X-Ray and Neutron Dynamical Diffraction PDF Download
Are you looking for read ebook online? Search for your book and save it on your Kindle device, PC, phones or tablets. Download X-Ray and Neutron Dynamical Diffraction PDF full book. Access full book title X-Ray and Neutron Dynamical Diffraction by André Authier. Download full books in PDF and EPUB format.
Author: André Authier Publisher: Springer Science & Business Media ISBN: 1461558794 Category : Science Languages : en Pages : 419
Book Description
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
Author: André Authier Publisher: Springer Science & Business Media ISBN: 1461558794 Category : Science Languages : en Pages : 419
Book Description
This volume collects the proceedings of the 23rd International Course of Crystallography, entitled "X-ray and Neutron Dynamical Diffraction, Theory and Applications," which took place in the fascinating setting of Erice in Sicily, Italy. It was run as a NATO Advanced Studies Institute with A. Authier (France) and S. Lagomarsino (Italy) as codirectors, and L. Riva di Sanseverino and P. Spadon (Italy) as local organizers, R. Colella (USA) and B. K. Tanner (UK) being the two other members of the organizing committee. It was attended by about one hundred participants from twenty four different countries. Two basic theories may be used to describe the diffraction of radiation by crystalline matter. The first one, the so-called geometrical, or kinematical theory, is approximate and is applicable to small, highly imperfect crystals. It is used for the determination of crystal structures and describes the diffraction of powders and polycrystalline materials. The other one, the so-called dynamical theory, is applicable to perfect or nearly perfect crystals. For that reason, dynamical diffraction of X-rays and neutrons constitutes the theoretical basis of a great variety of applications such as: • the techniques used for the characterization of nearly perfect high technology materials, semiconductors, piezoelectric, electrooptic, ferroelectric, magnetic crystals, • the X-ray optical devices used in all modem applications of Synchrotron Radiation (EXAFS, High Resolution X-ray Diffractometry, magnetic and nuclear resonant scattering, topography, etc. ), and • X-ray and neutron interferometry.
Author: Jean Daillant Publisher: Springer Science & Business Media ISBN: 3540486968 Category : Science Languages : en Pages : 331
Book Description
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Author: Albert Furrer Publisher: World Scientific ISBN: 9814616273 Category : Languages : en Pages : 392
Book Description
Understanding and manipulating the properties of materials naturally occurring in our world and artificially produced by modern technologies requires detailed information on their properties on the atomic scale. This information is the basis for any kind of research in physics, chemistry, biology, engineering, metallurgy, and ceramics. Among the various experimental methods, neutron and photon scattering have become the key techniques of choice. This book provides an overview of the complementarity between neutron and synchrotron x-ray scattering. The most important topics are covered, including structure determination, magnetic correlations, polymer dynamics, thin films and multilayers, photoemission studies, etc; they are thoroughly introduced and discussed by experts from both the experimental and the theoretical side. Contents:Neutron- and Synchrotron X-Ray Scattering (The Theoretical Principles) (W E Fischer)Structure Determination by Powder Synchrotron X-Ray Diffraction (A N Fitch)Magnetic Neutron and Synchrotron X-Ray Scattering (W G Stirling)Magnetic Excitations Through the Eye of the Neutron (W J L Buyers)Topological Excitations in Low-Dimensional Magnets (H B Braun)Elastic and Inelastic X-Ray Scattering from Correlated Electrons: A Theoretical Perspective (M Altarelli)From Thin Films to Superlattices Studied with X-Rays and Neutrons (D F McMorrow)Small-Angle and Surface Scattering from Porous and Fractal Materials (S K Sinha)Hot Topics in Condensed Matter Physics (H R Ott)Neutron Beam Optics (P Böni)Synchrotron X-Ray Beam Optics (A Freund)Summary Lecture: Some Features of the Scattering and Absorption of Beams of Neutrons and Beams of X-Rays (S W Lovesey)and other papers Readership: Condensed matter and solid state physicists. Keywords:Photon Scattering;Structure Determination;Magnetic Correlations;Polymer Dynamics;Thin Films;Multilayers;Photoemission Studies;Synchrotron X-Ray;Optics;Neutrons
