Author: Saket GuptaPublisher:
ISBN:
Category :
Languages : en
Pages : 153
Book Description
Variation-aware and Aging-aware Design Tools and Techniques for Nanometer-scale Integrated Circuits
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Author: Trent McConaghyPublisher: Springer Science & Business Media
ISBN: 1461422698
Category : Technology & Engineering
Languages : en
Pages : 198
Book Description
This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects. It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.
Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
Author: António Manuel Lourenço CanelasPublisher: Springer Nature
ISBN: 3030415368
Category : Technology & Engineering
Languages : en
Pages : 254
Book Description
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall optimization processes enables IC designers to perform yield optimization with the most accurate yield estimation method, MC simulations using foundry statistical device models considering local and global variations. The methodology described by the authors delivers on average a reduction of 89% in the total number of MC simulations, when compared to the exhaustive MC analysis over the full population. In addition to describing a newly developed yield estimation technique, the authors also provide detailed background on automatic analog IC sizing and optimization.
High-performance Power-aware Physical Designs for Nanometer-scale Integrated Circuits
Author: Chan-Seok HwangTechniques for Variation Aware Modeling in Static Timing Analysis of Integrated Circuits
Author: Suryanarayana PendelaPublisher:
ISBN:
Category :
Languages : en
Pages : 95
Book Description
Much of the Semiconductor Industry's success can be attributed to Moore's law which states that the number of transistors on an integrated circuit would double approximately every two years. Semiconductor industry has ever since progressed from designs with a few hundred transistors to today's complex designs incorporating millions of transistors. The current era of nanometer technologies threatens to impact the sustainability of Moore's law with random variations in the manufacturing process impacting yield in a big way. Considerable research efforts have since been devoted to account for these variations leading to a new paradigm called Design for Manufacturing (DFM). Traditional Static Timing Analysis (STA) has given way to Statistical Static Timing Analysis (SSTA) techniques wherein the parameters considered are treated as random variables with assigned probability distribution functions. However, SSTA is still not seen as a mature flow for commercial adoption, owing to the inherent complex nature of the SSTA algorithms. In this thesis, we propose an alternate framework to STA under the presence of process variations using Interval Valued Static Timing Analysis (IVSTA). Process variations are accounted for by using a macro-modeling framework providing an efficient and fast timing analysis technique. Results on standard benchmarks show that IVSTA can predict the timing slack by a margin of 5-10% error and huge improvement of runtime compared to traditional corner based analysis. The framework involves a one-time characterization of the standard cell library and can be incorporated without much modification to the design flow. An iterative optimization framework using IVSTA engine is also presented which optimizes a routed netlist for variations at a minimum penalty of area and power.
Lifetime Reliability-aware Design of Integrated Circuits
Author: Mohsen RajiPublisher: Springer Nature
ISBN: 3031153456
Category : Technology & Engineering
Languages : en
Pages : 113
Book Description
This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.
Aging-Aware Design Methods for Reliable Analog Integrated Circuits Using Operating Point-Dependent Degradation
Author: Nico HellwegeNano-scale CMOS Analog Circuits
Author: Soumya PanditPublisher: CRC Press
ISBN: 1466564288
Category : Technology & Engineering
Languages : en
Pages : 397
Book Description
Reliability concerns and the limitations of process technology can sometimes restrict the innovation process involved in designing nano-scale analog circuits. The success of nano-scale analog circuit design requires repeat experimentation, correct analysis of the device physics, process technology, and adequate use of the knowledge database. Starting with the basics, Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design introduces the essential fundamental concepts for designing analog circuits with optimal performances. This book explains the links between the physics and technology of scaled MOS transistors and the design and simulation of nano-scale analog circuits. It also explores the development of structured computer-aided design (CAD) techniques for architecture-level and circuit-level design of analog circuits. The book outlines the general trends of technology scaling with respect to device geometry, process parameters, and supply voltage. It describes models and optimization techniques, as well as the compact modeling of scaled MOS transistors for VLSI circuit simulation. • Includes two learning-based methods: the artificial neural network (ANN) and the least-squares support vector machine (LS-SVM) method • Provides case studies demonstrating the practical use of these two methods • Explores circuit sizing and specification translation tasks • Introduces the particle swarm optimization technique and provides examples of sizing analog circuits • Discusses the advanced effects of scaled MOS transistors like narrow width effects, and vertical and lateral channel engineering Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design describes the models and CAD techniques, explores the physics of MOS transistors, and considers the design challenges involving statistical variations of process technology parameters and reliability constraints related to circuit design.
Thermally-Aware Design
Author: Yong ZhanPublisher: Now Publishers Inc
ISBN: 1601981708
Category : Integrated circuits
Languages : en
Pages : 131
Book Description
Provides an overview of analysis and optimization techniques for thermally-aware chip design.
Variation-Aware Analog Structural Synthesis
Author: Trent McConaghyPublisher: Springer
ISBN: 9789400726086
Category : Technology & Engineering
Languages : en
Pages : 0
Book Description
This book describes new tools for front end analog designers, starting with global variation-aware sizing, and extending to novel variation-aware topology design. The tools aid design through automation, but more importantly, they also aid designer insight through automation. We now describe four design tasks, each more general than the previous, and how this book contributes design aids and insight aids to each. The ?rst designer task targeted is global robust sizing. This task is supported by a design tool that does automated, globally reliable, variation-aware s- ing (SANGRIA),and an insight-aiding tool that extracts designer-interpretable whitebox models that relate sizings to circuit performance (CAFFEINE). SANGRIA searches on several levels of problem dif?culty simultaneously, from lower cheap-to-evaluate “exploration” layers to higher full-evaluation “exploitation” layers (structural homotopy). SANGRIAmakes maximal use of circuit simulations by performing scalable data mining on simulation results to choose new candidate designs. CAFFEINE accomplishes its task by tre- ing function induction as a tree-search problem. It constrains its tree search space via a canonical-functional-form grammar, and searches the space with grammatically constrained genetic programming. The second designer task is topology selection/topology design. Topology selection tools must consider a broad variety of topologies such that an app- priate topology is selected, must easily adapt to new semiconductor process nodes, and readily incorporate new topologies. Topology design tools must allow designers to creatively explore new topology ideas as rapidly as possible.