Vierter Internationaler Kongress für Elektronenmikroskopie, Berlin 10.-17. September, 1958: Physikalisch-Technischer Teil PDF Download

Author: Wolfgang Bargmann
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 878

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Author: W. Bargmann
Publisher: Springer-Verlag
ISBN: 3642497640
Category : Science
Languages : de
Pages : 661

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Author: Wolfgang Bargmann
Publisher:
ISBN:
Category : Electron microscopes
Languages : en
Pages : 664

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Author: Wolfgang Bargmann
Publisher:
ISBN:
Category :
Languages : de
Pages : 851

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Book Description

Author: Wolfgang Bargmann
Publisher:
ISBN:
Category :
Languages : de
Pages : 851

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Book Description

Author: Wolfgang Bargmann
Publisher:
ISBN:
Category : Electron microscopes
Languages : de
Pages : 639

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Author:
Publisher: Academic Press
ISBN: 0128025905
Category : Technology & Engineering
Languages : en
Pages : 269

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Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contributions from leading authorities - Informs and updates on all the latest developments in the field

Author: Peter W. Hawkes
Publisher: Academic Press
ISBN: 0080984169
Category : Science
Languages : en
Pages : 755

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The three volumes in the PRINCIPLES OF ELECTRON OPTICS Series constitute the first comprehensive treatment of electron optics in over forty years. While Volumes 1 and 2 are devoted to geometrical optics, Volume 3 is concerned with wave optics and effects due to wave length. Subjects covered include:Derivation of the laws of electron propagation from SchrUdinger's equationImage formation and the notion of resolutionThe interaction between specimens and electronsImage processingElectron holography and interferenceCoherence, brightness, and the spectral functionTogether, these works comprise a unique and informative treatment of the subject. Volume 3, like its predecessors, will provide readers with both a textbook and an invaluable reference source.

Author: Ian M. Watt
Publisher: Cambridge University Press
ISBN: 9780521435918
Category : Science
Languages : en
Pages : 506

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The first edition of this book was widely praised as an excellent introduction to electron microscopy for materials scientists, physicists, earth and biological scientists. This completely revised new edition contains expanded coverage of existing topics and much new material. The author presents the subject of electron microscopy in a readable way, open both to those inexperienced in the technique, and also to practising electron microscopists. The coverage has been brought completely up to date, whilst retaining descriptions of early classic techniques. Currently live topics such as computer control of microscopes, energy-filtered imaging, cryo- and environmental microscopy, digital imaging, and high resolution scanning and transmission microscopy are all described. The highly praised case studies of the first edition have been expanded to include some interesting new examples. This indispensable guide to electron microscopy, written by an author with thirty years practical experience, will be invaluable to new and experienced electron microscopists in any area of science and technology.

Author: W. Bargmann
Publisher:
ISBN:
Category : Electron microscopes
Languages : de
Pages : 639

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Book Description