Author: IEEE Computer Society Staff
Publisher:
ISBN:
Category :
Languages : en
Pages :
Book Description
VLSI Test Symposium, 21st IEEE.
21st IEEE VLSI Test Symposium
Author:
Publisher: IEEE
ISBN: 9780769519241
Category : Technology & Engineering
Languages : en
Pages : 432
Book Description
VTS 2003 is the twenty-first in a series of annual symposia that explore the state-of-the-art, and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of current generation ICs, combined with rapidly developing high density, high speed packaging and reduced design cycle time, has made it extremely difficult and expensive to comprehensively test electronic systems, and diagnose failed parts using traditional methods. This situation worsens as we move toward nanometer technologies.
Publisher: IEEE
ISBN: 9780769519241
Category : Technology & Engineering
Languages : en
Pages : 432
Book Description
VTS 2003 is the twenty-first in a series of annual symposia that explore the state-of-the-art, and introduce innovative approaches, in the testing of electronic circuits and systems. The complexity of current generation ICs, combined with rapidly developing high density, high speed packaging and reduced design cycle time, has made it extremely difficult and expensive to comprehensively test electronic systems, and diagnose failed parts using traditional methods. This situation worsens as we move toward nanometer technologies.
VLSI Test Symposium (VTS, `98), 16th IEEE.
16th IEEE VLSI Test Symposium
Author:
Publisher:
ISBN: 9780818684364
Category : Application-specific integrated circuits
Languages : en
Pages : 520
Book Description
Publisher:
ISBN: 9780818684364
Category : Application-specific integrated circuits
Languages : en
Pages : 520
Book Description
Proceedings
Author: Ieee
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769521343
Category : Technology & Engineering
Languages : en
Pages : 468
Book Description
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
Publisher: Institute of Electrical & Electronics Engineers(IEEE)
ISBN: 9780769521343
Category : Technology & Engineering
Languages : en
Pages : 468
Book Description
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
Special Issue on 16th IEEE VLSI Test Symposium (VTS 98)
VLSI Design and Test
Author: Brajesh Kumar Kaushik
Publisher: Springer
ISBN: 9811074704
Category : Computers
Languages : en
Pages : 820
Book Description
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
Publisher: Springer
ISBN: 9811074704
Category : Computers
Languages : en
Pages : 820
Book Description
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
2021 IEEE 39th VLSI Test Symposium (VTS)
Author: Alberto Basio
Publisher:
ISBN: 9781665419499
Category : Integrated circuits
Languages : en
Pages : 0
Book Description
Publisher:
ISBN: 9781665419499
Category : Integrated circuits
Languages : en
Pages : 0
Book Description
2017 IEEE 35th VLSI Test Symposium (VTS).
IEEE VLSI Test Symposium
Author:
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description
Publisher:
ISBN:
Category : Application-specific integrated circuits
Languages : en
Pages : 498
Book Description