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Author: Chieh Kai Yang Publisher: ISBN: Category : Languages : en Pages : 109
Book Description
Abstract: Any defect site existing in the AlGaN/GaN HEMTs can be electrically active during device operation. The activated defect site not only could lead to a degradation in the output characteristics but may introduce additional nonlinearity which seriously downgrades the values of devices for various applications. This motivates us to study the detailed path experimentally and theoretically how an electrically-activated defect site could impact the device performances during practical device operation. In this study, the g oal is (1) to give device engineers ideas on how further improvements can be devised to strengthen the existing GaN technology and (2) to provide circuit designers with better understanding on how to use GaN devices more efficiently for the development of reliable commercial GaN products for higher power applications in wireless systems. Single tone characterization results of AlGaN/GaN HEMTs for Class A operation are presented and compared. A new combined large signal network analyzer / deep level optical spectroscopy system is utilized to study the impact of illumination on the CW large-signal load line and small-signal S-parameters variations to identify the possible energy level of the trapping center responsible for the degradation of the device performance. A new pulsed-IV pulsed-RF "coldFET" technique is introduced to extract parasitic elements existing in the access regions of AlGaN/GaN HEMTs. The observation of bias-dependence is detailed and a simple semi-physical model is proposed which provides a satisfactory description of experimental results. The low-frequency noise, an important figure of merit in terms of reliability, is briefly-reviewed. Additive phase noise measurements are presented and the effects of illumination and load impedance are examined. A physical expression is derived and simulated which successfully establishes a relationship between the access resistance and the low-frequency noise and provides a qualitative description of the measurement results.
Author: Chieh Kai Yang Publisher: ISBN: Category : Languages : en Pages : 109
Book Description
Abstract: Any defect site existing in the AlGaN/GaN HEMTs can be electrically active during device operation. The activated defect site not only could lead to a degradation in the output characteristics but may introduce additional nonlinearity which seriously downgrades the values of devices for various applications. This motivates us to study the detailed path experimentally and theoretically how an electrically-activated defect site could impact the device performances during practical device operation. In this study, the g oal is (1) to give device engineers ideas on how further improvements can be devised to strengthen the existing GaN technology and (2) to provide circuit designers with better understanding on how to use GaN devices more efficiently for the development of reliable commercial GaN products for higher power applications in wireless systems. Single tone characterization results of AlGaN/GaN HEMTs for Class A operation are presented and compared. A new combined large signal network analyzer / deep level optical spectroscopy system is utilized to study the impact of illumination on the CW large-signal load line and small-signal S-parameters variations to identify the possible energy level of the trapping center responsible for the degradation of the device performance. A new pulsed-IV pulsed-RF "coldFET" technique is introduced to extract parasitic elements existing in the access regions of AlGaN/GaN HEMTs. The observation of bias-dependence is detailed and a simple semi-physical model is proposed which provides a satisfactory description of experimental results. The low-frequency noise, an important figure of merit in terms of reliability, is briefly-reviewed. Additive phase noise measurements are presented and the effects of illumination and load impedance are examined. A physical expression is derived and simulated which successfully establishes a relationship between the access resistance and the low-frequency noise and provides a qualitative description of the measurement results.
Author: Hongyu Yu Publisher: CRC Press ISBN: 1351767607 Category : Science Languages : en Pages : 301
Book Description
GaN is considered the most promising material candidate in next-generation power device applications, owing to its unique material properties, for example, bandgap, high breakdown field, and high electron mobility. Therefore, GaN power device technologies are listed as the top priority to be developed in many countries, including the United States, the European Union, Japan, and China. This book presents a comprehensive overview of GaN power device technologies, for example, material growth, property analysis, device structure design, fabrication process, reliability, failure analysis, and packaging. It provides useful information to both students and researchers in academic and related industries working on GaN power devices. GaN wafer growth technology is from Enkris Semiconductor, currently one of the leading players in commercial GaN wafers. Chapters 3 and 7, on the GaN transistor fabrication process and GaN vertical power devices, are edited by Dr. Zhihong Liu, who has been working on GaN devices for more than ten years. Chapters 2 and 5, on the characteristics of polarization effects and the original demonstration of AlGaN/GaN heterojunction field-effect transistors, are written by researchers from Southwest Jiaotong University. Chapters 6, 8, and 9, on surface passivation, reliability, and package technologies, are edited by a group of researchers from the Southern University of Science and Technology of China.
Author: Matteo Meneghini Publisher: Springer ISBN: 3319431994 Category : Technology & Engineering Languages : en Pages : 383
Book Description
This book presents the first comprehensive overview of the properties and fabrication methods of GaN-based power transistors, with contributions from the most active research groups in the field. It describes how gallium nitride has emerged as an excellent material for the fabrication of power transistors; thanks to the high energy gap, high breakdown field, and saturation velocity of GaN, these devices can reach breakdown voltages beyond the kV range, and very high switching frequencies, thus being suitable for application in power conversion systems. Based on GaN, switching-mode power converters with efficiency in excess of 99 % have been already demonstrated, thus clearing the way for massive adoption of GaN transistors in the power conversion market. This is expected to have important advantages at both the environmental and economic level, since power conversion losses account for 10 % of global electricity consumption. The first part of the book describes the properties and advantages of gallium nitride compared to conventional semiconductor materials. The second part of the book describes the techniques used for device fabrication, and the methods for GaN-on-Silicon mass production. Specific attention is paid to the three most advanced device structures: lateral transistors, vertical power devices, and nanowire-based HEMTs. Other relevant topics covered by the book are the strategies for normally-off operation, and the problems related to device reliability. The last chapter reviews the switching characteristics of GaN HEMTs based on a systems level approach. This book is a unique reference for people working in the materials, device and power electronics fields; it provides interdisciplinary information on material growth, device fabrication, reliability issues and circuit-level switching investigation.
