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Author: Deborah D. L. Chung Publisher: Wiley-VCH ISBN: Category : X-rays Languages : en Pages : 288
Book Description
A textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR
Author: Deborah D. L. Chung Publisher: Wiley-VCH ISBN: Category : X-rays Languages : en Pages : 288
Book Description
A textbook for a graduate or undergraduate course in programs such as x-ray diffraction, materials characterization, and thermal analysis. Introduces the principles and instrumentation of x-ray diffraction at elevated temperatures, and its application to crystallography, materials science, chemical and electrical engineering, and other fields. Focusing on intense sources and position-sensitive detectors, describes in-situ phase identification, texture analysis, and grain-size measurement. Annotation copyright by Book News, Inc., Portland, OR
Author: Uel S. Clanton Publisher: ISBN: Category : X-rays Languages : en Pages : 118
Book Description
A high-temperature x-ray diffraction furnace for use with the General Electric Model XRD-3 x-ray diffraction unit has been developed. The furnace, which was designed and constructed by the author, has an angular range of 0-165° 20. A constant temperature or continuously increasing temperature may be programmed through the temperature range of 20°C to 1000°C. Data on the high-temperature modifications of illite obtained with the high-temperature x-ray diffraction furnace indicate a contraction of the (110) spacing at 300°C and expansions at 725°C and 880°C which were not identifiable using the quench method. The existence of interlayer water in the illite structure to temperatures over 800°C is indicated, based upon the continuous decrease of the (002) basal periodicity with increasing temperature. A skeleton illite structure or a high-temperature illite phase with a d-spacing of 9.87A survives the third endothermic reaction observed by differential thermal analysis and forms a phase which is stable at 900°C.
Author: C. Suryanarayana Publisher: Springer Science & Business Media ISBN: 9780306457449 Category : Technology & Engineering Languages : en Pages : 302
Book Description
In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a "hands on" approach through experiments and examples based on actual laboratory data. Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information. In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it. Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.
Author: Reuben Rudman Publisher: Springer ISBN: Category : Science Languages : en Pages : 370
Book Description
Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature. LTXRD studies can be frustrating: There are at least two reports of investigations ruined by the loss of crystals (grown with extreme difficulty) because of the widespread power failure and blackout in the northeastern United States in late 1965. LTXRD studies can cause discomfort: In several instances, "low temperatures" have been attained by opening all the windows in the X-ray laboratory. LTXRD studies can be dangerous: It was once reported that a crys tal was lost because a laboratory assistant fell down a flight of stairs and lay unconscious for about an hour on his way to refilling a liquid-nitrogen (LN2 ) dewar. This last report indicated the disposition of the crystal but not that of the laboratory assistant. However, in general, the results of low-temperature X-ray diffraction investigations cannot be obtained in any other manner, and one is well compensated for the effort expended in constructing and maintaining a low-temperature system. Crystal-structure analyses of solidified liquids and gases, phase transformation investigations, accurate crystal-structure analy ses and electron-density maps, thermal expansion measurements, and defect structure studies are a few of the many important applications of LTXRD.
Author: Oliver H. Seeck Publisher: CRC Press ISBN: 9814303607 Category : Science Languages : en Pages : 438
Book Description
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.
Author: Deborah D. L. Chung
Author: Deborah D. L. Chung
Author: Uel S. Clanton
Author: C. Suryanarayana
Author: James William Edwards
Author: H. J. Goldschmidt
Author: Yoshio Ichikawa
Author: Reuben Rudman
Author: Yeram Sarkis Touloukian
Author: William Joseph Campbell
Author: Oliver H. Seeck