VLSI-SoC: System-on-Chip in the Nanoscale Era – Design, Verification and Reliability PDF Download

Author: Thomas Hollstein
Publisher: Springer
ISBN: 3319671049
Category : Computers
Languages : en
Pages : 247

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Book Description
This book contains extended and revised versions of the best papers presented at the 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, held in Tallinn, Estonia, in September 2016. The 11 papers included in the book were carefully reviewed and selected from the 36 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design.

Author: Michail Maniatakos
Publisher: Springer
ISBN: 303015663X
Category : Computers
Languages : en
Pages : 271

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Book Description
This book contains extended and revised versions of the best papers presented at the 25th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2017, held in Abu Dhabi, United Arab Emirates, in August 2017. The 11 papers included in this book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the latest scientific and industrial results and developments as well as future trends in the field of System-on-Chip (SoC) Design. On the occasion of the silver jubilee of the VLSI-SoC conference series the book also includes a special chapter that presents the history of the VLSI-SoC series of conferences and its relation with VLSI-SoC evolution since the early 80s up to the present.

Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 0080556809
Category : Technology & Engineering
Languages : en
Pages : 893

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Book Description
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. - Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. - Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. - Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. - Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. - Practical problems at the end of each chapter for students.

Author: Baker Mohammad
Publisher: Springer Science & Business Media
ISBN: 1461488818
Category : Technology & Engineering
Languages : en
Pages : 104

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Book Description
This book describes the various tradeoffs systems designers face when designing embedded memory. Readers designing multi-core systems and systems on chip will benefit from the discussion of different topics from memory architecture, array organization, circuit design techniques and design for test. The presentation enables a multi-disciplinary approach to chip design, which bridges the gap between the architecture level and circuit level, in order to address yield, reliability and power-related issues for embedded memory.

Author: Phan Cong-Vinh
Publisher: CRC Press
ISBN: 1351833715
Category : Computers
Languages : en
Pages : 286

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Book Description
Despite the growing mainstream importance and unique advantages of autonomic networking-on-chip (ANoC) technology, Autonomic Networking-On-Chip: Bio-Inspired Specification, Development, and Verification is among the first books to evaluate research results on formalizing this emerging NoC paradigm, which was inspired by the human nervous system. The FIRST Book to Assess Research Results, Opportunities, & Trends in "BioChipNets" The third book in the Embedded Multi-Core Systems series from CRC Press, this is an advanced technical guide and reference composed of contributions from prominent researchers in industry and academia around the world. A response to the critical need for a global information exchange and dialogue, it is written for engineers, scientists, practitioners, and other researchers who have a basic understanding of NoC and are now ready to learn how to specify, develop, and verify ANoC using rigorous approaches. Offers Expert Insights Into Technical Topics Including: Bio-inspired NoC How to map applications onto ANoC ANoC for FPGAs and structured ASICs Methods to apply formal methods in ANoC development Ways to formalize languages that enable ANoC Methods to validate and verify techniques for ANoC Use of "self-" processes in ANoC (self-organization, configuration, healing, optimization, protection, etc.) Use of calculi for reasoning about context awareness and programming models in ANoC With illustrative figures to simplify contents and enhance understanding, this resource contains original, peer-reviewed chapters reporting on new developments and opportunities, emerging trends, and open research problems of interest to both the autonomic computing and network-on-chip communities. Coverage includes state-of-the-art ANoC architectures, protocols, technologies, and applications. This volume thoroughly explores the theory behind ANoC to illustrate strategies that enable readers to use formal ANoC methods yet still make sound judgments and allow for reasonable justifications in practice.