Author: Publisher: ISBN: Category : Languages : en Pages :
Book Description
The increasing data rates demanded by third generation cellular communication systems and other high frequency applications require the use of power amplifiers operating at frequencies exceeding 1 GHz with output of the order of hundreds to thousands of watts. The area of very high frequency, very high power electronics is currently dominated by vacuum tube based devices as conventional semiconductor devices suffer from relatively low breakdown voltages precluding their operation at very high voltages and high powers. The vacuum tube based devices, however, suffer from the issues of high cost, large size and reliability issues. In recent years AlGaN/GaN HEMTs have demonstrated output power densities as high as 11 W/mm operating at microwave frequencies greater than 10 GHz. The extremely high output power density levels are achieved due to the high breakdown voltages of these wide bandgap devices and due to the large polarization induced charge leading to high output current densities. This work investigates the performance of the AlGaN/GaN HEMT using device modeling. Polarization effects have been incorporated using a highly doped AlGaN spacer layer. This thesis examines the effect of the device structure and doping profile on the AlGaN/GaN HEMT's microwave performance including the unilateral power gain and maximum frequency of oscillation.
Author: J.-P. Colinge Publisher: Springer Science & Business Media ISBN: 0306476223 Category : Technology & Engineering Languages : en Pages : 442
Book Description
Physics of Semiconductor Devices covers both basic classic topics such as energy band theory and the gradual-channel model of the MOSFET as well as advanced concepts and devices such as MOSFET short-channel effects, low-dimensional devices and single-electron transistors. Concepts are introduced to the reader in a simple way, often using comparisons to everyday-life experiences such as simple fluid mechanics. They are then explained in depth and mathematical developments are fully described. Physics of Semiconductor Devices contains a list of problems that can be used as homework assignments or can be solved in class to exemplify the theory. Many of these problems make use of Matlab and are aimed at illustrating theoretical concepts in a graphical manner.
Author: Sourabh Khandelwal Publisher: ISBN: 9783030777319 Category : Languages : en Pages : 0
Book Description
This book discusses in detail the Advanced SPICE Model for GaN HEMTs (ASM-HEMT), a new industry standard model for GaN-based power and RF circuit design. The author describes this new, standard model in detail, covering the different components of the ASM GaN model from fundamental derivations to the implementation in circuit simulation tools. The book also includes a detailed description of parameter extraction steps and model quality tests, which are critically important for effective use of this standard model in circuit simulation and product design. Coverage includes both radio-frequency (RF), and power electronics applications of this model. Practical issues related to measurement data and parameter extraction flow are also discussed, enabling readers easily to adopt this new model for design flow and simulation tools. Describes in detail a new industry standard for GaN-based power and RF circuit design; Includes discussion of practical problems and their solutions in GaN device modeling; Covers both radio-frequency (RF) and power electronics application of GaN technology; Describes modeling of both GaN RF and power devices.
Author: Robert Leoni Publisher: World Scientific ISBN: 9814480800 Category : Technology & Engineering Languages : en Pages : 314
Book Description
This volume presents state-of-the-art works from top academic and research institutions in the areas of high performance semiconductor materials, devices, and circuits. A broad coverage of topics relating to high performance devices and circuits is featured here. There are 46 contributed papers covering a wide range of materials, device types, and applications. These papers describe the results of ongoing research in three general areas: high speed technologies for advanced mixed signal and terahertz applications, advanced technologies for high performance optical links and light sources, and high power density and high efficiency technologies for next generation microwave front ends and power electronics.
Author: Michael Hosch Publisher: Cuvillier Verlag ISBN: 3736938446 Category : Technology & Engineering Languages : en Pages : 129
Book Description
This thesis deals with the analysis and optimization of some of the most prominent non-ideal effects in AlGaN/GaN high electron mobility transistors used in microwave applications as well as the optimization of the RF gain. The effect of current collapse, the root cause of leakage currents as well as field-dependent self-heating effects have been investigated by eletrical characterization using well established techniques and have been analyzed using 2-dimensional physical device simulations. It will be shown that the origin of all effects is strongly related to the device surface and some are even competing effects making device optimization a challenge. However, a detailed localization of the regions affecting device performance will be given leading to a better understanding for fabrication process optimization. Finally, I simulation study is conducted giving suggestions for RF gain improvement based on very simple device layout variations.
Author: D. Nirmal Publisher: CRC Press ISBN: 0429862539 Category : Science Languages : en Pages : 430
Book Description
This book focusses on III-V high electron mobility transistors (HEMTs) including basic physics, material used, fabrications details, modeling, simulation, and other important aspects. It initiates by describing principle of operation, material systems and material technologies followed by description of the structure, I-V characteristics, modeling of DC and RF parameters of AlGaN/GaN HEMTs. The book also provides information about source/drain engineering, gate engineering and channel engineering techniques used to improve the DC-RF and breakdown performance of HEMTs. Finally, the book also highlights the importance of metal oxide semiconductor high electron mobility transistors (MOS-HEMT). Key Features Combines III-As/P/N HEMTs with reliability and current status in single volume Includes AC/DC modelling and (sub)millimeter wave devices with reliability analysis Covers all theoretical and experimental aspects of HEMTs Discusses AlGaN/GaN transistors Presents DC, RF and breakdown characteristics of HEMTs on various material systems using graphs and plots
Author: Chieh Kai Yang
Author: Chieh Kai Yang
Author: Hongyu Yu
Author: Matteo Meneghini
Author: 
Author: J.-P. Colinge
Author: Sourabh Khandelwal
Author: Robert Leoni
Author: Michael Hosch
Author: D. Nirmal
Author: Alexei Vasilievich Vertiatchikh