physical constants and the atomic scattering factors of the elements.
Author: René Guinebretière Publisher: John Wiley & Sons ISBN: 1118613953 Category : Technology & Engineering Languages : en Pages : 290
Book Description
This book presents a physical approach to the diffraction phenomenon and its applications in materials science. An historical background to the discovery of X-ray diffraction is first outlined. Next, Part 1 gives a description of the physical phenomenon of X-ray diffraction on perfect and imperfect crystals. Part 2 then provides a detailed analysis of the instruments used for the characterization of powdered materials or thin films. The description of the processing of measured signals and their results is also covered, as are recent developments relating to quantitative microstructural analysis of powders or epitaxial thin films on the basis of X-ray diffraction. Given the comprehensive coverage offered by this title, anyone involved in the field of X-ray diffraction and its applications will find this of great use.
Author: Kazuyoshi Tanaka Publisher: Elsevier ISBN: 1483290387 Category : Technology & Engineering Languages : en Pages : 338
Book Description
This volume covers current research findings and engineering applications of X–ray methods by the Japanese X–ray group members. The first part of the volume deals with fundamental problems in the methods for X–ray stress measurement. Phase stresses in the constituent phases of ceramic composites and ceramic-fiber reinforced metal-matrix composites are separately measured by X–rays, while three-dimensional stresses and thermal stresses in composites measured by X–rays are compared with the theoretical and numerical analyses. This work will therfore provide significant information for designing high-performance composites. Other topics covered include synchrotron X–ray radiation and the analysis of X–ray data by the Guassian curve method. Part two is devoted to the application of X–ray diffraction methods for various engineering purposes, the residual stress and half-value breadth (the full width at half the maximum) of the diffraction profiles being the two main X–ray parameters utilized in those applications. Chapters are included on X–ray fractography, a powerful technique for failure analysis, which is applied to the brittle fracture of ceramics and to the fatigue fracture of steels under various service conditions.
Author: B. E. Warren Publisher: Courier Corporation ISBN: 0486141616 Category : Science Languages : en Pages : 402
Book Description
Rigorous graduate-level text stresses modern applications to nonstructural problems such as temperature vibration effects, order-disorder phenomena, crystal imperfections, more. Problems. Six Appendixes include tables of values. Bibliographies.
Author: Richard A Dunlap Publisher: Morgan & Claypool Publishers ISBN: 1643273388 Category : Technology & Engineering Languages : en Pages : 125
Book Description
For many years, evidence suggested that all solid materials either possessed a periodic crystal structure as proposed by the Braggs or they were amorphous glasses with no long-range order. In the 1970s, Roger Penrose hypothesized structures (Penrose tilings) with long-range order which were not periodic. The existence of a solid phase, known as a quasicrystal, that possessed the structure of a three dimensional Penrose tiling, was demonstrated experimentally in 1984 by Dan Shechtman and colleagues. Shechtman received the 2011 Nobel Prize in Chemistry for his discovery. The discovery and description of quasicrystalline materials provided the first concrete evidence that traditional crystals could be viewed as a subset of a more general category of ordered materials. This book introduces the diversity of structures that are now known to exist in solids through a consideration of quasicrystals (Part I) and the various structures of elemental carbon (Part II) and through an analysis of their relationship to conventional crystal structures. Both quasicrystals and the various allotropes of carbon are excellent examples of how our understanding of the microstructure of solids has progressed over the years beyond the concepts of traditional crystallography.
Author: C. Suryanarayana Publisher: Springer Science & Business Media ISBN: 1489901485 Category : Technology & Engineering Languages : en Pages : 275
Book Description
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Author: Frank Smith Publisher: CRC Press ISBN: 0824719921 Category : Science Languages : en Pages : 1026
Book Description
By illustrating a wide range of specific applications in all major industries, this work broadens the coverage of X-ray diffraction beyond basic tenets, research and academic principles. The book serves as a guide to solving problems faced everyday in the laboratory, and offers a review of the current theory and practice of X-ray diffraction, major advances and potential uses.
Author: Myeongkyu Lee
Author: Myeongkyu Lee
Author: Kaimin Shih
Author: Yoshio Waseda
Author: René Guinebretière
Author: Kazuyoshi Tanaka
Author: B. E. Warren
Author: Richard A Dunlap
Author: C. Suryanarayana
Author: Anna Simona Adolf Spiegel
Author: Frank Smith