Author: Amr Fahim
Publisher: Springer Science & Business Media
ISBN: 9781402080791
Category : Technology & Engineering
Languages : en
Pages : 284

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Book Description
This book examines the issue of design of fully-integrated frequency synthesizers suitable for system-on-a-chip (SOC) processors. This book takes a more global design perspective in jointly examining the design space at the circuit level as well as at the architectural level. The coverage of the book is comprehensive and includes summary chapters on circuit theory as well as feedback control theory relevant to the operation of phase locked loops (PLLs). On the circuit level, the discussion includes low-voltage analog design in deep submicron digital CMOS processes, effects of supply noise, substrate noise, as well device noise. On the architectural level, the discussion includes PLL analysis using continuous-time as well as discrete-time models, linear and nonlinear effects of PLL performance, and detailed analysis of locking behavior. The material then develops into detailed circuit and architectural analysis of specific clock generation blocks. This includes circuits and architectures of PLLs with high power supply noise immunity and digital PLL architectures where the loop filter is digitized. Methods of generating low-spurious sampling clocks for discrete-time analog blocks are then examined. This includes sigma-delta fractional-N PLLs, Direct Digital Synthesis (DDS) techniques and non-conventional uses of PLLs. Design for test (DFT) issues as they arise in PLLs are then discussed. This includes methods of accurately measuring jitter and built-in-self-test (BIST) techniques for PLLs. Finally, clocking issues commonly associated to system-on-a-chip (SOC) designs, such as multiple clock domain interfacing and partitioning, and accurate clock phase generation techniques using delay-locked loops (DLLs) are also addressed. The book provides numerous real world applications, as well as practical rules-of-thumb for modern designers to use at the system, architectural, as well as the circuit level. This book is well suited for practitioners as well as graduate level students who wish to learn more about time-domain analysis and design of frequency synthesis techniques.

Author: Alberto Cañas
Publisher: Springer
ISBN: 331945501X
Category : Education
Languages : en
Pages : 342

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Book Description
This book constitutes the refereed proceedings of the 7th International Conference on Concept Mapping, CMC 2016, held in Tallinn, Estonia, in September 2016. The 25 revised full papers presented were carefully reviewed and selected from 135 submissions. The papers address issues such as facilitation of learning; eliciting, capturing, archiving, and using “expert” knowledge; planning instruction; assessment of “deep” understandings; research planning; collaborative knowledge modeling; creation of “knowledge portfolios”; curriculum design; eLearning, and administrative and strategic planning and monitoring.

Author: Soumya Pandit
Publisher: CRC Press
ISBN: 1466564288
Category : Technology & Engineering
Languages : en
Pages : 397

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Book Description
Reliability concerns and the limitations of process technology can sometimes restrict the innovation process involved in designing nano-scale analog circuits. The success of nano-scale analog circuit design requires repeat experimentation, correct analysis of the device physics, process technology, and adequate use of the knowledge database. Starting with the basics, Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design introduces the essential fundamental concepts for designing analog circuits with optimal performances. This book explains the links between the physics and technology of scaled MOS transistors and the design and simulation of nano-scale analog circuits. It also explores the development of structured computer-aided design (CAD) techniques for architecture-level and circuit-level design of analog circuits. The book outlines the general trends of technology scaling with respect to device geometry, process parameters, and supply voltage. It describes models and optimization techniques, as well as the compact modeling of scaled MOS transistors for VLSI circuit simulation. • Includes two learning-based methods: the artificial neural network (ANN) and the least-squares support vector machine (LS-SVM) method • Provides case studies demonstrating the practical use of these two methods • Explores circuit sizing and specification translation tasks • Introduces the particle swarm optimization technique and provides examples of sizing analog circuits • Discusses the advanced effects of scaled MOS transistors like narrow width effects, and vertical and lateral channel engineering Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design describes the models and CAD techniques, explores the physics of MOS transistors, and considers the design challenges involving statistical variations of process technology parameters and reliability constraints related to circuit design.

Author: Mark (Mohammad) Tehranipoor
Publisher: Springer
ISBN: 3319118242
Category : Technology & Engineering
Languages : en
Pages : 282

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Book Description
This timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government.

Author: David Flynn
Publisher: Springer Science & Business Media
ISBN: 0387718192
Category : Technology & Engineering
Languages : en
Pages : 303

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Book Description
This book provides a practical guide for engineers doing low power System-on-Chip (SoC) designs. It covers various aspects of low power design from architectural issues and design techniques to circuit design of power gating switches. In addition to providing a theoretical basis for these techniques, the book addresses the practical issues of implementing them in today's designs with today's tools.