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Author: Publisher: ISBN: Category : Languages : en Pages : 139
Book Description
The Final Proceedings for The 23rd Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe 1999 (WOCSDICE), 26 May 1999 - 29 May 1999 This is an interdisciplinary conference. Topics include: material growth and characterization, including small or large gap nitrides, microelectronic devices, integrated circuits, MMIC and digital, optoelectronic devices and their integration, quantum structures and devices, novel device concepts, terahertz technology, opto-micro border, III-V technologies for micro-systems, devices and ICs processing, reliability and noise, and modeling and simulation.
Author: Publisher: ISBN: Category : Languages : en Pages : 139
Book Description
The Final Proceedings for The 23rd Workshop on Compound Semiconductor Devices and Integrated Circuits held in Europe 1999 (WOCSDICE), 26 May 1999 - 29 May 1999 This is an interdisciplinary conference. Topics include: material growth and characterization, including small or large gap nitrides, microelectronic devices, integrated circuits, MMIC and digital, optoelectronic devices and their integration, quantum structures and devices, novel device concepts, terahertz technology, opto-micro border, III-V technologies for micro-systems, devices and ICs processing, reliability and noise, and modeling and simulation.
Author: Hans Hartnagel Publisher: John Wiley & Sons ISBN: 9780471384328 Category : Technology & Engineering Languages : en Pages : 316
Book Description
A thorough reference work bridging the gap between contemporary and traditional approaches to noise problems Noise in semiconductor devices refers to any unwanted signal or disturbance in the device that degrades performance. In semiconductor devices, noise is attributed to hot-electron effects. Current advances in information technology have led to the development of ultrafast devices that are required to provide low-noise, high-speed performance. Microwave Noise in Semiconductor Devices considers available data on the speed versus noise trade-off and discusses optimal solutions in semiconductors and semiconductor structures. These solutions are of direct interest in the research and development for fast, efficient, and reliable communications systems. As the only book of its kind accessible to practicing engineers, the material is divided into four parts-the kinetic theory of fluctuations and its corollaries, the methods of measurements of microwave noise, low-dimensional structures, and, finally, devices. With over 100 illustrations presenting recent experimental data for up-to-date semiconductor structures designed for ultrafast electronics, together with results of microscopic simulation where available, these examples, tables, and references offer a full comprehension of electronic processes and fluctuation in dimensionally quantizing structures. Bridging the apparent gap between the microscopic approach and the equivalent circuit approach, Microwave Noise in Semiconductor Devices considers microwave fluctuation phenomena and noise in terms of ultrafast kinetic processes specific to modern quantum-well structures. Scientists in materials science, semiconductor and solid-state physics, electronic engineers, and graduate students will all appreciate this indispensable review of contemporary and future microwave and high-speed electronics.
Author: University of Michigan. Solid-State Electronics Laboratory Publisher: ISBN: 9780970311108 Category : Integrated circuits Languages : en Pages : 214
Author: Publisher: ISBN: Category : Electronic circuits Languages : en Pages : 0
Book Description
The Final Proceedings for 22nd Workshop on Compound Semiconductor Devices and Integrated Circuits, 24 May 1998-27 May 1998 This is an interdisoplinary conference. Topics include material growth and characterization, recent developments in MESFETS, HEMTs, and HBTs, MMlC-Technology, Microwave and millimeter wave power devices, GaN- Devices, Mesoscopic devices, Optical Ics, Reliability and CharacterIzation, Technological Building Blocks for devices.
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Author: Hans Hartnagel
Author: University of Michigan. Solid-State Electronics Laboratory
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Author: Gaudenzio Meneghesso
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Author: Semiconductor Physics Institute
Author: Brian Corbett
Author: Ferdinand-Braun-Institut Für Höchstfrequenztechnik