Author: Emil Zolotoyabko Publisher: John Wiley & Sons ISBN: 3527681183 Category : Science Languages : en Pages : 299
Book Description
Authored by a university professor deeply involved in X-ray diffraction-related research, this textbook is based on his lectures given to graduate students for more than 20 years. It adopts a well-balanced approach, describing basic concepts and experimental techniques, which make X-ray diffraction an unsurpassed method for studying the structure of materials. Both dynamical and kinematic X-ray diffraction is considered from a unified viewpoint, in which the dynamical diffraction in single-scattering approximation serves as a bridge between these two parts. The text emphasizes the fundamental laws that govern the interaction of X-rays with matter, but also covers in detail classical and modern applications, e.g., line broadening, texture and strain/stress analyses, X-ray mapping in reciprocal space, high-resolution X-ray diffraction in the spatial and wave vector domains, X-ray focusing, inelastic and time-resolved X-ray scattering. This unique scope, in combination with otherwise hard-to-find information on analytic expressions for simulating X-ray diffraction profiles in thin-film heterostructures, X-ray interaction with phonons, coherent scattering of Mossbauer radiation, and energy-variable X-ray diffraction, makes the book indispensable for any serious user of X-ray diffraction techniques. Compact and self-contained, this textbook is suitable for students taking X-ray diffraction courses towards specialization in materials science, physics, chemistry, or biology. Numerous clear-cut illustrations, an easy-to-read style of writing, as well as rather short, easily digestible chapters all facilitate comprehension.
Author: G. E. Bacon Publisher: Elsevier ISBN: 1483158292 Category : Science Languages : en Pages : 393
Book Description
X-Ray and Neutron Diffraction describes the developments of the X-ray and the various research done in neutron diffraction. Part I of the book concerns the principles and applications of the X-ray and neutrons through their origins from classical crystallography. The book explains the use of diffraction methods to show the highly regular arrangement of atoms that forms a continuous pattern in three-dimensional space. The text evaluates the limitations and benefits of using the different types of radiation sources, whether these are X-rays, neutrons, or electrons. Part II is a collection of reprints discussing the development of techniques that includes a modification of the Bragg method, which is a method of X-ray crystal analysis. One paper presents an improved numerical method of two-dimensional Fourier synthesis for crystals. This method uses a greatly reduced process of arrangement of sets of figures found in the two-dimensional Fourier series. The book also notes the theoretical considerations and the practical details, and then addresses precautions against possible inclusions of errors in this method. The text deals as well with the magnetic scattering of neutrons, and one paper presents a simple method of gathering information about the magnetic moment of the neutron besides the traditional Stern-Gerlach method. Nuclear scientists and physicists, atomic researchers, and nuclear engineers will greatly appreciate the book.
Author: Materials Research Society. Meeting Publisher: ISBN: Category : Science Languages : en Pages : 272
Book Description
In these proceedings from the symposium of November-December 2004, participants describe their work in x-rays and neutrons as probes of local atomic order and dynamics, in the dynamics and structure of polymers (including a paper on large-scale morphology of dispersed layered silicates), biopolymers and composites, in x-rays and neutrons as probes of electronic and magnetic structure, novel methods and nanomaterials, and x-ray and neutron investigations of microstructure and strain, including a paper on 2D and 3D x-ray structural microscopy using submicron-resolution Laue microdiffraction. Annotation : 2004 Book News, Inc., Portland, OR (booknews.com).
Author: S Amelinckx Publisher: Elsevier ISBN: 0444601864 Category : Computers Languages : en Pages : 412
Book Description
Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.
Author: André Authier
Author: André Authier
Author: André Authier
Author: Jean Daillant
Author: Jean Daillant
Author: Albert Furrer
Author: Mikhail Aleksandrovich Krivoglaz
Author: Emil Zolotoyabko
Author: G. E. Bacon
Author: Materials Research Society. Meeting
Author: S Amelinckx